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Supplier: Artifex Engineering
Description: to 120A with rise and fall times of 50ns at 60A. This unique feature allows accurate testing of high power diode lasers at the chip or bar level without undue thermal loading of the device under test. The fast data acquisition provides for high throughput. Artifex Engineering supports this product
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Supplier: Newark / element14
Description: Diode; Breakdown Voltage:100V; Forward Test Current If:200mA; Leaded Process Compatible:Yes; Mounting Type:Through Hole; Package / Case:TO-92
- Diode Applications: Rectifier Diode
- RoHS Compliant: Yes
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Supplier: Photodigm, Inc.
Description: The TO8-1000-A is an ideal mount for the operation of Photodigm’s TO-8 packaged lasers.
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Supplier: American Microsemiconductor, Inc.
Description: Instrument Probe Diode;Test Frequency-10Gc/s.
- Diode Type: Other
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Supplier: Allied Electronics, Inc.
Description: Diode, Zener; 5.1V; 500mW; DO-35, 17; 5; 300; 20mA Test Current
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Supplier: OMEGA Engineering, Inc.
Description: The OMEGA® HHM32 is a versatile multimeter and thermometer in a rugged handheld case. In addition, it offers a diode test, audible continuity check function, logic test function and hFE test function. Ohm, diode, continuity, logic and frequency input protection to 500 V DC/AC rms. Unit provides
- Electrical Measurements: Continuity Check, Diode Test
- Form Factor: Handheld
- Measurement Type: AC / DC
- Display Digits: 4 Digits
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Description: Large 3-1/2 digit display DCV, ACV, Capacitance, Frequency, °C/°F Temperature and Phase Direction of arrow on display identifies correct or incorrect wiring configuration Continuity beeper, Diode tests Built-in stand for benchtop use Designed for latest US and European safety
- Electrical Measurements: Audible Continuity, Continuity Check, Diode Test, Thermocouple Test, True RMS Measurement
- Form Factor: Handheld
- Measurement Type: AC / DC
- Phase: Single Phase
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Supplier: Amprobe-Direct
Description: Auto power off Data hold Backlight display Large, easy to read LCD display Auto compensation of the test leads resistance Diode test Audible continuity
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Supplier: Tempco Electric Heater Corporation
Description: with CAT III test leads, batteries and carrying case temperature probe Provides AC/DC μA measurements with high 0.1μA resolution – ideal for HVAC applications. Fast Continuity Beeper and Diode Test Overrange and Low Battery indications Compact size allows measurements in tight
- Electrical Measurements: Continuity Check, Diode Test, Thermocouple Test
- Form Factor: Clamp Meter
- Measurement Type: AC / DC
- Phase: Single Phase
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Supplier: TELOPS, Inc.
Description: With the growing demand for simple, cost-efficient test systems, the V500 is an excellent solution for high volume laser diode production.
- Type / Form Factor: Test Module / Sub-system
- Options / Module Types: Measure Unit / Monitor
- Components / Products Tested: Active Components / Semiconductors
- Tester / Test Capability: Functional Test (Performance), Life / Endurance Testing
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Supplier: Mile-X Equipment, Inc.
Description: OTC 3940 550 Series Digital Multimeter The 550 Series DIGITAL MULTIMETER features powerful automotive test functions such as; Frequency, Duty Cycle, Diode & Continuity Tests, plus all the standard meter features you expect in a professional grade Multimeter. Features: Diode Test
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Supplier: GENEQ, inc.
Description: configuration via direction of arrow on display Audible continuity & diode tests Built-in stand for benchtop use UL 1244 Listed Complete with protective holster, color coded test leads for phase, alligator clips, multimeter test leads, bead wire temperature probe, and 9V battery
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Supplier: Electro Rent Corporation
Description: Agilent U3402A AT-U3402A 5.5 Digit Dual Display Multimeter does Basic measurements include DC, AC and AC+DC voltage and current, 2-wire and 4-wire resistance, frequency, continuity and diode tests. Math functions include dBm, Relative, Min/Max, Compare and Hold. Standard accys include: Quick Start
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Description: Abstract This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on power systems with voltages equal to or less than 1000 V RMS or 1200 V DC.
