Products & Services
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Supplier: CHINO Works America Inc.
Description: The equipment is PEFC type short stack evaluation test equipment consisted of gas supply line, moisturizing line, cooling line, cell performance line and safety line.
- Form: Test Station / System
- Functions / Module Types: Test Controller / Control Panel, Data Collection / IO, Electronic Load / Load Bank, Gas Supply Module, Monitor / Meter (Measure), Moisture / Humidity Module
- Energy Storage Products Tested: Fuel Cells
- Test Capability: I-V / Tafel Measurements, Performance / Functional Test, Resistance / Conductance
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Description: DESCRIPTION The Cleanliness and Residue Evaluation Test Board is designed to give the manufacturing process professional a tool to help assess the impact of cleanliness and residues on bare boards and finished assemblies, as well as a tool to assess the impact of changing manufacturing parameters
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Supplier: IHS ESDU
Description: ESDU TM 167 reports on an evaluation of the Mumeter Mk 6, a continuous friction measuring device. The memorandum briefly describes the device and provides an analysis of test data obtained at the test facility at Nantes at which six different surfaces, typical of aircraft runways found in Europe
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Description: Abstract First Page of the Article
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Supplier: SMC International
Description: Evaluation test for electrical rotatory machines. The EDA system is ideal for the evaluation and diagnosis of the insulation condition in electrical rotary machines such as motors, generators, alternators, etc. Its main function is to analyse the condition of the stator winding insulation, using
- Phase: Three Phase
- Form Factor: Rack Mount
- Test Parameters: Capacitance, Insulation Resistance
- Features: Graphic Results
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Supplier: Newark / element14
Description: Evaluation Kit; Kit Contents:SSC Communication Board, USB Cable, SSC Board ZMD31050, SSC Sensor Dummy, SSC Test Board, Software
- Category: Development Suite / Kit
- Features: Software Included
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Supplier: AvaLAN Wireless Systems, Inc.
Description: GHz band is the most globally accepted unlicensed portion of the RF spectrum. AvaLAN’s unique solution offers 29 non-overlapping channels and maximum legal power to provide five times the range of Wi-Fi through walls or line-of-sight. Get started with this Evaluation Kit that provides two
- Equipment Type: Other
- Network Protocol: Serial
- Form Factor: Printed Circuit Board (PCB)
- Wireless: Yes
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Supplier: Applied Image Inc.
Description: The Sinusoidal Array SINE M-6 contains the same gray scales and sinusoidal areas as the M-5 but is arranged in a shorter and wider format, making it particularly useful when the complete array is to be imaged at one time. The overall size of the array is 46mm by 70mm; centered on an 8.5 inch (215mm)
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Supplier: ARM Inc.
Description: The Keil MCBSTR7 Evaluation Board introduces you to the STMicroelectronics STR710 ARM family and allows you to create and test working programs for this advanced architecture. The Keil MCBSTR7 Evaluation Board connects to your PC using the serial port (for Flash download) or the JTAG interface
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Description: Ideal for the test and evaluation of dc power sources and power components
- Category / Application: Power Resistor
- Load Bank Type: DC
- Configuration: Portable
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Supplier: Microchip Technology, Inc.
Description: The MCP6H04 Evaluation Board is intended to support an instrumentation amplifier and show the capability of the MCP6H04 operational amplifier. It uses a quad op amp in a difference amplifier configuration with input buffers and voltage reference. The test points for the power supply, ground, input
- Category: Development Board
- Manufacturer: Microchip (PIC®)
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Supplier: Terra Universal, Inc.
Description: Repeatable environmental conditions for component burn-in, shelf life monitoring, package testing, light exposure and temperature evaluation studies Microprocessor PID controllers provide precise temperature and humidification
- Test Chamber Style: Benchtop / Instrument
- Test Parameters: Temperature
- Temperature Control: Heating, Cooling
- Features: Lights, Programmable, Shelves
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Supplier: Linx Technologies
Description: LT Series RF Transceiver Module Evaluation Kit Test the performance of LT Series transceiver modules against your own design with the LT Series evaluation kit. It comes with two evaluation boards for benchmarking and prototyping, each of which is populated with a transceiver and MT Series
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Supplier: Atmel Corporation
Description: This application note briefly describes how to set up and run the pre-flashed performance test application included with the Atmel® REB232ED evaluation kit.
