Products/Services for Contour Metrology System
Dimensional Measurement and Metrology Services - (226 companies)
Surface Metrology Equipment - (322 companies)
Form Gages and Form Gaging Systems - (90 companies)
Metrology Fixtures and CMM Fixtures - (58 companies)Metrology fixtures and CMM fixtures are used to hold and position parts, probes, or workpieces during dimensional gaging and other measurement operations. Metrology, the science of measurement, entails both practical and theoretical considerations... Learn More
Semiconductor Metrology Instruments - (206 companies)
Wafer and Thin Film Instrumentation - (379 companies)
Imaging Workstations - (308 companies)
Product News for Contour Metrology System
LaCroix Optical Co.
Metrology Capabilites Four Zygo ® GPI XP phase shift interferometers. More than 30 shop floor interferometers. Trioptics Opticentric ®/Optispheric ® devices. Mitutoyo Coordinate Measuring. Perkin Elmer Lambda 35, 900 and 950 spectrophotometers. Multitudes of Spherometers and Micrometers. Throughout the manufacturing process, dimensional and optical specifications are verified. According to our ISO 9001:2008 certification requirements, all of our metrology devices are regularly checked and calibrated... (read more)
Lapmaster FTP 130 for Metrology Lapmaster International LLC presents the FTP 130 as a new product addition to its Metrology Line. The FTP 130 is a 3 way measuring system which accurately measures the flatness, thickness and parellelism of both 1 and 2 sided parts. Up to two different functions can be used simultaneously to measure parts as thin as 0.20mm or as thick as 200mm. It also comes with a new analog-digital display that elimates the possibility of any inaccuracies. This unit provides a very cost effective, compact... (read more)
Metal Cutting Corporation
Clean Room Metrology Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more)
JML Optical Industries, LLC
Metrology & Environmental Testing JML's optical assemblies and components are inspected by our Rochester quality team whether made domestically or by one of our off-shore manufacturing partners. Our quality team uses a range of digital and traditional instruments to ensure specifications and performance are met. These include: Zygo interferometers, vertical and horizontal optical benches, centering microscopes, optical comparators and custom MTF benches. We often develop metrology capabilities and equipment... (read more)
Metrology Software for Inspection Machines HEIDENHAIN ’s latest version of the PC-based QUADRA-CHEK metrology software provides advanced functionality for quality control inspection measurement machines. Named the QUADRA-CHEK IK 5000, this release of version 3.0.0 software has made a number of improvements which makes it possible to conveniently perform 2-D and 3-D measuring tasks in the field of metrology bringing both newer technology and retrofit ability to users. This powerful IK 5000 inspection package builds upon... (read more)
MTI Instruments Inc.
Wafer Metrology Measurement Tool The Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 150mm, 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are... (read more)
The Most Comprehensive Metrology Line Available and digital readouts, HEIDENHAIN offers a tremendous scope of metrology products. Gauging and inline process inspection products include HEIDENHAIN ’s SPECTO, METRO, and ACANTO series of length gauges that provide a high level of repeatability and reproducibility to collect reliable data. When connected to either HEIDENHAIN ’s GAGE CHEK ND2100G or the MSE1000 multiplexor, go/no-go relay signals can be sent directly to a PLC and data can be exported cleanly to EXCEL.  ... (read more)
Leica Microsystems, Inc.
3D Optical Surface Metrology System The Leica DCM 3D system with dual core technology has been designed for fast, non-invasive assessment of micro and nano structures of technical surfaces, in multiple configurations. The DCM 3D combines confocal and interferometry technology for high speed and high-resolution measurements down to 0.1nm. And, the micro display confocal technology, with no moving parts, measures a variety of materials and provides confocal and bright field images simultaneously. (read more)
Mahr Federal Inc.
MarSurf LD130/260 Aspheric 2D/3D Measuring Station Mahr Federal has introduced a new high-precision 2D/3D measuring station for checking contour and surface topography of aspheric optical lenses and other components during multi-stage grinding and polishing operations. The MarSurf LD 130 and 260 Aspheric units feature high measuring speed, measuring range of up to 260 mm, vertical resolution of 0.8 nm, and form deviations of less than 100 nm. As with all Mahr metrology systems, the MarSurf LD 130 and 260 Aspheric are backed by Mahr's extensive... (read more)
Mahr Federal Inc.
