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  • Characterizing Fracture Surfaces with Dual EDS Detectors (.pdf)
    Performing EDS analysis on a specimen with rough surface such as a fracture surface can be difficult because of shadowing effects as shown in the schematic in figure 1. An additional complexity results from the surfaces significantly inclined towards the detector and from other surfaces sloping
  • Building a Car Just for Cops
    . It comes with several features that should reduce the driver's work load. These include a large touch-screen, voice-activated controls (with a manual back up), an automatic license-plate reader, night vision, and a radiation detector. In all, there will be 70 options from which local law-enforcement
  • Infrared Technology for Fail-To-Safe Hydrocarbon Gas Detection
    for measuring gas leaks so the measurement is expressed in terms of concentration times path length. The open path system incorporates many of the same advantages of the optical point detector and includes a dual range, ppm.m for small hydrocarbon leaks and LEL.m for more catastrophic leaks.
  • Optical Shaft Encoders
    Rotary and linear optical encoders are common in position and motion sensing. Here, a disc or plate containing opaque and transparent segments passes between an LED and detector to interrupt a light beam. All rotary encoders consist of a light source, light detector, code wheel, and signal
  • MICRO: Product Technology News (February 2001)
    . Resolution lens options of 1.0 and 2.0 um are offered, which are designed to meet the needs of simple and advanced ABS designs. A touch screen interface and customized hardware and software ease operation. The Model 761 ion chromatography unit combines an injection valve, serial dual-piston pump, column
  • Novel Method for Instantaneous, Quantitative Measurement of Molecular Mixing in Gaseous Flows
    fluorescence and phosphorescence signals, the instantaneous, quantitative measurements of molecularly mixed fluid fraction can be obtained at each pixel of the detector. This method accomplishes the same objectives as previous dual-tracer LIF methods, but with a single tracer and a much-reduced
  • MICRO:Product Technology News (Feb 99)
    resolution enhancement techniques such as advanced optical proximity correction and phase shift. The UV-wavelength-based system targets reticles used in making semiconductors with linewidths 0.18 um. Dual image-processing channels, an advanced CCD camera, and high-speed computing are standard features
  • MICRO: Products
    , while low reticle expenses lead to a low cost of ownership. The tool has dual side alignment (DSA) capability and uses direct vision technology. Based on a proprietary machine vision alignment system, direct vision incorporates an off-axis microscope, which is capable of viewing images on the back

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