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  • Smart Gate Drive Optocoupler with Integrated Flyback Controller
    The new ACPL-302J is a smart gate drive optocoupler that improves isolated power supply and simpli fies gate drive design. The ACPL-302J features an integrated flyback controller for DC-DC converters and a full set of fail-safe IGBT diagnostics, protection, and fault reporting, providing a complete
  • Medical Device Link .
    equipment using embedded controllers is especially affected. Although embedded controllers usually have alarms, these systems are often troubled by ineffective fault-reporting subsystems. In addition, manufacturers designing equipment using embedded controllers may not have prior experience
  • Battery Impedance Monitoring...An Added Dimension (.pdf)
    coupled with quality software, a personal computer and a phone line, provide the predictive capability once enjoyed by manual surveillance techniques. The duty of these validation systems goes beyond reporting a failure but must include warning and alarm capability for impending battery system
  • Trends in circuit protection
    Circuit breakers now sport advanced features that include remote control and operational status reporting. Electronic circuit breakers like this ESS20 model from E-T-A Circuit Breakers feature selectable current settings and internal diagnostics for fault and status indications. The E-1048
  • Filling machine turns up the juice
    collection and reporting. All this comes in a modular-rack system that requires only a 4 X 17-in. footprint. Software from Mitsubishi Electric, called the Q Series, synthesizes many mechanical operations. It lets designers build "virtual " mechanical devices such as shafts, differential gears
  • Hybrids
    to the microprocessor. A typical application for a full-featured power IC is in automotive multiplexing, where distributed smart-power modules can control lights, windows, seats, and air conditioning, reporting to microcontrollers over a two-wire bus. More than a
  • STEM System
    and generating alarms and e-mail messages. The system incorporates sensor-level fault detection and classification as well as data reporting and searching capabilities. It also compares wafer-to-wafer, chamber-to-chamber, and tool-to-tool data. The unit includes a process-specific RGA, a tool

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