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Supplier: Multi-Contact USA
Description: Active high-frequency test probes with highly flexible coaxial 50 Ohm connecting lead with BNC plug for connection to high-frequency scopes with high-impedance scope input. AC version or switchable DC/AC version.
- Probe Type: High Frequency
- Attenuation Factor: 1X
- Probe Configuration: Extended - Fine Tip
- Approvals: Other
Supplier: Electro Rent Corporation
Description: Megger (formerly Multi-Amp) FTS300 FTS-300 Frequency Test Set/generator is a compact, solid-state, self-contained with LED direct digital readout of frequency and time. Designed to simplify and speed the calibration and adjustment of power-system, frequency sensitive components. The 360Hz to 440Hz
Standards and Technical Documents - Steel forgings -- Testing frequency, sampling conditions and test methods for mechanical tests -- ISO/TR 15461:1997
Description: Steel forgings -- Testing frequency, sampling conditions and test methods for mechanical tests
Supplier: Hensley Technologies, Inc.
Description: RADIO FREQUENCY PROBE
Supplier: All-Spec Industries
Description: Auto power off current ranges fused, high performance & quality, ruggedized
- Form Factor: Handheld
- Display Type: Digital
- Display Digits: 4 Digits, Plus 1/2 Digit
- Features: Battery Powered, Other
Supplier: HDW Electronics Inc.
Description: The EZ-TEST Tool is a light weight, powerful low frequency AC Hipot Tester, which facilitates quick, easy and safe AC Hipot tests of URD power cables. Most of the times these tests are carried out by construction crews after repairs and before energizing a new circuit. Typically the circuits
- Configuration: Benchtop, Other
- Test Features: Hipot
Supplier: American Microsemiconductor, Inc.
Description: Instrument Probe Diode;Test Frequency-10Gc/s.
- Diode Type: Other
Standards and Technical Documents - 469-1988 - IEEE Recommended Practice for Voice-Frequency Electrical-Noise Tests of Distribution Transformers -- 10.1109/IEEESTD.1988.122902
Description: Abstract The standard provides instruction for the testing of distribution transformers as sources of voice-frequency noise. These tests measure the degree to which a transformer may contribute to electrical noise in communication circuits that are physically paralleling the power-supply circuits
Supplier: Netcom, Inc.
Description: Test and measurement applications, high frequency, low noise
- Oscillator Type: VCXO
- Package / Form Factor: Surface Mount Technology (SMT)
- Supply Voltage: 12.0 V
- Output Type: Sine Wave
Supplier: Dwyer Instruments Inc.
Description: to volts and ohms, the digital pen meter includes continuity, diode, and frequency tests to 10 kHz. This meter features data hold, REL (relative value), and auto range buttons. The 4 digit LCD displays value, mode, and low battery indication. The Model PM-1 is furnished with red and black test leads
- Form Factor: Handheld
- Display Digits: 4 Digits
- Electrical Measurements: Continuity Check, Diode Test
- Features: Auto-Ranging, Battery Powered, Data Storage / Logging
Supplier: Emhiser Research, Inc.
Description: Reliability All units are designed and constructed to meet or exceed specifications after exposure to any or all of the following MIL-STD-202 tests which are applicable.
- Frequency Multiplier Type: Passive
- Multiplying Factor: 2X
- Package Type: Connectorized
- RF Connector: BNC, MCX, Mini-UHF, MMCX, SMA, SMB, SMP, TNC, Type F, Type N, UHF, 1.6 / 5.6, 7-16, Other
Supplier: OMICRON electronics Corp. USA
Description: frequency range with the test speed advantages of the PDC (Polarization Depolarization Current) method in the lower frequency range.
- Phase: Single Phase
- Form Factor: Stand Alone / Bench
- Test Parameters: Capacitance, Other
- Features: Computer Interface
Description: The latest TTR available from Megger is the TTR100, a handheld, robust, lightweight and battery operated instrument. This TTR will complement several existing Megger transformer test products and will offer switchable functions, such as winding resistance and polarity. It is the only instrument
- Phase: Three Phase, Single Phase
- Form Factor: Hand-Held
- Test Parameters: Excitation Current, Impedance Phase Angle, Turn Ratio, Winding Polarity
- Features: Battery Powered, Integrated Data Logger, Fully Automated, Graphic Results, Printer / Plotter Interface
Supplier: Trilithic, Inc.