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Supplier: American Water Works Association
Description: By Kerri, Kenneth D., Beard, James D. Jar tests are used to show the effectiveness of chemical treatment in a water treatment facility. They are also useful for evaluating new coagulants or polymers for use on a plant scale. This article presents jar test procedures for water treatment plant
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Supplier: Scantek, Inc.
Description: into "train cars" of user-defined length. Takt max measurements Infra-sound A and G weighted computations. User-defined integration time for Sound Level: Enables evaluation of reverberation time. Graphic and tabular output for ease of integration with reports.
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Supplier: OMEGA Engineering, Inc.
Description: User to Precisely Control Air Flow Rate Using the Included USB Cable to Connect to the Control Box • Large Test Chamber with a Hinged Access Door and Small Access Panel Allows for Fast Comparison Testing on Many Different Size Heat Sinks and Circuit Boards • Operates from 90 to 264 Vac
- Test Chamber Style: Benchtop / Instrument, Reach-In
- Test Parameters: Other
- Features: Programmable, Windows
- Type: Environmental Stability
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Supplier: SAE International
Description: of this specification is to provide airplane operators and tow vehicle manufacturers with: A. General design and operating requirements pertinent to test and evaluation of towbarless tow vehicles. Specific design requirements are provided in ARP4852A and ARP4853A. B. Test and evaluation requirements
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Supplier: International Society of Automation
Description: Approaches are provided in this recommended practice for the applicaiton of task analysis during the conceptual design, preliminary design, and detailed design phases, as well as the test and evaluation of new control rooms/systems and control room upgrade/development programs.
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Supplier: Restek
Description: Performance evaluation for essential oils and fragrance chemicals. System Suitability Mixture for GC systems and analytical columns. Convenient 0.5mL quantity for easy dilution to recommended working solution.
Find Suppliers by Category Top
Featured Products for Evaluation And Test Top
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ARM Inc.
MCB1200 Evaluation Board
The Keil MCB1200 Evaluation Board enables you to create and test working programs based on the NXP LPC1200 family of ARM Cortex ™-M0 processor-based devices. Features. 33MHz LPC1227FBD64/301 device ARM Cortex-M0 processor-based MCU in 64-pin LQFP. On-Chip Memory: 128KB Flash and 8KB RAM. Serial Interface. Potentiometer for ADC Input. Up to 55 GPIO. 8 User LEDs + power. 4 push-buttons (2 GPIO, ISP, & reset). Power via USB connector. Debug Interface Connectors. 10-pin Cortex debug (0.05... (read more)
Browse Electronic Development Boards Datasheets for ARM Inc. -
ARM Inc.
MCB1700 Evaluation Board
The MCB1700 Evaluation Board is available in two different configurations: The MCB1750 Evaluation Board is based on the NXP LPC1750 family and comes populated with an LPC1758. The MCB1760 Evaluation Board is based on the NXP LPC1760 family and comes populated with an LPC1768. Components Included. The MCB1700 Evaluation Board includes the following: MCB1700 Evaluation Board. MDK-ARM Evaluation Tools. MCB1700 Quick Start Guide. System Requirements. PC with one available USB port,. Windows 2000... (read more)
Browse Electronic Development Boards Datasheets for ARM Inc. -
Applied Image Inc.
Resolution Test Charts
APPLIED IMAGE is an internationally renowned leader in the design and manufacturing of STANDARD and CUSTOMIZED Image Evaluation TEST TARGETS & IMAGE ANALYSIS STANDARDS. With over twenty-five years of experience, APPLIED IMAGE has the knowledge and expertise to fulfill today's complex and demanding requirements. It's no wonder that such a large and vast array of industries depend on APPLIED IMAGE for their high quality test target and calibration solutions. The combination of APPLIED IMAGE's... (read more)
Browse Vision Calibration Targets Datasheets for Applied Image Inc. -
ARM Inc.
