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Film Measurement
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Supplier: StellarNet, Inc.Description: ; spectrometer software and development kit, and is available at an extremely low price! Couple this with StellarNet’s Thin Film Measurement System and have full functionality for measuring thickness and index of both single-layer and multilayer films!
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Supplier: GENEQ, inc.Description: the thickness. If the volume to solids ratio of the coating is known, then the wet film thickness can be used to predict the dry film measurement. Various measurement ranges from 0 to 25μm - 0 to 3000μm (0 to 1mil - 0 to 40mils) are available Continuous Scale results in ±5% measurement
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Description: switch settings: A-weighting - as required in standard measurements. Linear - to let the microphone signal pass unfiltered. High-pass - to cut off unwanted low frequencies. The frequency responses of the A-weighting filter is shown in Fig.1. Its small ceramic thick-film substrate has a very
- Nominal Diameter: 1/2"
- Features: Integral Pre-amplifier
- Polarization: Prepolarized Electret
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Supplier: Tekscan, Inc.Description: and pressure distribution. Features & Benefits of Prescale Film Affordable and easy to use One-time use Static pressure measurement Peak pressure snapshot
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Supplier: BEMISDescription: Bemis adhesive films allow for re-positioning in those occasionally necessary re-work situations. In addition to the above characteristics, they are also environmentally friendly and made without volatile organic compounds (VOC's). Once an adhesive film has been selected to bond your specific
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Supplier: Dexter Research Center, Inc.Description: Features: A thin film-based thermopile with a 1.0mm diameter active area with good signal-to-noise ratio in a TO-5 package and a moderate time constant of 32ms with Argon encapsulation gas. Applications: Excellent for non-contact temperature measurement. Benefit: Small active area with good
- Sensor Type: Noncontact Infrared Temperature Sensor
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Supplier: Edmund Optics Inc.Description: , photolithography, thin film measurement, semiconductor inspection, and laser etching.
- Lens Type: Objective Lens
- Optical Type / Correction Factor: Specialty / Other
- Features: UV / NUV
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Supplier: Spectrum Instruments Ltd.Description: For Parallel measurement of rolls and stands in numerous applications. Up to 150 rolls or other objects can be measured. Any chosen object or the baseline can be used as a reference. You can also use the system to measure level, straightness, square, pumb and flatness. Typical applications
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Supplier: Duncan Instruments Canada, Ltd.Description: Features Humidity measurement used a high precision thin-film capacitance sensor for fast response & not depend on air movement past the probe. Temperature measurement used type k thermocouple sensor, fast response. Separate humidity & temp. probe, allows user to take measurements
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Description: Utilizes thin film capacitance sensor for accurate humidity measurements over a 10 to 95.0% range Semiconductor sensor for temperature measurements of -20 to 60°C and -4 to 140°F Accuracies of ±3% RH, ±0.8°C, ±1.5°F Fast response in less than 3 minutes
- Variables Measured: Relative Humidity, Temperature
- Form Factor: Meter / Indicator
- Display: Digital Readouts
- Technology: Capacitive
Featured Products for Film Measurement Top
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models are available to suit your thin film and/or optical measurement requirements. Applications include Thin-Film Photovoltaics, semiconductors, polymer films, flat panel displays, optics, ophthalmic lens coatings, parylene coatings, and hardcoat measurements. (read more)Browse Wafer and Thin Film Instrumentation Datasheets for StellarNet, Inc. -
CHRocodile IT 18 - 3000Application: thickness measurement of wafer, PET-bottles and plastic foils. The new optical sensor for thickness measurement from Precitec Optronik is the CHRocodile IT 18 - 3000.The CHRocodile IT 18 - 3000 covers the largest measuring range in the IT series of proven and highly precise CHRocodile sensors. The measuring range in air extends between 18 - 3000 µm. This corresponds to a measuring range of 5 - 800 µm in silicon (refractive index n ≈ 3.6). For film... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for Precitec, Inc.
