|
|
||
Welcome to GlobalSpec!
Find parts, products, suppliers, datasheets, and more for:
Fast Scan Rate Instrument
Find Suppliers by Category
Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
Search by Specification |
Learn More
-
Supplier: JTAG Technologies Inc.Description: Rugged, dependable, fast: boundary-scan controllers All of our hardware controllers are designed by us and built to our specifications in an ISO9000-certified factory. (And all are fully tested with boundary-scan.) Our controllers have amassed an excellent record of reliability
-
Supplier: BRL Test, Inc.Description: 10.4" touch screen make the WaveRunner 104MXi a truly unique oscilloscope. With a maximum sampling rate of 10 GS/s (5 GS/s per channel) you can be confident in all your measurements knowing that even the fastest signals in your device are being captured. High sample rate is important for fast signals
-
Supplier: Endress+Hauser, Inc.Description: Visual: 7" TFT display as onsite display for optimum readability Fast: 100 msec scan rate for all channels, high-speed memory cycle 100 msec for up to 8 channels Secure: Security package with person-specific access authorization and electronic signature (FDA 21 CFR 11) Modular: Easy
- Data Acquisition Device Type: Datalogger / Recorder
- Form Factor: Panel / Chassis Mount, Stand Alone
- Isolation: Channel-to-Channel Isolation
- DC Voltage Input: Yes
-
Supplier: Olympus IMSDescription: induced laminations and easily differentiates these anomalies from loss of wall thickness. Using phased array ultrasound technology, the HydroFORM offers high resolution and fast coverage. The HydroFORM has a 60 mm wide effective beam and can scan at a speed up to 100 mm/s. In the current market
- Instrument Type: Flaw Detectors
- Technology: Ultrasonic
- Form Factor: Portable / Hand Held / Mobile
- Flaw Detection / Inspection Area: Coating Flaw / Holiday, General Corrosion Detection
-
Supplier: A Bar Code Business, Inc.Description: - Versatile decode capability enables devices to realize a high first-time read rate for improved productivity Bright 650 nm laser diode - Scan line is easy to see Software controlled or manual triggering - Offers flexible control for unattended or hands-free applications Compact durable housing
-
Supplier: BRL Test, Inc.Description: oscillator duty in radar/EW testing, narrowband device characterization, and communication systems testing. The 114XA family features simultaneous and independent amplitude, frequency and pulse modulation capabilities. AM up to 90% at rates from DC to 100 KHz make the 114XA ideal for antenna scan
-
Supplier: PixeLINKDescription: Graphical User Interface (GUI) for fast and easy application development. The SDK also includes wrappers for National Instruments LabVIEW.
- Monochrome / Color: Color
- Imaging Technology / Camera Type: CMOS
- Specialty Camera Type: Machine Vision Sensor, High Speed
- Application / Industry: Industrial
-
Supplier: Aurora InstrumentsDescription: Key Features: Standard configuration includes: TRACE AI1300 Flame TRACE AI1300 Flame/Graphite Furnace (GF) TRACE AI1300 F/GF/Vapour Generation (VG) Switchable single/true double beam optics Auto-switch Six (6) lamp turret with auto-switch Fast wavelength scan Multi-element
-
Supplier: Softchoice CorporationDescription: The Gryphon D200 ESD barcode reader has been developed by Datalogic in order to satisfy the strict requirements of EPA (ESD Protected Area). ESD is a phenomenon that occurs when an object has an imbalance in its electric charge: a fast charge transfer between objects with different electrostatic
Featured Products for Fast Scan Rate Instrument Top
-
The ADS1258 is a 16-channel (multiplexed), low-noise, 24-bit, delta-sigma ADC that provides single-cycle settled data at channel scan rates from 1.8k to 23.7kSPS per channel. A flexible input multiplexer accepts combinations of eight differential or 16 single-ended inputs. • 24 Bits, No Missing Codes. • Fixed-Channel Data Rate: 125kSPS. • Auto-Scan Data Rate: 23.7kSPS/Channel. • 16 Single-Ended or 8 Differential Inputs. Order a Sample Now (read more)Browse Analog-to-Digital Converter (ADC) Chips Datasheets for Texas Instruments High-Performance Analog -
configuration only has to take place once. A free software configuration utility provided with the device makes the process easy and intuitive. The SLX200 supports two analog scan modes: one for general purpose signal monitoring with running average, maximum, and minimum values available for each analog input; the other, used to obtain data with highly accurate time correlation between samples, provides user-configurable scan parameters such as scan list, scan rate, and scan count. Other powerful firmware... (read more)Browse Data Acquisition Systems and Instruments Datasheets for Dataforth Corporation
-
and provide DB25 ports for alternate connection of two 7B or 8B signal conditioning module racks supporting nearly 100 additional input types. Maximum scan rates of over 1KHz are achievable. Dual-format data registers support both 16-bit signed and 32-bit floating point formats. IEEE-754 32-bit floating point scaling registers are configurable on a per-channel basis. Numerous features help increase reliability, improve performance, and protect from harsh industrial environments. Dual network... (read more)Browse I/O Modules and Instruments Datasheets for Acromag, Inc.
