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Electron microscopy allows our electronic failure analysts to take incredible images of a huge variety of defects. From melted silicon to cracked metallization and all points between, the electron microscope is an invaluable tool for inspecting any anomaly. Electron microscopy services...

Polycrystalline microstructures can be well imaged using maps reconstructed from orientation data collected by electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM). These maps are very helpful for delineating grain boundries in such mircostructures and are thus well...

Polycrystalline microstructures can be well imaged using maps reconstructed from orientation data collected by electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM). These maps are very helpful for delineating grain boundaries in such microstructures and are thus well...

...characterization and manufacturing techniques. Practical use of nano-tubes is also in progress. An electron source for a field emission display device is one of such examples. An electronic device of nano-scale may be a possibility in the future. Electron microscopes have been used for studying...

...sample preparation that is required, and the ability to tilt and translate samples while they are under observation. Scanning electron microscopes come in many forms featuring different types of electron guns and vacuum systems. Each type of SEM has its own unique advantages and disadvantages...

...is required, a scanning electron microscope (SEM) is best suited....

An extensive study using a Scanning Electron Microscope to examine and compare the results of cylinder honing using rigid hones versus the Flex-Hone (R) Tool. The booklet examines what the honed cylinder wall surface should and should not look like. Three different studies are presented USA, UK...

An electron backscatter diffraction (EBSD) pattern is formed when a focused electron beam is positioned on a grain within a highly inclined (typically 70 degrees) sample in a scanning electron microscope. As the incident electron beam interacts with the crystal lattice within a small volume...

Orientation Imaging Microscopy OIM is a technique for characterizing the crystallographic orientation aspects of material microstructures. The technique is based on automated indexing of electron backscatter diffraction (EBSD) patterns. EBSD is a scanning electron microscope (SEM) based technique...

Turbomolecular pumps have been employed for Hitachi's electron microscopes as they allow high temperature microscopy in a clean environment. A specially developed double-tilt bulk specimen holder has also been used. We report here of high temperature in-situ microscopy and EELS analysis...

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