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Supplier: Anritsu Company
Description: The MS4630B is suitable for electronics production lines demanding fast and accurate device measurements. It is particularly well suited to accurate, high-speed evaluation of IF filter resonance and group delay characteristics, as well as evaluating the impedance characteristics of resonators in AV
- Instrument Type: Portable / Benchtop Instrument
- Nominal Input Impedance: 50 Ohms
- Connection to Host: RS232, GPIB (IEEE 488, HPIB), TTL, Parallel Interface
- Display Options: Video Display
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Supplier: Scantek, Inc.
Description: Monitoring of vibration severity to ISO 10816-1 Monitoring of bearing vibration Vibration quantity and filter range selectable True RMS and true peak-to-peak measurement Input for constant current compatible sensors Level display at front Relay output with adjustable threshold
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Description: Features & Benefits Many Capabilities in One Instrument Digital Waveform Monitor Digital Vectorscope Picture Display Group Delay and Frequency Response Noise Measurement Set Automatic Measurement Set Measure Mode Provides Graphic Display of Measurements ICPM K Factor
- Mounting Type: Portable/Benchtop
- Analyzer Type: Instrument
- Test Type: Noise
- User Interface: Front Panel & Display
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Supplier: GL Communications, Inc.
Description: Precision delay measurement, error insertion, internal speaker
- Network Protocol: ATM, E1, ISDN, T1, Other
- Interface Port: Parallel, Other
- Software Included: Yes
- Equipment Type: Network / LAN Analyzer
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Description: The 65210ES self-contained Inertial Measurement System is a complete solution for aircraft stores separation testing. The 65210ES has been designed as a replacement for the predecessor 65210A. Slightly smaller than the 65210A, the 65210ES is also designed to fit in an Mk80 fuze well. Installation
- Electrical Output: Pulse / Frequency
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Supplier: API Technologies
Description: The 65210ES self-contained Inertial Measurement System is a complete solution for aircraft stores separation testing. The 65210ES has been designed as a replacement for the predecessor 65210A. Slightly smaller than the 65210A, the 65210ES is also designed to fit in an Mk80 fuze well. Installation
- Electrical Output: Pulse / Frequency
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Supplier: North Star Imaging, Inc.
Description: The new CXMM™ - Coordinate X-Ray Measurement Machine - is a 3D Computed Tomography system designed for measurements and 3D applications, e.g. Reverse Engineering, Rapid Prototyping or simply 3D Digitization. CXMM™ is a unique solution on the market that provides internal and external
- Form Factor: Monitoring System
- Technology: Radiographic / X-ray
- Instrument / System Type: Computed Tomographic System
- Programmable / Digital Control Unit: Yes
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Supplier: ValueTronics International, Inc.
Description: The used Advantest Q7760 Optical Spectrum Analyzer is used when extremely fast high accuracy measurements are required Comprehensive measurement of optical transfer characteristics (S11, S21) in the optical carrier frequency domain Polarization mode dispersion accuracy : ±0.1 ps
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Description: Silicon Characterization High-frequency Analog Design ESD Testing Signal Injection Differential Current Measurements Single-shot Low Rep-rate Pulse Measurements Propagation Delay Measurement
- Current Type: AC Current
- Mounting / Configuration: Other
- Approvals: Other
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Supplier: ValueTronics International, Inc.
Description: Silicon Characterization High-frequency Analog Design ESD Testing Signal Injection Differential Current Measurements Single-shot Low Rep-rate Pulse Measurements Propagation Delay Measurement
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Supplier: Tektronix, Inc.
Description: Silicon Characterization High-frequency Analog Design ESD Testing Signal Injection Differential Current Measurements Single-shot Low Rep-rate Pulse Measurements Propagation Delay Measurement
- Current Type: AC Current
- Mounting / Configuration: Other
- Approvals: Other
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Description: Silicon Characterization High-frequency Analog Design ESD Testing Signal Injection Differential Current Measurements Single-shot Low Rep-rate Pulse Measurements Propagation Delay Measurement
- Probe Type: Current
- Attenuation Factor: 1X
- Probe Configuration: Hook
- Approvals: Other
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Supplier: Picosecond Pulse Labs, Inc.
Description: Features OC-192 Data Rate Design Very Low Group Delay Variation Absorptive Low Reflection Quasi-Gaussian Response Applications SONET and SDH Systems Fiber-optic Receivers Test and Measurement The Picosecond Advantage: Picosecond Pulse Labs has 20 years of expertise
- Filter Type: Low Pass
- Package Type: Connectorized
- Connector Type: SMA
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Supplier: GAO Tek, Inc.
Description: This handheld E1/Datacom BER transmission analyzer supports E1 frame data monitoring and analysis, double E1 channels testing, loop delay, APS delay, pulse measurement, jitter measurement, and signal level measurement.
- Equipment Type: Network / LAN Analyzer
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Supplier: Allied Electronics, Inc.