-
conditions or demanding production environments. THE HEAVY-DUTY LIGHTWEIGHT. Although small in size, the EPOCH LT offers many of the performance features you'd normally expect to find in bulkier flaw detectors. In addition to its fast 60 Hz update rate, the EPOCH LT has a Display Freeze Mode that holds waveform soundpath data, Peak Memory that simultaneously displays live waveform and peak envelope of A-scan, RF display mode, selectable threshold positive/negative or minimum depth Alarm Modes... (read more)Browse Flaw Detectors Datasheets for Olympus IMS
-
Program provides advanced standard features such as a live screen capture mode, color selection palette, high-speed data transfer and database backup/restore. This program is fully compatible with the EPOCH 4/4B, and can receive files from the EPOCH III/IIIB. STANDARD FEATURES: • Customizable narrowband filtering. • Selectable, tunable square wave. • Negative spike excitation pulser. • Light, ergonomically designed (5.7 lbs/2.6 kg). • Fast, minimum 60Hz adjustable... (read more)Browse Flaw Detectors Datasheets for Olympus IMS
-
The ADS1258 is a 16-channel (multiplexed), low-noise, 24-bit, delta-sigma ADC that provides single-cycle settled data at channel scan rates from 1.8k to 23.7kSPS per channel. A flexible input multiplexer accepts combinations of eight differential or 16 single-ended inputs. • 24 Bits, No Missing Codes. • Fixed-Channel Data Rate: 125kSPS. • Auto-Scan Data Rate: 23.7kSPS/Channel. • 16 Single-Ended or 8 Differential Inputs. Order a Sample Now (read more)Browse Analog-to-Digital Converter (ADC) Chips Datasheets for Texas Instruments High-Performance Analog
-
Pressure decay testing instruments are extremely useful for checking components that have relatively small volumes. The component is pressurized with air and the pressure transducer monitors the pressure for negative changes. Any pressure drop indicates a leak. The test is very fast, a matter of seconds, and is therefore popular in high-volume industries such as automotive components, castings, medical devices and consumer goods. Uson offers the following products for pressure decay testing... (read more)Browse Nondestructive Testing (NDT) Equipment Datasheets for Uson, L.P.
-
Scan/Zoom - ITI's Scan/Zoom option combines the features of a variable Axial Scan with the. features of a variable FOV (Zoom). Scan in low power for overall coverage, zoom to high power for high-resolution detail examination. This unique dual-capability offers the best of the best all in one superior borescope. (read more)Browse Videoscopes Datasheets for Instrument Technology, Inc.