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Supplier: Megger
Description: displays and the choice of operation in the manual or autoranging mode. Capacitance, frequency, conductance and diode test facilities are included as standard features, plus for more advanced measurement applications the ability to record, store, sort and compare results is also provided.
- Electrical Measurements: Audible Continuity, Continuity Check, Diode Test, Max/Min or Peak Spike Measurement
- Form Factor: Clamp Meter, Handheld
- Display Digits: 3 Digits, Plus 1/2 Digit
- Features: Adjustable Sampling Rate, Auto-Ranging, Battery Powered, Data Storage / Logging, dB Readings, Removable Data Storage
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Supplier: ValueTronics International, Inc.
Description: display Continuity and diode test Low battery indication
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Supplier: Fiber Instrument Sales, Inc./FIS
Description: Operating manuals and batteries included
- Emitter Type: Laser Diode
- Form Factor: Hand Held
- Cable Type: Single-mode
- Connector Type: FC
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Supplier: Acme Tools
Description: limited warranty - Audible continuity and diode tests
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Supplier: InspectorTools
Description: A Mini AC/DC Clamp Meter Features 4000 count LCD display 1mA resolution Jaw opens to 0.5" (12.7mm) AC/DC Voltage, Resistance, Frequency, Capacitance, and Duty Cycle Diode Test/Continuity Beeper Data Hold Complete with test leads, two 1.5V AAA batteries and carrying case
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Supplier: Tradeport Electronics Group
Description: 8 Functions AC/DC Voltage, AC/DC Current, Resistance, Capacitance, Diode Test and Audible Continuity Beeper - High Voltage 1000V and 20A Current Range - 0.5% Basic DCV Accuracy - LCD Display
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Supplier: Computer Network Accessories, Inc.
Description: Analog multimeter. Includes manual, test leads and battery. Features: DC and AC voltage measurements: up to 1,000V DC current: 50µA to 0.25A Resistance measurements Two transistor tests: Iceo-test and hFE-measurements Diode test: IR and IF measurements dB scale
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Supplier: Primo Instrument Inc.
Description: has significant improvements over Flukes original 7-600, and other utility multimeters. Using the Fluke VCHEK LoZ low impedance measurement function, users can simultaneously test for voltage or continuity. The Fluke 113 can perform diode tests, and also provides both auto and manual ranging
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Supplier: REED-Direct
Description: Auto or manual ranging with data hold and relative mode Continuity beeper and diode test Large 2999 count display Overload protection on all ranges Splash resistant front panel design Complete with test leads IEC 1010 CAT lll 600V SPECIFICATIONS: AC Current Range: 600A DC Current
- Electrical Measurements: Audible Continuity, Continuity Check, Diode Test
- Form Factor: Clamp Meter, Handheld
- Features: Auto-Ranging, Overload Protection
- Display Type: Digital
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Supplier: United Refrigeration, Inc.
Description: Non-contact voltageloud beeper and bright LED indicate the NCV tab is near AC voltages greater than 24V. Temperaturethermocouple plugs in directly for accurate readings, even in fast changing environments. MicroampsFor flame rectifier diode tests. CapacitanceFor motor-run and motor-start capacitors
- Form Factor: Clamp Meter
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Featured Products for Diode Test Top
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Artifex Engineering
Laser Diode Test System LIV100-L600
nbsp;The LIV100-600 is a good example of our motto "Your Problem is our Challenge - Flexibility is our Standard!". In this customization project we implemented the standard LIV100 data acquisition core and beefed up the current driver end stages. Software modifications rounded up the project. The result is a real power package!. Highlights: Laser Current: 1-600A. Pulsed and CW modes supported. Risetime: 2 µs. . The LIV110 is our new CW, low cost test system for use ... (read more)
Browse Diode Lasers Datasheets for Artifex Engineering -
Artifex Engineering
New LIV Laser Diode Test System
We have introduced our new LIV120 laser diode characterization instrument, which is a CW/QCW tester for LIV and spectrum of packaged laser diodes, SLEDs and LEDs. This compact unit can be mounted in testing machines or used in a laboratory environment. Full LIV sweeps of up to 4000 currents can be performed. A measurement sweep with 1000 currents takes about 1s to execute including data downloading to the control computer. The LIV120 incorporates useful setup features allowing a wide range... (read more)
Browse Automated Test Equipment Datasheets for Artifex Engineering -
American Microsemiconductor, Inc.
