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  • Self-testing chips take a load off ATE
    with density. This trend has forced an emphasis on design-for-test (DFT) techniques that both find ways of compressing test requirements and help minimize the need to regularly boost ATE test-pattern memory. In this simple example of a functional test, a low signal on the scan enable input lets
  • Mapping the Way to Innovation
    . At Allston, employee-directed cross-functional improvement teams use tools that include statistical process control charting, statistical analysis on process variables and a process data historian that captures key process variables, to analyze process trends. Trend data are distributed to all via

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