MCBSTM32F200 Evaluation Board
The Keil MCBSTM32F200 Evaluation Board enables you to create and test working programs based on the STMicroelectronics STM32 F2xx series of ARM Cortex ™-M3 processor-based devices. Features. 120MHz STM32F207IG ARM Cortex ™-M3 processor-based MCU in 176-pin BGA. On-Chip Memory: 1MB Flash & 128KB RAM. External Memory: 8MB NOR Flash, 512MB NAND Flash, 2MB SRAM, 8KB I2C EEPROM with NFC interface. 2.4 inch Color QVGA TFT LCD with resistive touchscreen. 10/100 Ethernet Port. USB 2.0... (read more)
Browse Electronic Development Boards Datasheets for ARM Inc. -
ARM Inc.
MCBSTM32F400 Evaluation Board
The Keil MCBSTM32F400 Evaluation Board enables you to create and test working programs based on the STMicroelectronics STM32 F4xx series of ARM Cortex ™-M4 processor-based devices. Features. 168MHz STM32F407IG ARM Cortex ™-M4 processor-based MCU in 176-pin BGA. On-Chip Memory: 1MB Flash & 192KB RAM. External Memory: 8MB NOR Flash, 512MB NAND Flash, 2MB SRAM, 8KB I2C EEPROM with NFC interface. 2.4 inch Color QVGA TFT LCD with resistive touchscreen. 10/100 Ethernet Port. USB 2.0... (read more)
Browse Electronic Development Boards Datasheets for ARM Inc. -
M+P Labs
Weld and Braze Evaluations
M+P Labs provides weld and braze evaluations, advises on welding/brazing techniques and materials, and performs operator qualification testing for test coupons and components for industries ranging from power generation and aerospace to the intricate needs of medical devices. Quality and Experience. At M+P Labs, our metallurgists have thorough knowledge of materials ranging from ductile irons to superalloys. This includes all grades of steels, stainless steels, and alloys of copper, aluminum... (read more)
Browse Material Testing Services Datasheets for M+P Labs -
Terra Universal, Inc.
Environmental Test Chambers
Repeatable environmental conditions for component burn-in, shelf life monitoring, package testing, light exposure and temperature evaluation studies. Microprocessor PID controllers provide precise temperature and humidification. Two chamber sizes available (10 cubic foot and 30 cubic foot). These chambers provide the ideal environment for a wide range of testing and evaluation studies in many industries. Their 304 stainless steel interiors are durable and easy to clean. Large chambers feature... (read more)
Browse Environmental Test Chambers and Rooms Datasheets for Terra Universal, Inc. -
M+P Labs
Expert Metallurgical Evaluation of Components
. Weld/braze/solder joint evaluation. Phase segregation and identification. Inclusion content. Corrosion susceptibility. Weldability evaluations. Failure Analysis: Our skilled metallurgists also utilize advanced analysis techniques such as Scanning Electron Microscopy (SEM) and our electron microprobe to obtain qualitative and quantitative information about the characteristics of a material or a failure. These tools are utilized to examine features such as fracture surfaces, pits, welds... (read more)
Browse Material Testing Services Datasheets for M+P Labs -
Fotronic Corporation / Test Equipment Depot
Electronic Test Equipment Repair Services
Tired of sending your broken equipment to outrageously expensive OEMs for repair? Frustrated with the long turn-around time of commercial Calibration labs?. Fotronic Corporation / Test Equipment Depot Specializes in the Repair of Hewlett Packard & Tektronix. Low $100 Minimum Evaluation Fee. Factory Trained Technicians. Fotronic Corporation / Test Equipment Depot Uses Only Genuine OEM Parts. Reasonable Labor Rates. All Service Guaranteed (read more)
Browse Test Equipment and Instrument Repair Services Datasheets for Fotronic Corporation / Test Equipment Depot -
ARM Inc.