Diode Arrays
Fast Switching Diode Arrays. American Microsemiconductor diode arrays, featuring 10nS reverse recovery time and a low foward voltage drop of 1.0max volt at 10 mA, make them ideal where ESD and EFT protection are of paramount importance. American Microsemiconductor Inc.supplies a large selection of diode arrays, arrays that were formerly supplied by Motorola, Fairchild, Linfinity,and Sertech. American Microsemiconductor diode arrays have many advantages over using multiple discrete diodes... (read more)
Browse Diode Arrays Datasheets for American Microsemiconductor, Inc. -
Artifex Engineering
LIV Laser Diode Characterization
LIV testing of diodes (laser and LED) involves sweeping the current to the device and measuring the optical power output as well as the voltage drop across the device. In addition, the application may also involve measurement of the current output of an internal monitor photodiode as well as the optical spectrum of the device under test. Artifex Engineering offers LIV test instrumentation for use in the lab as well as for OEM applications, ideal for testing lasers and LEDs at all ranges... (read more)
Browse Automated Test Equipment Datasheets for Artifex Engineering -
American Microsemiconductor, Inc.
Tunnel Diode and Back Diode by AMS
TUNNEL DIODE. A tunnel diode is a semiconductor diode with a negative resistance region that allows very fast switching speeds, up to 10 GHz. The operation of the tunnel diode depends upon a quantum mechanic principle known as "tunneling" wherein the intrinsic voltage barrier (0.3 Volt for Germanium tunnel diodes and 0.7 Volt for Silicon tunnel diodes junctions) is surmounted due to high doping levels (introduced during diffusion), which enhances tunneling and in turn, fast switching... (read more)
Browse Tunnel Diodes Datasheets for American Microsemiconductor, Inc. -
American Microsemiconductor, Inc.
1N5772 ceramic flatpack Diode Arrays
American MicroSemiconductor (AMS) is now producing the 1N5772 diode array in 10 pin Ceramic Flat Pack for both commercial and military Applications. More Information... Quick Links: More information and Data sheet for the1N5772 Diode Array. Our line of Core-Driver Arrays. General-Purpose Arrays. Featuring. Low capacitance 8Pf. Low leakage current. Air isolation diodes. High breakdown voltage VBR > 60Volt. Protection for up to 8 ports. Reverse recovery 10nS. Screening available for JAN &... (read more)
Browse Diode Arrays Datasheets for American Microsemiconductor, Inc. -
Extech Instruments, A FLIR Company
Tweezer Meter - Removable Tips & Readings to 600V
RC200 Tweezer Multimeter permits tweezer-style testing of small, SMD components as well as standard electronic and electrical testing using easy-to-swap test leads. The Extech RC200 is a small, hand-held tool with selectable auto-/manual-ranging used to measure AC/DC voltage, capacitance, resistance, continuity, and diode function in circuit. For one-hand operation, squeeze the tweezers around a surface mount component or test point for automatic component identification and testing. For ease... (read more)
Browse Digital Multimeters Datasheets for Extech Instruments, A FLIR Company
Parts by Number for Diode Test Top
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| 8014670000 | Digi-Key | Weidmuller | Connectors, Interconnects | TERM BLK W/DIODE FOR TEST BG |
| AZ23C6V2VGS08 | PLC Radwell | Vishay | Not Provided | ZENER DIODE; VZ TEST CURRENT |
| AZ23C4V7VGS08 | PLC Radwell | Vishay | Not Provided | MIN QTY 3000 DIODE; VZ TEST CURRENT |
| AZ23C7V5VGS08 | PLC Radwell | Vishay | Not Provided | MIN QTY 3000 ZENER DIODE; VZ TEST CURRENT |
Conduct Research Top
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Instrumenting DWDM Laser Diode Production Tests
trigger I/O. Furthermore, built-in math and comparator functions can reduce the PC. controller's processing load. With appropriate programming, these features reduce much of the data traffic over the GPIB bus. during a test. This applies to all types of laser diode tests, whether they are conducted
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QCW Diode Array Reliability at 80x and 8xx nm
shots). In addition to life test data, a summary of. performance data for each epitaxial structure and each bar design is also presented. March 21, 2011. QCW Diode Array Reliability at 80x and 88x nm1. Ryan Feeler2, Jeremy Junghans, Joseph Levy, Don Schnurbusch, and Ed Stephens. Northrop Grumman