Description: Calculation Results to a Source Function Autostep Permits The Calibrator to Be Used as a Remote, Continuously Varying Test Source Programmable Measurement Delay Supports Slowly-Responding Instruments Bonus Features Available with Product Registration — Transmitter Simulation Mode
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Supplier: Fisher Scientific
Description: Determine the speed of light using electronic time-delay measurement See details Includes: Basic unit including the oscillator, receiver, and built-in mains supply; shaft-mounted fresnel lens; and shaft-mounted triple-prism reflector Speed of Light Meter Meter, Light; A3B; For determining
- Meter Type: Lux Meter
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Description: and Analysis: Eye Pattern and Jitter Waveform Measurements – Option PHY Color Bar and Pathological Signal Generation – Option PHY Digital Data Analysis – Standard ANC Data Inspector – Standard Simultaneous Input Monitoring – Standard Audio/Video Delay
- Host Interface: Ethernet, Other
- Features: Integral Display
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Supplier: ValueTronics International, Inc.
Description: to 100% of bandwidth for stress testing ATM payloads Cell loss, inter-arrival time and transfer delay measurements for ATM Scans the incoming ATM signal and reports the bandwidths of active VPIs/VCIs E1 in DS3 mapping including E1 timeslot testing Drop and insert DS1/E1 from DS3 for thru
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Supplier: GENEQ, inc.
Description: performance of cartons on high speed packaging machines. FEATURES AUTOMATIC DWELL TIME 15 second measurement delay to eliminate operator variability AUTO-CALIBRATION WITH ZERO SET POINT Fast set-up and calibration AUTOMATICALLY CALCULATES STIFFNESS/ CREASE RATIO* Easy to assess sample
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Supplier: Sensitech, Inc.
Description: are customized with specific alarm conditions, providing reliable information for last-mile shipments. Features and Benefits Two models available; continuous operation and stop-enabled User friendly display and reliable electronic operation Offers four alarm settings and selectable start-up delay
- Input Options: Permanent Sensor or Probe
- Local Interface: Digital Front Panel
- Display Type: Digital Readouts
- Mounting Configuration: Portable or Hand Held
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Description: with and without delay in measurement and control channels, as well as control of nonredundant and redundant multibody systems. Provides a consistent unified theoretical framework for motion control design Offers graduated increase in complexity and reinforcement throughout the book Gives detailed
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Featured Products for Delay Measurement Top
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Colby Instruments, Inc.
Delay Line Instrument Programmable (PDL-100A)
Our industry-leading PDL-100A instruments use our patented Electro-Mechanical Trombone structure and can be configured in different models for total delay of up to 100 ns or more. This series is best suited to applications where you need ultra-fine precision step delay (to 0.50 ps), such as: Finding the exact node points in noise cancellation loops with phase noise analyzers. Precision synchronization to reference clock signals. Conducting intermodulation distortion (IMD) measurements... (read more)
Browse RF Phase Shifters Datasheets for Colby Instruments, Inc. -
NET USA, Inc.
Real Time 3D Depth Measurement
black. In order to make a calculation, the (stereo-) camera system is calibrated (rectified) for the measuring process. This ensures that the left and right images are on the same level, enabling a distortion-free display. The calculation can only be made after this has been done. Unique selling position: What makes it so special? What is new?. The use of an FPGA enables the calculation of 64 disparities with less that 1 msec delay by a 720p sensor at a 60Hz frame rate (75 megapixel/sec... (read more)
Browse High Speed Cameras Datasheets for NET USA, Inc. -
Sherborne Sensors
DTI digital for tilt measurement applications
erroneously, with high and low deviations facilitating control around a set point. On and off delay times can be set with individual alarms, configured as latching or non-latching, depending on requirements. The DTI may be used with most Sherborne gravity-referenced inclinometers, as well as other manufacturers ’ products. An integral 12 VDC power supply provides excitation voltage for MEMS- based inclinometers whilst bi-polar voltage supplied inclinometers may be powered via Sherborne... (read more)
Browse Digital Panel Meters Datasheets for Sherborne Sensors -
Panasonic Electric Works
PhotoMOS Optical Isolated MOSFET Relays
lead terminals results in reduced signal propagation delay for measurement applications. Features. Super miniature SON (Small Outline No-lead) package. The SON type is a new PhotoMOS relay with approximately 43% the volume ratio of existing SSOP type. The super miniature leadless construction reduces the mounting area and enables high density mounting. Both low on-resistance (R type) and low capacitance (C type) available at C ×R10. R type. : On resistance 0.8 Ω (typ.). Output... (read more)
Browse Solid State Relays Datasheets for Panasonic Electric Works -
Fotronic Corporation / Test Equipment Depot
Tektronix TDS2024C 200 MHz, 4 Channel, 2GS/s DSO
Duty cycle measurement, Delay measurement, Phase measurement. Measure active channel or math waveform. On-screen cursors help make quick time and voltage readings. Built-in Waveform Limit Testing. Monitor signal changes and output pass or fail results. Quick and easy template definition. Record multiple failed waveforms to USB memory device in waveform and/or screen image formats. Source can be any input channel or math waveform. User specified stop condition of elapsed time, waveforms... (read more)
