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Parts by Number for Dielectric Breakdown Top

Part # Distributor Manufacturer Product Category Description
10310525 PLC Radwell Slaughter Co Test Equipment, Test/Meter Accessory Module TESTER DIELECTRIC BREAKDOWN AND LEAKAGE

Conduct Research Top

  • Dielectric Withstand Testing of Modular and Manufactured Homes (.pdf)
    the. insulation to determine if it is capable of resisting transient power line surges to which the wiring. may become subjected, identify any low resistance areas of the insulating material and any. dielectric breakdown paths of failures that may exist.” Please note that the test is not to be. conducted from
  • Breakdown analysis of a power transformer terminal lead
    For dielectric breakdown analysis, a common procedure is applied which is based on obtaining the field data from FE electrostatic field analyses. This article uses the simulation of a shielding ring and terminal lead of a typical power engineering transformer as an example.
  • Effects of Deposition Method of PECVD Silicon Nitride as MIM Capacitor Dielectric for GaAs HBT Technology
    film is shown to have significantly superior and higher dielectric breakdown voltage and lower leakage current characteristics, as compared to the single layer film, while the capacitance density is found to be similar. Additionally, the multi-layer Si3N4 film is shown to have lower compressive stress
  • The Megger Guide to Oil Breakdown Dielectric Testing
    Oils that combine a high flashpoint with high dielectric strength have long been used as an insulating medium in. transformers, switchgear and other electrical apparatus. To ensure that the dielectric strength of the oil does not. deteriorate however, proper maintenance is essential, and the basis
  • ALD HfO2 and Al2O3 as MIM Capacitor Dielectric for GaAs HBT Technology
    25 to 150oC, the breakdown voltage of both films decreased, while the leakage current increased. These results show that both ALD HfO2 and Al2O3 are. compatible with, and suitable as MIM capacitor dielectric in GaAs HBT technology and can be adjusted to meet the specific application
  • AN0005 Mechanical Cracking
    dielectric breakdown leading to capacitor failure in service. Mechanical cracks are created by excessive mechanical stress after the capacitors have been soldered onto the substrate. Excessive mechanical stress can be the result of the following: *?Exceptional Circumstances _ Interference fit
  • AN0001 Polymer Termination
    dielectric breakdown leading to capacitor failure in service. In order to reduce the possibility of mechanically cracking multilayer ceramic capacitors Syfer in conjunction with customers has been actively developing a new termination material. This termination is a silver loaded epoxy polymer
  • Medical Device Link .
    the safety of medical electronics. Key areas of safety testing for medical electronic equipment are leakage current, dielectric breakdown, insulation resistance, and ground bond testing. This article examines the purpose of these tests, discusses the technique of each, and differentiates among them
  • Medical Device Link .
    . The need for hermeticity was originally driven by sophisticated military electronic applications. System failures in both electronic and mechanical systems had been traced to the ingress of moisture, which can cause dielectric breakdown, corrosion, and loss of insulation resistance between
  • Electron Trapping in Polymer Insulators
    molecular properties, space charge and insulation failure. The presence of space charge in the polymeric insulation of high-voltage cables is correlated with dielectric breakdown. The

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