STM32 Connectivity Line Evaluation Board
GPIO pins. Debug Interface Connectors. 20 pin JTAG (0.1 inch connector). 10 pin Cortex debug (0.05 inch connector). 20 pin Cortex debug + ETM Trace (0.05 inch connector). Ordering Information. The MCBSTM32C is available as a stand alone evaluation board or as a starter kit which includes the ULINK-ME USB-JTAG adapter. Part numbers are: MCBSTM32C: MCBSTM32C. MCBSTM32CUME: MCBSTM32C starter kit. Evaluation Software. The MCBSTM32C Evaluation Board and Starter Kit include the MDK-ARM Evaluation Tools... (read more)
Browse Electronic Development Boards Datasheets for ARM Inc. -
Global Testing Services, Inc.
Common Coating & Finish Durability Test Specs
for Evaluating Degree of Rusting on Painted Steel Surfaces. ASTM D714- Standard Test Method for Evaluating Degree of Blistering of Paints. ASTM D1654- Standard Test Method for Evaluation of Painted or Coated Specimens Subjected to Corrosive Environments. ASTM D1709- Standard Test Methods for Impact Resistance of Plastic Film by the Free-Falling Dart Method. ASTM D3359- Standard Test Methods for Measuring Adhesion by Tape Test. ASTM D3363- Film Hardness by Pencil Test. ASTM D4060- Abrasion Resistance... (read more)
Browse Product and Component Testing Services Datasheets for Global Testing Services, Inc. -
Euchner-U.S.A., Inc.
Non-Contact Safety System Evaluation Unit
EUCHNER CES-AR Category 4, Non-Contact Safety System Evaluation Unit provides central evaluation of up to 12 switches in a chain with individual status outputs for each unit. Downstream parts of the safety circuit can be monitored using a feedback loop. The evaluation unit is good for Category 4 PLe according to EN ISO 13849-1. These systems are designed for use in areas where a high level of tamper resistance and safety is required and feature an inductive RFID read head, evaluation unit... (read more)
Browse Noncontact Safety Interlock Switches Datasheets for Euchner-U.S.A., Inc. -
Texas Instruments Digital Signal Processors & ARM Microprocessors
C6657 Low Cost Multicore Evaluation Module
At $399, the TMS320C6657LS Evaluation Module (EVM) is an easy-to-use, cost-efficient development tool that helps developers quickly get started with designs using the C6657 or C6655 or C6654 family of KeyStone DSPs. The EVMs includes an on-board, single C6657 processor with robust connectivity options that allows customers to use this AMC form factor card in various systems. It also works as a standalone board. The software accompanying the 6657LS EVM includes the Code Composer Studio &trade... (read more)
Browse Digital Signal Processors (DSP) Datasheets for Texas Instruments Digital Signal Processors & ARM Microprocessors -
Applied Image Inc.
Sinusoidal MTF Optical Test Chart
Over twenty years ago, Dr. Robert Lamberts founded SINE Patterns on a single concept - to provide a new and better test array pattern for optical evaluations. After extensive research, Dr. Lamberts developed the first Sinusoidal Target Array Pattern, for which he later received a US Patent. Since then, SINE Patterns has expanded its product line to provide Sinusoidal Target Arrays for a variety of applications; from moiré contouring to reliable MTF evaluation of materials, lenses, cameras... (read more)
Browse Calibration and Reference Standards Datasheets for Applied Image Inc. -
SMC International
Circuit Breaker Analyzer PME-500-TR
by the built-in thermal printer, saved in flash memory for future reutilization and downloaded later on to a personal computer for archiving and export to various data interchange formats. APPLICATIONS. Open- and Close-time measurement in main and auxiliary contacts. Graphical and numerical evaluation of coil currents. Three-phase, 4-wire measurement of contact resistance. Substation's auxiliary DC supply condition evaluation. CHARACTERISTICS. 5 time measurement inputs. Programmable test sequences: C, O... (read more)
Browse Circuit Breaker Test Equipment Datasheets for SMC International
Conduct Research Top
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Evaluation of starch hydrolysing enzymes
). Canadian Standard Freeness test, a Vacuum Drainage Evaluation test and a revised Schopper Reigler Drainage Evaluation test was used to quantify the changes in drainage. Further evaluation of drainage improvement was done with a pilot scale paper machine. Enzyme treatments at high consistency (20 %
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Tests for Thermoplastic Materials Used in the Electrical and Electronic Industries (.pdf)
