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Confocal Laser Scanning Microscope
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Microscopes are instruments that produce magnified images of small objects
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Supplier: WDI Wise Device Inc.Description: The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications.
- Application: Biological / Life Science, Semiconductor Inspection
- Grade: Other
- Microscope Type: Laser / Confocal, Other
- Digital Display: Yes
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Supplier: WDI Wise Device Inc.Description: The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications.
- Image Source: Area Scan Camera, Thermal or Infrared, Optical Microscope, Line Scan Camera, Confocal Laser
- System Type: Modular / PC-Based
- Applications / Capabilities: Alignment / Guidance, Biotechnology or Medical, Electronics or Semiconductor Inspection, Flaw Detection, Gauging, Scanning & Dimensioning, Non-contact Profilometry, Production & Quality Control
- Stage / Positioner: X-Y Stage, Camera Positioner
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Supplier: WDI Wise Device Inc.Description: The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications.
- Form Factor: Monitor / Instrument
- Mounting / Loading: In-situ / System Mounted
- Applications: Semiconductor Wafers, CVD / PVD Films, Flat Panel Displays, Optical Components , Packaged ICs / Ceramic Substrates, Photolithography / Patterning
- Measurement Capability: Defects / ADC, Thickness - Film / Layer, Other
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Supplier: KEYENCEDescription: Combining the capabilities of an optical microscope, SEM and roughness gauge, the VK-X Series Laser Scanning Microscope is capable of providing non-contact profile, roughness and thickness measurements with a 0.5 nm Z-axis resolution on nearly any material. Users can scan and analyze samples
- Application: Metallurgical, Semiconductor Inspection, Other
- Grade: Benchtop, Research
- Microscope Type: Compound, Laser / Confocal
- Eyepiece Style: Other
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Supplier: Bruker Nano Surfaces DivisionDescription: . Due to this unique hybridization of optical microscopy and AFM the NEOS complements data achieved by conventional optical microscopy, confocal laser scanning microscopes or white light interferometric microscopy but also data from conventional AFMs and Electron Microscopes.
- Application: Semiconductor Inspection
- Grade: Benchtop
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
- Eyepiece Style: Trinocular
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Supplier: Olympus America Inc.Description: Olympus America is proud to offer the LEXT, Confocal Laser Scanning Microscope designed for sub-micron imaging, with outstanding 120nm resolution and accurate three-dimensional measurement. Magnification power from 120x to 14,400x satisfies the needs of researchers working between the limits
- Application: Other
- Grade: Benchtop
- Microscope Type: Laser / Confocal
- Image Analysis Processing Software: Yes
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Supplier: Hamamatsu Corporation USADescription: High Speed Compact Hybrid Photo Detector for Laser Scanning Microscopes (Confocal/Two-photon), Fluorescence Correlation Spectroscopy, Light Detection and Ranging, and Time-correlated Single Photon Counting.
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Supplier: RenishawDescription: microscopes are high-sensitivity systems with integrated research grade microscopes, enabling high resolution confocal measurements. inVia Raman microscopes support multiple lasers, with automatic software switching of excitation wavelength.
- Application: Biological / Life Science, Gemological, Measuring / Toolmaker, Medical / Forensic, Metallurgical, Semiconductor Inspection, Other
- Grade: Student, Benchtop, Research, Other
- Microscope Type: Acoustic / Ultrasonic, Microwave, Compound, Fluorescent / UV, Inverted, Laser / Confocal, Polarizing, Portable Field, Scanning Electron Microscope (SEM), Scanning Probe / Atomic Force (SPM / AFM), Stereomicroscope, Transmission Electron Microscope (TEM), Other
- Mechanical Stage: Yes
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Supplier: Polytec, Inc.Description: The MSA-500 Micro System Analyzer is the premier measurement technology for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS (Micro-Electro-Mechanical Systems) devices. By fully integrating a microscope with Scanning Laser
- Application: Measuring / Toolmaker, Semiconductor Inspection, Other
- Grade: Benchtop, Research
- Microscope Type: Interferometric, Laser / Confocal, Other
- Digital Display: Yes
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Supplier: Nikon Metrology, Inc.Description: The NEXIV VMR-6555 is a large stage bridge automated CNC non-contact measuring instrument. It features TTL laser height/profile scanning, intelligent pattern recognition and low contrast edge measuring. Designed for larger samples like FDP, LCD, PCB and mass-in-line inspections. Four models
- Application: Measuring / Toolmaker, Metallurgical, Semiconductor Inspection
- Grade: Benchtop
- Microscope Type: Laser / Confocal, Other
- Eyepiece Style: Other
Featured Products for Confocal Laser Scanning Microscope Top
