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  • MEMS Inspection and Testing
    tests). Electrical functional MEMS testing is a process used to sort and/or mark die on wafers based on electrical performance. Wafer sorters or probes preform functional tests on dies in wafers or on packaged MEMS or IC devices. Functional tests verify the operation of all device functions
  • Cryogenic Tool Conditioning Extends Useful Life
    resistance after cryogenic treatment. * A cryogenic processor should be technically knowledgeable, stand behind it work, and help customers quantify the benefits of cryogenics. , " MACHINE DESIGN, June 4, 2009 The manufacturing engineer couldn't believe what the die-shop foreman was telling him: A die set