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The Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are used... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
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Semi-Automated Wafer Measurement System for Semiconducting and Semi-Insulating Material. The ProformaTM 200SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 75 to 200 mm. wafers, the 200SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 200SA delivers full wafer surface... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
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Use a single spectrometer and interchange sampling accessories to allow for multiple measurements and expanded functionality!. UV-VIS-NIR - expand your range 190nm-2300nm. Transmission - test lenses, filters and more!. Absorbance - kinetics, fluorescence, concentration. Color - measure solids, powders, liquid & textiles. Light & LED - integrating spheres. Thin Film - measure thickness at a low cost. Chemometrics - multivariate analysis. Check out our online catalog for a complete list... (read more)Browse Spectrometers Datasheets for StellarNet, Inc.
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giving the ability to measure more than one component in the film sample. The advantage of such a filter-based spectrometer is there are no moving parts making it a compact, rugged, portable analyzer with a simplified PC interface that is easy for non-technical personnel to operate on-site or in a lab - at a cost less than most other analytical measurement techniques. For further information on the InfraCal Filtometer and InfraSpec Spectrometer for flexible film measurements, please contact: Wilks... (read more)Browse Infrared Spectrometers Datasheets for Wilks Enterprise, Inc.
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surface, on which an embossed dot is seen as a protrusion. The slow emulsion has a glossy surface, on which the embossed dot appears as a depression. Key Applications: Key applications are the detection, measurement, and monitoring of the radiation dose to radiation personnel and anyone else (visitors) in the vicinity of a radiation source. KODAK Personal Monitoring Film is widely used by both medical and industrial radiation personnel for film badge dosimetry. (read more)Browse TLD and Film Badges Datasheets for Carestream, Inc./Kodak Industrex Products
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Vdc output, for field applications. Optional integrated temperature measurement (PT100 RTD). Ideal for applications including irrigation, food & beverage, waste water, water. distribution, level & depth, bore hole, offshore and R &D. Intrinsically Safe Submersible Liquid Level Transmitters for Hazardous Locations. Accuracy to ±0.25% Full Scale (Best Fit Straight Line); ±0.125% Full Scale for 4 psi & above only. Advanced diffused semi-conductor & sputtered thin film sensor... (read more)Browse Level Transmitters Datasheets for NOSHOK, Inc.
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RTI Electronics, founded in 1972, is a leading manufacturer of passive electronic components including thermistors, film capacitors, magnetic transformers and inductors, and audio power conditioning units. RTI Electronics offers value-added and application specific components as well as custom design of all of its products to meet your needs. RTI Electronics acquired its magnetic transformer and inductor business in 2005 from Amecon Magnetics, and it also acquired Running Springs Audio in 2007... (read more)Browse Thermistors Datasheets for RTI Electronics
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of the instruments described extend from fractions of a millibar to 105 x atmospheric pressure, with greatly varying demands on precision. As for temperature measurements, the book describes methods for measuring the entire range from just above absolute zero to several thousand degrees Fahrenheit. In addition to describing the actual measurement methods and equipment the reader will also find detailed information about the physical fundamentals of pressure and temperature metrology, measurement transducers... (read more)Browse Pressure Instruments Datasheets for WIKA Instrument Corporation
Parts by Number for Film Measurement Top
| Partb # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| 0-1005447-1 | National Microchip | Measurement Specialties Inc/Schaevitz | Not Provided | SENSOR PIEZO FILM VIBRA MASS |
| 0-1004308-0 | National Microchip | Measurement Specialties Inc/Schaevitz | Not Provided | SENSOR PIEZO FILM DESIGN KIT |
| 1-1004346-0 | Digi-Key | Measurement Specialties Inc/Schaevitz | Sensors, Transducers | 28 UM PIEZO FILM SHEET |
| 2HB37 | Grainger Industrial Supply | MITUTOYO AMERICA CORP. | Thickness Gages | Dial Thickness Gage, Graduations 0.001 In, Range 0-0.4 In, Throat Depth 1.18 In, Contact Dia 0.4 In, Contact Type Flat, Accuracy +/-0.001 In, For Quick Measurement of Paper, Film, Sheet and Flat Stock |