. Classifications. Aviation regulatory flame tests. 26. Flammability test for automotive materials mm/min. 27. "M" classification for construction and transportation. 28. "I / F" classification for transportation. 29. "PT", "GPT", "GET" classification. 30. Corrosion tests. Electrolytic corrosion. 32
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IR Characterization of Bi-Propellant Reaction Control Engines During Auxiliary Propulsion Systems Tests at NASA's White Sands Test Facility In Las Cruces, New Mexico
, personnel secured the FLIR camera equipment and validated its operation prior. to engine tests. Cold-flow Tests 35-40 were recorded along with the first hot-fire Test 101. Figures 3 & 4 are. representative of the imagery generated by the FLIR Systems camera during this day. Further detailed. evaluation
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Laboratory and Field Evaluations of a New Silica Dispersant
Based on molecular modeling studies, new polymers were designed to maximize the interaction energies between polymer molecule and the crystalline surfaces of silica and magnesium silicate. One of these newlydesigned polymers has been further developed for laboratory and field evaluations
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Fused Depostion Modeling: A Technology Evaluation
(FDM) is presented from the user's point of view. When included in an evaluation, FDM can make selection even more difficult. This is true for two reasons. First, FDM brings forth a new set of evaluation criteria since the technology has a different parameter set than many of the other RP
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Production Line Tests for Medical Product Safety Evaluation
production line safety tests commonly required on medical devices. The first and most prevalent test is the Dielectric Voltage Withstand Test, commonly known as a "hipot" test. Hipot testing is the deliberate application of high voltage between current carrying and non-current carrying components
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Weathering Test Methods
Organizing the scope of weathering test methods into logical order helps the engineer visualize tools available for weathering tests. One order organizes exposures showing those with slowest rate of degradation on one extreme through the exposures showing the fastest rates of degradation
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Tamper-evident Ring Test
. Metatarsophalangeal Joint Tester. Job Task Evaluation. Ergonomics & Occupational Therapy. Medical Devices. Case studies. End Float Test of Inhaler Cap. Metatarsophalangeal Joint Tester. Needle Pull-out Test. Medical Guidewire Break Strength Test. Syringe Pump Calibrator. Medical Suture Device Calibration
Engineering Web Search: Evaluation And Test Top
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The United States Army Test and Evaluation Command
Test & Evaluation Locations Capabilities
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The United States Army Aberdeen Test Center
Col Gordon Graham is the Commander of the U.S. Army Aberdeen Test Center, U.S. Army Test and Evaluation Command at Aberdeen Proving Ground, Md.
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Air Force Operational Test and Evaluation Center - Home
Air Force Operational Test and Evaluation Center - Home
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International Test and Evaluation Association in Fairfax, VA
Certified Test and Evaluation Professional (CTEP) Examination Sessions April 3, 2013 ~ Las Cruces, New Mexico April 17, 2013 ~ Fairfax, Virginia May
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Use of Miniature Specimen Test and Finite Element Method for...
Use of Miniature Specimen Test and Finite Element Method for Evaluation of Yield Strength and Fracture Toughness in Metallic Alloys Reddy, K.
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ASTM D6838 - 04(2010) Standard Test Method for Cummins M11...
D86 Test Method for Distillation of Petroleum Products at Atmospheric Pressure D92 Test Method for Flash and Fire Points by Cleveland Open Cup Tester
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Computer Vision Test Images
Digital Embryos - Digital embryos are novel objects which may be used to develop and test object recognition systems.
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International Test Conference
International Test Conference 2013 - The annual meeting of the electronics test industry at the Disneyland Hotel, Anaheim CA - September 8-13, 2013