Our Sites: GlobalSpec.com | GlobalSpec Electronics | CR4
Welcome to GlobalSpec!
Find parts, products, suppliers, datasheets, and more for:

Fast Scan Rate Measurement

 

Find Suppliers by Category

Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
Search by Specification | Learn More

Conduct Research Top

  • High Accuracy Temperature Measurement
    response. Many styles. Low stability. Thermistor. Extremely fast. Non-linear. Moderately stable. Fragile. High output level. Narrow temperature range. Resistance measurement. External current source required. Small size. Inherently self heating. RTD. Extremely accurate. Slow response. Extremely
  • The Accurate Measurement of Biological Effective Ultraviolet Radiation
    most of the biologic effects are sensitive to the accumulated dose (as opposed to the threshold) the instrument must. provide continuous measurement or sampling rate fast enough in relation to the rate of irradiance changes. The stability is a major factor. Many observed or expected biologic effects
  • Interface for Laser Scanning Microscope
    time. If they cannot, they may miss a scan line-meaning that the resultant image would be missing lines-and this is unacceptable. For this solution, we will need to take advantage of the faster transfer rates possible on the PCI Bus. The total time to capture was already calculated above. The time
  • Automated Low Cost 3D Scanning
    of multiple scan heads controlled by one PC f lti l h d t ll d b • Fast 3D data capture © 2010 Connecticut Center for Advanced Technology Inc. All rights reserved. Data Alignment One scanner • Manual feature alignment • Motion control alignment • Photogrammetric dots Multiple scanners • Geometric
  • MICRO:Improving the results of post-CMP
    variation in polish rate behavior while also providing an areally averaged measurement. By collapsing the two-dimensional data onto a line and considering the points as a function of radius, a line scan also can be generated, providing added information about the azimuthal variation. Experimental Methods
  • Use of a PC-Based Digitizer in an Ultrasonic Flaw-Detection System
    the fast-axis take (500 mm / 0.1 mm) / 1 kHz = 5 seconds. Initiation of the. next fast-axis scan is under programmatic control. However, for mechanical reasons,. repositioning of the slow-axis motor must take at least 0.5 seconds. The 14-bit digitizer is capable of transferring data through the PCI bus
  • Object Discrimination and Optical Performance Of a Real-Time 2-5 µm Hyperspectral Imager
    system, with a prismatic. dispersion element, passive athermalization, and a compact dewar (see Figure 2). The slit-based system. produces an image in one direction and spectral bands in the direction orthogonal to the slit. A scan mirror. translates the image across the slit to provide a full frame
  • MICRO: Defect/Yield Analysis
    across surfaces, the need to vibrate the probe and adjust the backing potential results in limited data acquisition rates that are not compatible with fast-cycle-time, high-resolution imaging applications. Nonvibrating CPD Probe. The nonvibrating contact potential difference (nvCPD) measurement

Engineering Web Search: Fast Scan Rate Measurement Top