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Accurate 0.01-micron thickness measurements on Transparent Objects. The Keyence LT-9000 Series of Laser Confocal Displacement Meters represents a major breakthrough in laser measurement technology. Accurate 0.01-micron thickness measurements are now possible on transparent objects using a single sensor head, even when target surfaces are wet, angled or irregular. Multiple measurement modes include: profile measurement, transparent object thickness measurement, angle measurement... (read more)Browse Optical Triangulation Position Sensors Datasheets for KEYENCE -
techniques. Fast and simple Z-axis measurements of characteristics such as roughness can be performed without sample preparation. When compared with a stylus system, the confocal technique provides almost instant results with higher precision. It also is noncontact, so that fragile or sensitive samples can be measured without damaging the part. Z-Axis Measurements. One method of confocal microscopy uses a scanning laser diode to illuminate the sample. For example, a laser confocal microscope using... (read more)Browse Imaging Workstations Datasheets for Olympus IMS
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Download a complimentary copy of our new catalog, "Measurement Product Guide 2012," for detailed information on our sensors (laser triangulation, confocal-chromatic, gaging and distance, capacitive, eddy current, inductive, and draw-wire), 2D/3D sensor systems for dimensional measurement, IR-temperature sensors, and custom sensor solutions. Micro-Epsilon is always pursuing the challenge of developing high precision sensors, measurement equipment and systems. This challenge represents the drive... (read more)Browse Linear Position Sensors Datasheets for Micro-Epsilon
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Accurate 0.01-micron thickness measurements on Transparent Objects. The Keyence LT-9000 Series of Laser Confocal Displacement Meters represents a major breakthrough in laser measurement technology. Accurate 0.01-micron thickness measurements are now possible on transparent objects using a single sensor head, even when target surfaces are wet, angled or irregular. Multiple measurement modes include: profile measurement, transparent object thickness measurement, angle measurement... (read more)Browse Optical Triangulation Position Sensors Datasheets for KEYENCE
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For confocal scanning laser microscopy, the stability and beam quality of the laser source are the key. for good imaging results. Qioptiq's offering will far surpass your expectations. Single or Multiple Wavelength Laser. Qioptiq can provide you with standard or customized fiber guide technology and single or multiple wavelength laser sources which can be perfectly matched for fluorescence excitation if required. Our kineMATIX ™ optomechanical system guarantees a perfectly stable coupling... (read more)Browse Lasers Datasheets for Qioptiq
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Olympus America has released the LEXT OLS4000 Measuring Laser Confocal Microscope. Designed for nanometer level imaging and measurement. Magnification ranges from 108x - 17,280x with resolution of 120nm in XY and 10nm in Z to satisfy the needs of today's researchers. The LEXT OLS4000 provides superior imaging and measuring performance with the simplicity of single touch operation. The versatility of the system provides all of the microscopy techniques combined with the added power of our dual... (read more)Browse Microscopes Datasheets for Olympus IMS
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Perform profile and roughness measurements on nearly any material. The KEYENCE VK-X Series 3D Laser Scanning Microscopes combine the capabilities of SEMs and non-contact roughness gauges with the simplicity of an optical microscope. This newly released system now boasts an unprecedented 0.5 nanometer Z-axis resolution with a magnification range spanning 200x - 24,000x. The usability and ease-of-use have been further improved with the addition of the AI-Scan function, allowing users to image... (read more)Browse Specialty Microscopes Datasheets for KEYENCE
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BRIGHTON, MI. July 13, 2010 – Nikon Metrology, Inc. (www.nikonmetrology.com) announced that it will distribute Lasertec's Optelics H1200, a real color confocal microscope with unprecedented color separation and high resolution. The two companies have agreed to have Nikon Metrology, Inc. distribute the system in the United States and Canada. The H1200's 3-CCD sensor system enables fast, accurate acquisition of 12 million pixel color images. Its advanced optics provide for high-resolution... (read more)Browse Microscopes Datasheets for Nikon Metrology, Inc.
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. It is particularly well-suited for micro-bumps on advanced IC packages; probe cards; substrate pattern height and size; advanced glass and polymer components, such as micro lenses and contact lenses, laser marks on semiconductor wafers; MEMS; wire bonding and advanced fine interconnection technology. The new Confocal NEXIV VMZ-K6555 also allows for both 2D measurements on brightfield images with the CNC 15x zooming optics and 3D measurements on confocal images. Furthermore, the TTL scanning laser... (read more)Browse Machine Vision Systems Datasheets for Nikon Metrology, Inc.