Description: High performance, frequency-settable leakage detector
- Equipment Type: Other
- Form Factor: Hand Held
- Indicators: Yes
Supplier: Anritsu Company
Description: the most flexible WLAN testing available. Features Integrated test set for validating the RF performance of WLAN devices operating in the 2.4 GHz and 5 GHz frequency bands 'Network' mode – tests devices in a connection using standard WLAN signalling. 'Direct' mode – tests WLAN
- Interface Port: BNC
- Equipment Type: Network / LAN Analyzer
- Form Factor: Desktop
Supplier: ValueTronics International, Inc.
Description: The Tektronix TR502 is a used Tracking Generator that works with the 7L12 & 7L14 Spectrum Analyzers to provide constant level, calibrated RF sources for swept frequency tests to 1.8 GHz.
Supplier: Wayne Kerr Electronics
Description: Measurements: resistance, capacitance, inductance, voltage, frequency
Supplier: 1-Source Electronic Components
Description: CHIP INDUCTOR, 82NH 450MA 5% 900MHZ Inductance:82nH Inductance Tolerance:± 5% DC Resistance Max:0.4ohm DC Current Rating:450mA Q Factor:27 Self Resonant Frequency:900MHz Q Test Frequency:100MHz Core Material:Ferrite RoHS Compliant: No
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Featured Products for Frequency Test Top
High Frequency (HF) Test & Measurement Accessories
Multi-Contact's HFline product family includes passive and active high-frequency test probes (HF probes) and accessories as well as touch-protected BNC plug connectors, leads, adapters and converters. The new Isoprobe IV generation of passive probes is a highly compact addition to the MC range of touch-protected high-frequency probes. The greatly reduced size of this new product substantially facilitates the conduct of measurements in a restricted space, while still retaining the good... (read more)
Browse Electrical Test Probes Datasheets for Multi-Contact USA
Test and Measurement Accessories
voltages (CAT I), high frequency safety test accessories, and a wide range of extremely flexible, fine stranded wire and cable. Products: Plugs and sockets. Test leads. Alligator clips. Test probes. Panel receptacles and binding posts. Jumpers and adapters. Features: Current: up to 125A. Voltage: up to 1500V. Fully touch protected. Gold, nickel or silver plated. Multilam equipped. Inquire about a sample... (read more)
Browse Electrical Test Probes Datasheets for Multi-Contact USA
Extend Frequency of Existing Receiver/Test Systems
MITEQ's LNB series of Low-Noise Block Converters supply RF down conversion from 18-40 GHz to IF frequencies of 2-16 GHz, well within the range of your existing 18 GHz equipment. The LNB series, with its 4 dB noise figure and internal LO, permits processing of very low level input signals. Currently MITEQ offers either an 18-26 or 26-40 GHz model. This unit is housed in a a half rack case and can be powered either by 12/15 VDC or a universal AC power supply. An... (read more)
Browse RF Receivers Datasheets for MITEQ, Inc.
Custom Frequency Discriminator
MITEQ manufactures two distinctly different types of Frequency Discriminators. Both types are utilized to convert an input frequency to a bipolar DC voltage corresponding to frequencies above and below crossover (center frequency). Typical applications of Frequency Discriminators include automatic frequency control (AFC) systems and high-fidelity FM demodulation systems. The narrow bandwidth type uses an input limiting amplifier to drive two staggered tuned L-C circuits. Opposing rectification... (read more)
Browse Frequency Discriminators Datasheets for MITEQ, Inc.
