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Electron microscopy allows our electronic failure analysts to take incredible images of a huge variety of defects. From melted silicon to cracked metallization and all points between, the electron microscope is an invaluable tool for inspecting any anomaly. Electron microscopy services...

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Polycrystalline microstructures can be well imaged using maps reconstructed from orientation data collected by electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM). These maps are very helpful for delineating grain boundries in such mircostructures and are thus well...

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Polycrystalline microstructures can be well imaged using maps reconstructed from orientation data collected by electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM). These maps are very helpful for delineating grain boundaries in such microstructures and are thus well...

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An extensive study using a Scanning Electron Microscope to examine and compare the results of cylinder honing using rigid hones versus the Flex-Hone (R) Tool. The booklet examines what the honed cylinder wall surface should and should not look like. Three different studies are presented USA, UK...

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...is required, a scanning electron microscope (SEM) is best suited....

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An electron backscatter diffraction (EBSD) pattern is formed when a focused electron beam is positioned on a grain within a highly inclined (typically 70 degrees) sample in a scanning electron microscope. As the incident electron beam interacts with the crystal lattice within a small volume...

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Orientation Imaging Microscopy OIM is a technique for characterizing the crystallographic orientation aspects of material microstructures. The technique is based on automated indexing of electron backscatter diffraction (EBSD) patterns. EBSD is a scanning electron microscope (SEM) based technique...

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...cameras. A scanning electron microscope image of the diaphragm on the Akustica microphone chip shows the serpentine pattern created in the chip's metal and oxide layers. The special structure is necessary to...

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The Netherlands, broke the 1- A image-resolution barrier using a 200-kV transmission electron microscope (see accompanying...

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Bell Labs scientists have discovered a method that promises a better understanding of how dopants influence a semiconductor's electrical properties. Using a scanning transmission electron microscope, researchers at the Lucent Technologies R &D facility in Murray Hill, NJ, have examined individual...

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Olympus Corporation of the Americas - Scientific Solutions Group
Olympus Corporation of the Americas - Scientific Solutions Group
Olympus Corporation of the Americas - Scientific Solutions Group
Titan Tool Supply, Inc.