Electron Optics

Description: Electron filtering and further enhanced electron optics

• Application: Biological / Life Science, Medical / Forensic, Metallurgical, Semiconductor Inspection
• Grade: Research
• Microscope Type: Scanning Electron Microscope (SEM)
• Digital Display: Yes

Description: of Welding Equipment Our manufacturing specialty is in the production of small-chamber, electron beam welding machines which feature high magnification optics, ultra-stable solid-state power supplies and rapid cycle time. We are the only high-energy beam welding job shop in the United States

• Materials: Aluminum, Copper, Steel - Stainless, Exotic Metals
• Services: Design Assistance, High Volume Production, Low to Mid Volume Production, Other
• Regional Preference: North America, United States Only, Southwest US Only

Description: The X-Beam? custom x-ray source is designed exclusively for use on electron microscopes. The compact design, and slide mounting allow very close coupling to the sample. Patented polycapillary optics focus x-ray excitation down to sample areas as small as 10µ. The X-Beam? is offered in 10

• Instrument Type: Other
• Technology: Radiographic / X-ray

Description: by: IEEE Circuits and Systems Society IEEE Electron Devices Society IEEE Lasers and Electro-Optics Society Publication Details: IEEE Circuits and Devices Magazine Persistent Link: http://ieeexplore.ieee.org/servlet/opac?punumber= 101 More »

Description: templates) and wafers, the SB3050 exposure tools are the ideal bridge to next generation technology nodes. Key Features 50keV high-resolution electron optics with 1nm writing/address grid 310x310mm stage travel range to ensure full 300mm wafer exposure capability High throughput achieved

Description: Features Front-access to the ion source, filaments, and ion optics make source cleaning and other maintenance procedures simple and fast Can run contemporary GC/MS methods with a scan speed of 10,000 u/second and data acquisition at 50 Hz Includes scan, SIM, and simultaneous scan/SIM

• Mass Analyzer Design: Quadrupole
• Ionization Method: Electron Impact Ionization (EI)
• Detector Type: Electron Multiplier Tube (EMT)
• Interfaces with a Gas Chromatograph (GC): Yes