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  • Improved Interferometric Optical Testing
    Interferometry is used for testing optical components and optical systems as well as the metrology of many other components, such as the flatness and roughness of hard disk drive platters and the shape of magnetic recording heads and machined parts. This article describes three recent advances
  • Infrared Sensor Graphic Interface PVC Sheet Material
    The WaferSight wafer-flatness tool performs high-resolution and high-throughput mapping of wafer shape, flatness, and thickness variations. Based on proprietary optical laser interferometry, the in-line metrology system is available for 300- and advanced 200-mm wafer processing. Its subnanometer
  • MICRO: Products
    geometry measurements, the 300-mm Advanced Flatness system measures and reports SEMI-standard wafer shape, flatness, thickness, and resistivity results. The multifunctional wafer-flatness measurement and sorting system can also be used in ultrathin SOI, epitaxial, prepolish, and reclaim wafer
  • Piezoelectrics in Positiong
    ./2fadbdc8-4095-4298-b5f3-b1b711edb893 Tutorial. Piezoelectrics in Positioning. Flatness of a NanoPositioning stage with active trajectory control is. better than of 1 nanometer over a 100 x 100 µm scanning range. PZT unit cell: 1) Perovskite-type lead. zirconate titanate (PZT) unit cell
  • Medical Device Link . Laser Marking Medical Devices and Packaging
    , and shape of the mark edges) also will affect its visibility. To optimize and quantify the quality of a laser mark, optical parameters such as surface flatness and the contrast between the marked and unmarked regions of the material can be measured using sophisticated equipment. These parameters can

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