MarSurf LD 130/LD 260 Roughness & Surface Measure of different configurations and with a wide range of probe design tips and other accessories. . Mahr Federal Inc., a member of the Mahr Group, has been providing dimensional measurement solutions to fit customer application needs for over 150 years. The company manufactures and markets a wide variety of dimensional metrology equipment, from simple and easy-to-use handheld gages to technically advanced measurement systems for form, contour, surface finish and length. Mahr Federal is also... (read more)
...scatter points and their effect on the reference and test beams. Keep in mind that examining. individual points is not the complete story. Summing the wavefronts from all of the scatter points forms the contour. fringes. Figure 2a summarizes the effect of inversion symmetry for a perfectly aligned...
...tilted eucentric images, in this case obtained using a high resolution FESEM (Zeiss 1540EsB). The surface topological data produced by the SLCM confocal microscope is illustrated in Fig. 1: as a. 2D contour map (a) and a 3D image (b). Together they show the characteristic topology in the. vicinity...
...such as point, line, radius, angle, and distance can be used for contour measurement. By teaching the first part in a batch, a program can be developed and recalled to automatically inspect the remaining parts. A semiautomated metrology tool is capable of handling 75- to 200-mm wafers. The Proforma...
...characters, and holes on-screen and view the work- piece throughout the process. The tool's stage resolution on three axes allows users to micromachine over 2 in. in all directions. The system features an automated height gauge that determines the thickness, contour, and slope of...
...be reliable. and in sync. This is why Stone Contour. Systems in Colorado uses HEIDENHAIN. In contrast to conventional 3-axis. components for their customer solutions. machines, 5-axis machining has. serving the tile and stone industry. completely new demands in terms of. Besides using the HEIDENHAIN...
...to the firm. The manufacturer also maintains that the VTXU model offers higher contour machining rates and provides better surface-finish capability than typical vertical machining centers configured with a C-frame design concept. Moreover, it is compatible with most five-axis CAM programs, and features...
...a single package. The MVS-135 can be used to read bar codes, identify components and ensure that they are positioned correctly, and perform a number of other industrial inspection operations. Metrology equipment Instrument performs noncontact roughness, contour, and topography measurements...
...lengths, from a roughness profile. and a contour system--into one, enabling both roughness and. · Definition 5. Sum of the largest peak height and the larg-. contour measurements to be taken on the same unit and with. est valley depth, within a sampling length, from a rough-. the same setup. Source...
" Shufelt says. To meet the surface finishing requirements, Preferred Precision is doing 3-D contour surfacing on high-speed milling machines. "Our surfacing on our machines can go to 24,000 rpm, our feed rate is 350 in./min, and our stepover is 0.0002 to provide a better quality surface finish," Shufelt...
...to ensure. says Kumbakonam. "As mold cavities to inspect. What really impressed us that they meet set specifications. became more complex and difficult to were the contour scanning capabilities "That helps us in a great way," says. inspect, the whole process became too of the VAST XT sensor...
Engineering Web Search: Contour Metrology System
Interferometry - Wikipedia, the free encyclopedia
inversions experienced by the two beams as they traverse the optical system.[2:26,171?172 (See Michelson interferometer for a discussion of this.)
Measuring System analyzes contour and surface roughness.,...
Metrology System measures surface and contour in single pass. Metrology System measures roughness/contour simultaneously.
Wafer Inspection Tool detects edge profile, metrology,...
Metrology System measures surface and contour in single pass. Overlay Metrology System suits memory and logic devices.
Metrology In its ergonomic measuring station, the Wavemove...
Metrology providers The challenges to manufacturing as it evolves into the 21st century are now familiar, and impact how metrology must contribute.
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One system I worked on lets you take an object, wave it around by hand in front of the scanner, and get a full 3D model of the object, while being
System accessories | Industrial Metrology | JENOPTIK AG
Industrial Metrology Roughness and contour measurement System-accessories Homepage Industrial Metrology
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Transforming Metrology Data From A Semiconductor Treatment...
Transforming metrology data from a semiconductor treatment system using multivariate analysis -> Monitor Keywords