Experimental Modal Test System
point Number. Obtain signal data easily and effectively with variety trigger modes and different adjustable windows. To obtain the best FRF estimation results under excitation, this system provides customers not only a variety of waveform sources including swept sine, narrow-band random and shaped random, but also many kinds of frequency response estimation methods. Convenient for the further structure modal analysis, as a result of obtained FRF file supporting varies modal analysis software... (read more)
Browse Datasheets for ECON Technologies
North Hills Signal Processing Corp.
VDSL Measurements. VDSL requires service-splitters at the network end as well as remote customer end to separate the low-frequency telephone (POTS) and high-frequency data signals. Application Note 162 outlines electrical tests of the Network End Splitter as covered in Annex F (pages 146-155) of ANSI Standard T1.424.2004. Application Note 163 outlines electrical tests of the Remote Customer End Splitter as covered in Annex E (pages 135-145) of ANSI Standard T1.424.2004. The Network End Service... (read more)
Browse Network Test Equipment Datasheets for North Hills Signal Processing Corp.
Wayne Kerr Electronics
257 Series Automatic Modulation Meters
and is ideal for field or bench use. Model 257/05 is a mains only unit with GPIB option so can be part of an automatic test system. Frequency range 1.5 MHz to 2 GHz. Useful indications to 4 GHz. LED indication of lock, level set and function. Analogue display. Incorporates three bandpass filters, a psophometric filter, and a deemphasis network. Small, lightweight unit ideal for field use if battery version ordered. GPIB version for systems use... (read more)
Browse Network Test Equipment Datasheets for Wayne Kerr Electronics
Ohio Semitronics, Inc.
FT Series Frequency Transducers
FT Series Frequency Transducers provide an AC output that is proportional to the frequency of the input source. Select among 15 units for virtually any application requiring an indication or recording of instantaneous frequency. Input frequencies are available for 45-55, 55-65 or 375-425 Hertz, and five different standard outputs, with 230Vac support available as an option. Specifications. Input. Frequency Range: See the following Model numbers. Voltage Range. • Standard: 95-135Vac. &bull... (read more)
Browse Frequency-to-Current Converters Datasheets for Ohio Semitronics, Inc.
JTAG Technologies Inc.
The JT 2149/DAF has been designed to slot into JTAG Technologies' regular QuadPod transceiver system as used by the renowned DataBlaster series of boundary-scan/JTAG controller hardware. When connected to a circuit board via edge connector or test fixture/jig test pins the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made. Capabilities of the JT 2149/DAF module include 16 dual-purpose digital pins capable... (read more)
Browse Test, Inspection, and Measurement Software Datasheets for JTAG Technologies Inc.
Parts by Number for Frequency Test Top
|Part #||Distributor||Manufacturer||Product Category||Description|
|5322557||RS Components, Ltd.||Tyco||Inductor Surface Mount||Inductance:40nH; Maximum DC Current:320mA; Maximum Self Resonant Frequency:2.24GHz; Minimum Quality Factor:24; Maximum DC Resistance:440mOhms; Test Frequency:250MHz; Tolerance:5%; Maximum Operating Temperature:125C; Minimum Operating Temperature:-40C; Type:High Frequency Chip|
|5322721||RS Components, Ltd.||Tyco||Inductor Surface Mount||Inductance:6.8nH; Maximum DC Current:700mA; Maximum Self Resonant Frequency:5.8GHz; Minimum Quality Factor:27; Maximum DC Resistance:110mOhms; Test Frequency:250MHz; Tolerance:5%; Maximum Operating Temperature:125C; Minimum Operating Temperature:-40C; Type:High Frequency Chip|
|5323689||RS Components, Ltd.||Tyco||Inductor Surface Mount||Inductance:2.2H; Maximum DC Current:160mA; Maximum Self Resonant Frequency:60MHz; Minimum Quality Factor:16; Maximum DC Resistance:2.7Ohms; Test Frequency:250MHz; Tolerance:5%; Maximum Operating Temperature:125C; Minimum Operating Temperature:-40C; Type:High Frequency Chip|
|1910245||RS Components, Ltd.||EPCOS||Inductor Surface Mount||Inductance:470nH; Maximum DC Current:150mA; Maximum Self Resonant Frequency:480MHz; Minimum Quality Factor:22; Maximum DC Resistance:2.2Ohms; Core Material:Ceramic; Test Frequency:1MHz; Tolerance:10%; Protection Style:Molded; Product Height:2mm|