-
The EZ Scan is one of the smallest and most durable single axis B-Scan scanners on the market today. The EZ-Scan can scan circumferentially on pipe diameters of 3" and great and up to temperatures of 500 degrees F. The Scanner comes standard with a spring loaded 3/8" dual element 5MHz transducer capable of high temperature applications. The scanner is very small and light weight (10oz.) and can fit into your hand thus making it very portable. The scanner has magnetic wheels and has... (read more)Browse Ultrasonic Instruments Datasheets for Danatronics Corporation
-
and orientation of cracks, flaws, corrosion/erosion, delamination, and internal anomalies in a variety of structures, materials and surfaces. The Pocket UT ™ can operate as a conventional thickness meter (for spot readings), a basic flaw detector with RF display and alarm gates, or in either active B-Scan or full C-Scan modes. The system has a bright, back-lit LCD color touchscreen and an easy-to-use keypad for fast entry of common commands and data. Weighing approximately 2 lbs. (.9 kg... (read more)Browse Ultrasonic Instruments Datasheets for MISTRAS NDT
Conduct Research Top
-
Fluctuating scan rates no problem for chip imager
Rosenberg, director of engineering at the Beam Control Group of FEI Co., the Hillsboro, Oreg., maker of DualBeam machines. The machine's image acquisition must also reliably handle scan (pixel) rates which fluctuate from slow (100m sec) to fast (100 nsec) within each application. This happens
-
Object Discrimination and Optical Performance Of a Real-Time 2-5 µm Hyperspectral Imager
system, with a prismatic. dispersion element, passive athermalization, and a compact dewar (see Figure 2). The slit-based system. produces an image in one direction and spectral bands in the direction orthogonal to the slit. A scan mirror. translates the image across the slit to provide a full frame
-
High Accuracy Temperature Measurement
. incorporate a high-precision CJC mechanism, significant. Furthermore, because this is a global setting, all channels. thermal mass, careful placement of parts that generate. in the system must scan at the reduced rate, even if only. internal temperature gradients, and self-calibration. one channel requires
-
MICRO: Failure Analysis
. The image is formed by mapping some signal intensity synchronously with the scan. As in TEM, image information is extracted from electrons that are transmitted through a thin sample. STEM has many of the advantages of SEM: TV rate imaging, very-low-magnification (wide-field) imaging, and easy electronic
-
Product Technology News
levels in parts per million or parts per billion. An on-board data logger automatically stores results. The instrument can operate in a quick-scan mode for screening total VOC content in ambient air or in a point-and-press mode for collecting data on preselected compounds. Cassette Tester Sun West
-
MICRO:Product Technology News (Oct. '98, p.110)
fluoride elements for partial achromatization. To achieve 150-nm resolution, the step-and-scan system has an argon fluoride laser source as well as a Zeiss Aerial II illuminator with high-transmission calcium fluoride and aspherical optical elements. The 193-nm wide-field system is suitable
-
Examining purification and certification strategies for high-purity C 2 F 6 process gas
5900 UHP (Ametek, Feasterville, PA) was used for the oscillating crystal technology method because of its fast response time to changes in the moisture level and its low limits of detection.1 The 5900 UHP has been found to have a much faster response time (15 minutes to reach 95% of the change
-
MICRO: Product Tech News
. The tool can be supplied as a turnkey unit or as an OEM measurement probe for existing equipment or in-process applications. It features a flexible extended scan range from 50 to 2000 um with resolutions from 0.03 to 1.0 um. Range and resolution can be altered by exchanging a standard microscope
Engineering Web Search: Fast Scan Rate Instrument Top
-
Raster scan - Wikipedia, the free encyclopedia
Raster-scan display sample A raster scan, or raster scanning, is the rectangular pattern of image capture and reconstruction in television.
-
Magnetic resonance imaging - Wikipedia, the free encyclopedia
Information about the origin of the signal in 3D space can be learned by applying additional magnetic fields during the scan.
-
The P78-1 Satellite
This yields an instrument duty cycle of 25-30%. Telemetry data were obtained for about 40-50% of the orbits, yielding a net data return of 10-15%.
-
NASA's Explorer Missions
As of this writing, Explorers 50 (IMP 8), 67-74 and 77-78 (EUVE, SAMPEX, RXTE, FAST, ACE, SNOE, TRACE, SWAS, FUSE, and IMAGE) are still operating.
- Network Monitoring Tools
-
ePanorama.net - electronics, audio, video, circuits and...
Measuring instrument interfaces Oscilloscopes Using PC as a measurement instrument Transmission line measurements
-
ePanorama.net - electronics, audio, video, circuits and...
Activa Inc. - Industrial AC/DC Compact Cooling Fans Rate this link
-
ERS-1 Satellite Concept
Payload consisting of an Active Microwave Instrument comprising a SAR (image and wave modes) and a Wind Scatterometer; a Radar Altimeter; an Along
