Supplier: Knight Optical Ltd.
Description: Plane mirror-Precision Grade-1/4 wave-16mmdia These Precision Plane Mirrors are available in two grades (λ/10) & (λ/4) with guaranteed flatness and parallel tolerances. These Precision plane Mirrors are suitable for interferometry and other demanding applications. Low-expansion
- Mirror Types: Flat Mirror
- Mirror Coatings: Silver
Supplier: Specialty Components, Inc.
Description: These first-surface Aluminum mirrors have 1/2 - 1/4 wave flatness and a 16 nm Ra surface finish (certified with interferometry and non-contact optical profilometry). Infrared applications will benefit from our two standard coatings: Silicon monoxide or Silicon monoxide over gold. Mounting holes
- Mirror Shape: Round
- Mirror Materials: Other Mirror Material
- Mirror Coatings: Uncoated, Other Mirror Coating
- Surface Flatness: λ/2
Supplier: Polytec, Inc.
Description: Vibrometry, Stroboscopic Video Microscopy and White Light Interferometry, the MSA-500 is designed with an all-in-one combination of technologies that clarifies real microstructural response and topography. Incorporated in the MEMS design and test cycle, the MSA-500 provides precise 3-D dynamic and static
- Form Factor: Sensor / Sensing Element
- Mounting / Loading: Manual Loading
- Applications: Other
- Measurement Capability: Roughness / Waviness, Shape / Flatness, Other
Supplier: MicroSense, LLC
Description: Automated Thickness measurement system IR interferometry probe technology. Single or dual probes. Manual Loading 0.5um accuracy. 0.1um resolution Wafer 4" to 12" (100 to 300mm) round or square Thickness range: 20um to 1mm Flexible recipe generation 2D & 3D mapping capability SECS/GEM
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Shape / Flatness, Thickness - Wafer / Disc (TTV)
Supplier: PI (Physik Instrumente) L.P.
Description: and the fast and precise settling behavior. The P-622.1CD, for example, can settle to an accuracy of 10 nm in only 30 msec (other PI stages provide even faster response)! Superior Accuracy With Direct-Metrology Capacitive Sensors A choice of tasks such as optical path adjustment in interferometry
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Featured Products for Flatness Interferometry Top
Interferometer Flatness Measuring
The Lapmaster/LAMTech TOPOS and SPI series of Interferometers both feature Grazing Incidence flatness inspection and the measurement capability for grinding, lapping and polishing applications. Reflective surfaces, matte surfaces and ground surfaces can all be optically measured. The compact and cost-effective SPI series (Models #75 & #130) are contact flatness measuring gauging systems and utilize grazing incidence interferometry, providing the capability to measure surface flatness... (read more)
Browse Surface Metrology Equipment Datasheets for Lapmaster International
Specialty Components, Inc.
Flat Mirrors (Custom or Standard): Specialty Comp.
These first-surface Aluminum mirrors have 1/2 - 1/4 wave flatness and a 16 nm Ra surface finish (certified with interferometry and non-contact optical profilometry). Infrared applications will benefit from Specialty Components' two standard coatings: Silicon monoxide or Silicon monoxide over gold. Mounting holes on back surface are standard. If our standard forms do not satisfy your requirements, please contact our technical staff for assistance. Click for specifications... (read more)
Browse Optical Mirrors Datasheets for Specialty Components, Inc.
Advanced Optics, Inc.
Single and Double-sided Optical Flats
Advanced Optics manufactures both single-sided and double-sided optical flats which may be used as a reference (test plate) against which the flatness of an unknown surface may be compared or as optical windows. Single-sided flats are typically used as a reference (test plate) and may be made of either low expansion borosilicate glass, fused silica or Zerodur. Surface flatness of 1/4 , 1/10 or 1/20 wave are available in either fused silica or Zerodur and 1/4 and 1/10 wave in low... (read more)
Browse Optical Flats Datasheets for Advanced Optics, Inc.
Specialty Components, Inc.
Off-Axis Parabolic Mirrors...Standard or Custom
range. Guaranteed at ½, ¼ or 1/8 waveform accuracy with <16nm Ra surface finish. Select from protected Aluminum, protected Gold or untreated coatings combined with your choice of size and reflecting angle. Convenient mounting features allow for precise centering and direction of the referenced beam. Thermal stress relieving and a mounting surface flatness of ½ wave allows for distortion free assembly. Click to see our our standard forms & specifications or Contact us... (read more)
Browse Parabolic Mirrors Datasheets for Specialty Components, Inc.
Specialty Components, Inc.
Spherical Mirrors, Concave/Convex
light in the infrared range. Guaranteed at ½, ¼ or 1/8 waveform accuracy with <16nm Ra surface finish by diamond point machining. Select from protected Aluminum, protected Gold or untreated coatings combined with your choice of size and thickness. Convenient mounting features allow for easy integration into your assembly. Thermal stress relieving and a mounting surface flatness of ½ wave allows for distortion free assembly. For more information on Specialty Components, Inc... (read more)
Browse Spherical Mirrors Datasheets for Specialty Components, Inc.
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Improved Interferometric Optical Testing
Interferometry is used for testing optical components and optical systems as well as the metrology of many other components, such as the flatness and roughness of hard disk drive platters and the shape of magnetic recording heads and machined parts. This article describes three recent advances
Infrared Sensor Graphic Interface PVC Sheet Material
The WaferSight wafer-flatness tool performs high-resolution and high-throughput mapping of wafer shape, flatness, and thickness variations. Based on proprietary optical laser interferometry, the in-line metrology system is available for 300- and advanced 200-mm wafer processing. Its subnanometer
geometry measurements, the 300-mm Advanced Flatness system measures and reports SEMI-standard wafer shape, flatness, thickness, and resistivity results. The multifunctional wafer-flatness measurement and sorting system can also be used in ultrathin SOI, epitaxial, prepolish, and reclaim wafer
Piezoelectrics in Positiong
./738a4662-629b-4c72-bc27-a3814bf026c3 Tutorial. Piezoelectrics in Positioning. Flatness of a NanoPositioning stage with active trajectory control is. better than of 1 nanometer over a 100 x 100 µm scanning range. PZT unit cell: 1) Perovskite-type lead. zirconate titanate (PZT) unit cell
Medical Device Link . Laser Marking Medical Devices and Packaging
, and shape of the mark edges) also will affect its visibility. To optimize and quantify the quality of a laser mark, optical parameters such as surface flatness and the contrast between the marked and unmarked regions of the material can be measured using sophisticated equipment. These parameters can