|6920691||RS Components, Ltd.||Bourns Electronics||Inductor Surface Mount||Inductance:47H; Maximum Self Resonant Frequency:8MHz; Minimum Quality Factor:26; Maximum DC Resistance:94mOhms; Core Material:Ferrite; Test Frequency:100kHz; Tolerance:30%; Protection Style:Shielded; Maximum Operating Temperature:125C; Minimum Operating Temperature:-40C|
|1910150||RS Components, Ltd.||EPCOS||Inductor Surface Mount||Inductance:22H; Maximum DC Current:140mA; Maximum Self Resonant Frequency:16MHz; Minimum Quality Factor:27; Maximum DC Resistance:2.65Ohms; Core Material:Ferrite; Test Frequency:100kHz; Tolerance:10%; Protection Style:Molded; Product Length:3.2mm|
Conduct Research Top
Signal Integrity- Frequency Range Matters! White Paper
Higher data rates introduce new challenges for test solutions. This white paper discusses the importance of both high and low frequency test limits and also their impact on your time domain results. Signal Integrity- Frequency Range Matters! White Paper - Anritsu America. Login United States
A Simple Frequency Response Function
from Figure 5, it simply shows the Frequency Response Function for this particular test. Reply. 1151 days ago kiran. how can v obtain auto spectral density of velocity from auto spectral density of the displacement. Reply. 1146 days ago James Wren. Hi Kiran,. Thanks for asking a question on our
GPS Time & Frequency Systems
, with output references tailored to a customer's. specific requirements. The double oven crystal oscillator provides a holdover in the order of ±. 7 microseconds in a 24-hour period and a frequency stability of± 3 X 10-10 over a. temperature range of —20o C to +70o C. For test data and further information
Frequency and Resolution Options for PWM Outputs
The PIC17C42 is equipped with two high frequency Pulse Width Modulation (PWM) outputs. In a pulse width modulated signal the period of the signal is (usually) kept fixed, while the duty cycle is varied. In this application note, we will discuss options in selecting PWM frequency and resolution
Generating Frequency Chirp Signals to Test Radar Systems (.pdf)
systems. Generating frequency chirp signals to test radar systems Application. Note. Generating frequency chirp signals to. test radar systems. Radar chirp signals can be simulated by the 3410 series. signal generator using the internal arbitrary waveform gener-. ators, external IQ inputs
TC7136/TC9400 Digital Readout Frequency Meter
. TC9400 FREQUENCY-TO-VOLTAGE. LCD display so no digital conversion is required. CONVERTER. The test voltage is used as the reference supply for the TC9400 and. The "non-standard " voltages or the TC9400 require some creativity. ANALOG COMMON serves as the "ground " for the comparator. be used
Cable Solutions for Servo and Variable Frequency Drives
Learn about frequency converter technology, common negative effects, and how cable design and materials provide reliable solutions. Electric drive systems have many benefits, including continuous torque and speed control. However, frequency converters also come with negative side-effects
Medical Device Link . Benchtop EMC Testing Techniques for Medical Equipment Using loop probes to help test devices for electromagnetic compatibility saves costly redesign and complements open area and chamber tests.
and characterize radiated emissions sources by examining magnetic fields produced close to their origin than it is by studying electric fields. MAGNETIC FIELD LOOP PROBES Any electrical circuit can produce magnetic fields and radiate radio-frequency (RF) energy. In digital circuits, RF currents usually
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underlying nature of basic test functions such as observing signal wave shapes of voltage, waveform distortion, amplitude or signal frequency range.
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Category:Electronic test equipment - Wikipedia, the free...
Category:Electronic test equipment From Wikipedia, the free encyclopedia The main article for this category is Electronic test equipment.
Z-test - Wikipedia, the free encyclopedia
A Z-test is any statistical test for which the distribution of the test statistic under the null hypothesis can be approximated by a normal