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Near Field Imaging of a Laser Diode Using Scanning Method
camera with a 100X objective lens. (Reference image). Figure 3. A near field beam profiling setup using a simple biconvex lens. We first took the image of the test laser diode using a. 100X objective lens and an IR camera. The optical. Magnified vs. Nonmagnified Images. principle is identical
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Application of the Integrating Sphere Optical Power Measurement System in Laser Diode Characterization
the instrument control and data. Wavelength (nm). acquisition process. Figure 9 shows the schematic dia-. gram of a typical laser diode experimental test setup. Figure 7. Typical example of an experimentally obtained responsitivity vs. used in the laboratory. wavelength information associated
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Plastic Diode Could Lead To Flexible, Low Power Computer Circuits, Memory
Previous stories pertaining to Professor Berger's research: "Sensor Could Detect Concealed Weapons Without X-Rays," "New Diode Could Enable Faster, More Efficient Electronics, COLUMBUS, Ohio - Ohio State University researchers have invented a new organic polymer tunnel diode - an electronic
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Laser Diode Module Testing Critical to Development of High Bandwidth Communication Systems
in the value of the test equipment solution. The L-I-V test sweeps include forward voltage measurements on the laser diode, reverse voltage leakage and breakdown tests, a lasing threshold current test, and light intensity measurement. The latter can involve either AC or DC testing. In DC testing, a reverse
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Measurement of Water Activity of Bacon Using a DA 7200 Diode Array High Speed Analysis System (.pdf)
Four samples of microwaveable bacon were sent to Decagon Devices and Perten Instruments. Each packaged contained 12 strips of bacon. The purpose of the samples was to test the feasibility of using the DA 7200 Diode Array NIR Analysis system to measure Water Activity of Bacon in 6 seconds.
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Using a DA 7200 Diode Array High Speed Analysis System to Analyze Dried Cranberries (.pdf)
Fifteen samples of dried cranberries were sent to Decagon Devices and Perten Instruments. The purpose of the samples was to test the feasibility of using the DA 7200 Diode Array NIR Analysis system to measure the Water Activity, Oil Content, and Karl Fisher Moisture Content of Cranberries in 6
Engineering Web Search: Diode Test Top
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Diode Test Digital Voltmeters Datasheets
Home > Datasheets > Digital Voltmeters > Diode Test Diode Test Digital Voltmeters Datasheets
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Diode Test Power Meters Datasheets
Home > Datasheets > Power Meters > Diode Test Diode Test Power Meters Datasheets Other Power Meters
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ASTM C1307 - 02(2008) Standard Test Method for Plutonium...
ASTM C1307 - 02(2008) Standard Test Method for Plutonium Assay by Plutonium (III) Diode Array Spectrophotometry
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ASTM G130 - 06 Standard Test Method for Calibration of Narrow...
1.1 This test method covers the calibration of ultraviolet light-measuring radiometers possessing either narrow- or broad-band spectral response
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ESA Science & Technology: Successful Planck RF Telescope Test...
The test method was based on "Radar Cross Section" (RCS) measurements with a dedicated switching diode in place of a detector at the end of the feed
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Allied Electronics â?? Electronic Parts and Components...
Test Connectors Enclosures, Racks & Cabinets LED (Light Emitting Diode) Lenses Light Pipe Products
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Improve Semiconductor Test Performance by 45X with the NI...
Diode Test As was earlier mentioned, the Diode Basics Diode Test Comparison of Sweep Times - Agilent E3631A versus NI PXI-4110
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Yokogawa Electric Corporation - Yokogawa Global
Tunable Diode Laser Analyzers Oxygen Analyzers Test and Measurement Recorders & Data Acquisition