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Phenom Pro Suite. The Phenom Pro Suite is developed to enable Phenom users to extract maximum information from images made with the Phenom desktop scanning electron microscope (SEM). It extends the capabilities of the Phenom, a high-resolution imaging tool, providing solutions to specific application needs. The Phenom Pro Suite software is installed on the Phenom Application System. This monitor-mounted PC is the hardware platform for all Phenom Pro Suite software, leaving the Phenom system... (read more)Browse Electron Microscopes Datasheets for Phenom-World BV
Conduct Research Top
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Evaluation of confocal microscopy system performance
The confocal laser scanning microscope (CLSM) has been used by scientists to visualize three-dimensional (3D) biological samples. Although this system involves lasers, electronics, optics, and microscopes, there are few published tests that can be used to assess the performance of this equipment
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Techniques in Scanning Microscopy
Significant advances in scientific research often follow the introduction of novel technologies. It is abundantly clear that the commercial introduction of the confocal laser scanning microscope in the late 1980s led to major breakthroughs in our understanding of cell and tissue biology. The device
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Using Space-Age Technology to Open A New Window into the World of Horticulture
electron microscope, a transmission electron microscope, and a confocal laser scanning microscope that produces three-dimensional fluorescent images. The microscopes have digital imaging features originally developed for telescopes and cameras in the space program to study the surface of planets
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University of Waterloo Skip to the content of the web site.
University of Waterloo News Bureau New instrument extends view of confocal laser microscopes WATERLOO, Ont. -- Two University of Waterloo physicists have invented a new scanning beam confocal "MACROscope" that extends the field of view of a confocal microscope to include much larger specimens
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University of Waterloo Skip to the content of the web site.
of University of Waterloo Prof. Melanie Campbell of the School of Optometry. She and research colleagues have developed a confocal scanning laser ophthalmoscope that allows an examination of the eye in greater detail than possible before. It serves as a high-power microscope capable of producing
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INDUSTRY NEWS
Tencor Instruments strengthened its product line with the purchase of Ultrapointe, a San Jose based manufacturer of defect review tools, for an undisclosed sum. The acquisition gives Tencor all licenses to Ultrapointe's advanced confocal laser microscope technology and automatic defect
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MICRO:February 1998:Product Technology News
Designed for off-line metrology applications, the KovexVision microscope uses a proprietary scanning mechanism for reflective confocal laser scanning of sample surfaces. The instrument displays a sample image in three dimensions with all image points simultaneously in focus. This feature permits
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Getting Plant Genes To Glow: New technique emerges from metal absorption studies
metals from the food chain. With the new method, which was culled from existing techniques, a piece of a target gene's DNA is copied and then labeled with a fluorescent compound that's detectable with a laser scanning confocal microscope. The microscope portrays data in both visual and quantitative
Engineering Web Search: Confocal Laser Scanning Microscope Top
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Confocal laser scanning microscope - What does CLSM stand for?...
confocal Confocal and Image Analysis Laboratory Confocal Annular Elliptic Confocal Annular Elliptic Resonator Confocal Annular Elliptic Waveguide
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Confocal Scanning Laser Microscopy - What does CSLM stand for?...
confocal Confocal and Image Analysis Laboratory Confocal Annular Elliptic Confocal Annular Elliptic Resonator Confocal Annular Elliptic Waveguide
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Olympus FluoView Resource Center
Confocal Microscope The new Olympus FluoViewTM FV1000 is the latest in point-scanning, point-detection, Confocal Theory Java Tutorials Glossary
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Olympus FluoView Resource Center: Laser Scanning Confocal...
Laser Scanning Confocal Microscope Simulator
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LSCM Laser Scanning Confocal Microscope
LSCM Laser Scanning Confocal Microscope LSCM Laser Scanning Confocal Microscope
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Two-photon excitation microscopy - Wikipedia, the free...
Obtained at 780 nm using a Ti-sapphire laser.
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confocal laser scanning microscope | Imaging & Microscopy -...
software for confocal microscopes such as Axio CSM 700 true color confocal microscope, LSM 700 confocal laser scanning microscope, and other compound
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Molecular Expressions Microscopy Primer: Specialized...
Laser Scanning Confocal Microscope Simulator - Perhaps the most significant advance in optical microscopy during the past decade has been the
