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Product Announcements
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Interferometer Flatness Measuring
Lapmaster International KDP Composite Plates Lapmaster International Portable Surface at Best Price and FREE Caliper! MSI-Viking Gage Probe System for Life™ SemiProbe Inspection Scope - Articulated & Affordable Fiberoptics Technology, Inc. 2900 AGD 2 Electronic Indicators - IP67 Protection Starrett |
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wr004306 1..14 As sediment inputs declined from 1996 to 2003, surface grain size increased, clast structures formed, and sediment mobility and bed load transport |
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PII: S0022-1694(00)00421-2 reduction of channel conveyance in the mainstem as observed in USGS gage height trends does indicate that increased ?ooding on the mainstem Skokomish |
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USGS: Science Topics: hydrologic processes Water circulation (5 items) Percolation (1 items) Saltwater intrusion (6 items) Scour (2 items) Groundwater and surface-water interaction (4 items) See U.S. Geological Survey Information |
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Mass balance, meteorological, ice motion, surface altitude,... MASS BALANCE, METEOROLOGICAL, ICE MOTION, SURFACE ALTITUDE, AND RUNOFF DATA AT GULKANA GLACIER, ALASKA, 1992 BALANCE YEAR by Rod S. March and Dennis |
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TPX Diagnostic Window Study: 62-950829-LANL-GWurden-01 * Review of data on the impact of radiation absorbed in the surface layer of windows in inducing short-range stresses. |
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Journals of the American Physical Society - Collaborations | Authors A B C D E F G H I J K L M N O P Q R S T U V W X Y Z |
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38th Fluid Dynamics Conference and Exhibit<BR> Agenda for Numerical Simulation of Hypersonic- Boundary Transition with Surface Roughness L. Duan, X. Wang, and X. Zhong, University of California Los See AIAA - American Institute of Aeronautics and Astronautics, Inc. Information |
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41st Aerospace Sciences Meeting and Exhibit Agenda Exploratory Calibration of Adjustable- Protrusion Surface- Obstacle (APSO) Skin Friction Vector Gage R. Hakkinen and J. Neubauer, Washington See AIAA - American Institute of Aeronautics and Astronautics, Inc. Information |
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Advanced CMP Processes for Special Substrates and for Device... A comparison with standard methods is undertaken to prove the surface and crystalline quality of the resulting substrate material is equivalent. See VTT Technical Research Centre of Finland Information |
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International Conference on Applied Optical Metrology -... They contain the derivatives of the dilatation and the curvature change of the object surface and the virtual deformation of the images. |