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Product Announcements
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Carling V-Series Rocker Switches
Carlton-Bates Company Series 300 Miniature Rocker Switches Taiway Electronics Components Co. S-Series Rocker Switch Carling Technologies, Inc. Carling H-Series Curved Rocker Circuit Breaker Quist Electronics KD-2736-04 Ultra Small Round Rocker Switch Kendu International Inc. New V Series Contura V Rocker Carling Technologies, Inc. |
| Part # | Distributor | Manufacturer | Product Category | Description |
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| InSight 3D Atomic Force Microscope | Bruker Nano Surfaces Division | Wafer and Thin Film Instrumentation | isolation (STI) union dual-damascene structures, sidewall angles, line-edge variation and more. Provides the lowest measurement uncertainty for critical dimension (CD) and sidewall angle (SWA) metrology. 30 wph, 9 sites throughput for Depth metrology & 12 wph, 9 sites throughput for CD metrology... |
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Dual Damascene Structure invention Dual damascene structure Abstract: A dual damascene structure and a method of forming a dual damascene structure are disclosed. |
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Via Plug Formation In Dual Damascene Process invention Via plug formation in dual damascene process |
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Direct fabrication of multi-tier structures in dielectric... Direct fabrication of multi-tier structures in dielectric materials for dual damascene processing |
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Dual Damascene: a ULSI wiring technology Dual Damascene: a ULSI wiring technology |
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) dual damascene interconnection |
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Electromigration characteristics in dual-damascene copper... Electromigration characteristics in dual-damascene copper interconnects by difference of via structures |
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Current Technical Trends: Dual Damascene & Low-k... Current Technical Trends: Dual Damascene & Low-k Dielectrics Jerry Healey President ? Threshold Systems ? 2002 by Threshold Systems Introduction As See IC Knowledge LLC Information |
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Sony Global - CX-NEWS Vol.33 Dual damascene copper wiring technology |
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BEOL with SFIL Grant Willson Departments of Chemistry and... Dual Damascene Process Overview Sematech's "Dual Top Hard Mask" Process # of process steps: 0 1 2 3 4 5 6 7 8 9 10 Expose Develop Photoresist BARC |
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Dr. Kuang-Jung Chen : SPIE.org Profile |