| 2HB39 | Grainger Industrial Supply | MITUTOYO AMERICA CORP. | Thickness Gages | Dial Thickness Gage, Graduations 0.0001 In, Range 0-0.050 In, Throat Depth 1.18 In, Contact Dia 0.4 In, Contact Type Flat, Accuracy +/-0.0001 In, For Quick Measurement of Paper, Film, Sheet and Flat Stock |
Conduct Research Top
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Flexible Film Analysis
There are many areas in flexible film production that canbenefit from a rapid onsite measurement that the InfraSpec VFA-IR Spectrometer offers. Examples include determining which side is which on multilayer films to be laminated, checking rolls of film in the warehouse, measuring an individual
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Quality Control of Sound on Film
frequency. Gage Applied ::. Data acquisition, test & measurement, digital oscilloscope. print this. email this. Need a Solution?. GaGe application engineers can provide the answer. Contact Us | About Us | Site Map. Case Studies. Quality Control of Sound on Film. In performing quality control
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Latest experiences of film coating
LATEST EXPERIENCES OF FILM COATING AND INTRODUCTION OF A NEW CONTACTLESS OPTISPRAY COATING METHOD Metso Paper Inc., Coaters and Reels, Wartsilankatu 100, 04400 Jarvenpaa, Finland coating, MSP, layout, C2S, 2C1S, runnability, misting, web stealing, base paper, coating coverage, spray coating, paper
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Microstructural Characterization of Thin Film Photovoltaics using Electron Backscatter Diffraction (.pdf)
the. separation and col ection. and recombination behavior. of both majority and minority. carriers, with holes flowing in Figure 1 - Work function measurements on CGS film using Kelvin Probe Force. one direction through the Microscopy (red). The surface photovoltage (SPV) distribution is also shown
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Temperature Compensated Bulk Acoustic Thin Film Resonators
on hermetic packaging, temperature cycle testing, temperature coefficient measurements, and preliminary ageing. Thin film resonators may be composed of materials fabricated by methods that do not result in perfect crystal forms. Consequently the materials do not necessarily have properties that closely
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Thin-Film Sputtering Deposition Strain Sensors
Many applications use a manufacturing process known as thin-film sputtering deposition. The typical sputtering process uses an ion beam to impact the surface of a sputter material such as gold, silver, or other metal or metallic oxide. In so doing, some of the sputter-material atoms get knocked
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Optical Film Enhancements of LCDs, OLEDS and Plasma Displays
For those cases which do not require the ruggedization provided by bonded glass panels, General DigitalTM Optical Bonding LaboratoriesTM recommends the use of GenGardTM film enhancements. GenGardTM films improve the readability of electronic displays by reducing the reflection of ambient lighting
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Piezoelectric Film Properties
C:\...\PART1-INT.wp [PFP#781333969] 06'40'6'45+10. #46E1(EL. ,QWURGXFWLRQ. %DFNJURXQG. 3LH]RHOHFWULF)LOP3URSHUWLHV. 7DEOH7\SLFDOSURSHUWLHVRISLH]RILOP. 7DEOH&RPSDULVRQRISLH]RHOHFWULFPDWHULDOV. 2SHUDWLQJ3URSHUWLHVIRUD7\SLFDO3LH]R)LOP(OHPHQW. Piezo Film Sensors Technical Manual. Internet Version
Engineering Web Search: Film Measurement Top
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Thin Film Thickness Measurement Systems by Filmetrics
Thin-Film Thickness Measurement Measure Film Thickness in Seconds F20 Thin-Film Measurement System Measure Reflectance and Transmittance
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Measurement Specialtiesâ??Pressure Sensors, Position...
Piezo Film Sensors Position Sensors Pressure Sensors
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Metrology Thin Film Measurement - HORIBA
Metrology Thin Film Measurement Home » Semiconductor » Metrology Thin Film Measurement
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Measurement Method - HORIBA
Measurement Method Absorption spectroscopic method Conductivity measurement and concentration conversion
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National Physical Laboratory
Engineering Measurement Environmental Measurement
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APPLICATION NOTE
Revision 5.0 MTD/PS-0234 September 28, 2009 KODAK IMAGE SENSORS ISO MEASUREMENT There are many ways to describe the sensitivity of an imaging system
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Vishay - Thin-Film, Center-Tapped Resistors Provide <0.1 pF...
Company Info ? Product News ? 2003 Releases ? Thin-Film, Center ...
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Low Cost Thin Film Measurement Systems from StellarNet, Inc.
Home > Company Directory > StellarNet, Inc. > Low Cost Thin Film Measurement Systems StellarNet, Inc. - Low Cost Thin Film Measurement Systems