Browse Oscilloscopes Datasheets for Fotronic Corporation / Test Equipment Depot -
Fotronic Corporation / Test Equipment Depot
Tektronix WVR7020 Waveform Rasterizers
Features: The WVR7020 Series Offers Analog, SDI and Dual-Link Monitoring Options In One Platform. The WVR7120 Provides Options For: Numerical and Graphical Display of A/V Delay. Simultaneous A/B Input Support Extends Monitoring Functions. CaptureVu Allows You To Store And Compare Diverse Views Of The Reconstituted Signal (Standard In WVR7120). High Performance Eye, Jitter and Physical Layer Measurements Help Quickly Resolve Difficult Quality And Reliability Problems. Passive loop-through inputs... (read more)
Browse Signal Converters Datasheets for Fotronic Corporation / Test Equipment Depot
Conduct Research Top
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Delay Time Measurement with Ultrasonic Sensors
Many industrial ultrasonic sensors are based on the delay time measurement. As has been mentioned in the introduction, the "measurement representation" thereby is the propagation velocity of the sound in the air, which is 330 m/s under normal conditions. The sensors utilized for these functions
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Removing Phase Delay Using Phaseless Filtering
a different amount to that at another frequency. Why does this matter?. Removing Phase Delay Using Phaseless Filtering : Noise & Vibration Measurement Blog. Tweet. Who Are We?. Full Article Index. Contact Us. Prosig Noise & Vibration Blog Telling you what you need to know about noise & vibration. Signal
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Investigation of electron delay in the base on noise performance in InGaP heterojunction bipolar transistors
integration level compared to. Si/SiGe technology [1, 2]. State of the art III-V HBTs. have a cut-off frequency (fT) exceeding 600 GHz [3]. In a. thin base (wB < 90 nm) HBT, the signal delay takes place. mainly in the base and the base/collector (B/C) region. where the electron transport is also
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Group Delay and its Impact on Serial Data Transmission and Testing (.pdf)
This paper is an extension of last years paper entitled "Eye Pattern Measurements in Scopes". Last years paper pointed out the effects of bandwidth, roll-off rate, flatness, and group delay characteristics along with probe loading and return-loss. It only glossed over the more complicated topic
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Adjust mis-matched delay lines in Cypress Semiconductor Application Note
and whose cause can generally be di-. understand the parameters needed to improve the reliability. rectly attributable to specific physical components or events. of their systems. An example of this would be the jitter caused by the frequency. selective attenuation and phase delay of a signal
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Advanced VNA Cable Measurements
This field brief will discuss phase-matching cables, S-parameter definitions as they apply to cable characterization and other cable parameters such as Phase Shift and Group Delay. Advanced Time-Domain measurements will also be presented as enhancements to the well-known Distance-to-Fault (DTF
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Measurements of Two-Port Balanced Networks
. insertion loss of the pad. Network. The measured transmission characteristics of the. network vs. frequency may include phase and group. Fig. 2a. Two-Port Balanced Network. delay in addition to amplitude. North HillsTMSignal Processing Corp. 6851 Jericho Turnpike. Phone: 516-682-7700. Syosset, NY
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Balun Measurements
to facilitate efficient transmission of. communication signals. Balanced systems reduce. Fig. 2. Transmission Test. radiation and pick up, and alleviate the need for. costly shielding. The measured characteristics may include amplitude,. phase and group delay, which is the slope of the. For best performance
Engineering Web Search: Delay Measurement Top
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Jitter - Wikipedia, the free encyclopedia
Main article: Packet delay variation In the context of computer networks, the term jitter is often used as a
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Coherence (physics) - Wikipedia, the free encyclopedia
4.3 Measurement of temporal coherence 5 Spatial coherence 6.1 Measurement of spectral coherence 7 Polarization coherence
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Agilent | Agilent Labs Publications
Publications - Electronic Measurement, Data Conversion and Communication Publications - Electronic Measurement, Data Conversion and Communication
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Measurement Delay (sec)
Measurement Delay (sec) Description The Measurement Delay (sec) parameter specifies the delay between the first
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Dunigan's Network Peformance Links
CAIDA Measurement Tool Taxonomy and Internet Performance Measurement and Analysis ipma and NLANR's measurement and operations analysis
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What’s New in NI LabVIEW 2012 - National Instruments
If you need to build a high-quality measurement or control system that will scale for the future, LabVIEW 2012 has new tools and resources to help.
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Advanced Measurement Technology | OmniTek
New AV_DELAY Software Option Offers In-Service A/V Delay and Loop Delay Measurement for OTM 1000 and OTR 1001.
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Performance of different time delay measurement schemes for...
Home > Publications > Performance of different time delay measurement schemes for mobile station positioning in CDMA systems
