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| Part # | Distributor | Manufacturer | Product Category | Description |
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| X-Beam | IXRF Systems, Inc. | Nondestructive Testing (NDT) Equipment | The X-Beam? custom x-ray source is designed exclusively for use on electron microscopes. The compact design, and slide mounting allow very close coupling to the sample. Patented polycapillary optics focus x-ray excitation down to sample areas as small as 10 µ. The X-Beam? is offered in 10... |
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Scanning electron microscope - Wikipedia, the free... Scanning electron microscope From Wikipedia, the free encyclopedia |
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Electron microscope - Wikipedia, the free encyclopedia The original form of electron microscope, the transmission electron microscope (TEM) uses a high voltage electron beam to create an image. |
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Microscopy at UW-Madison | Research & service microscopy... Electron microscopes (15) Scanning electron microscopes (5) |
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Electron Microbeam Analysis Laboratory A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in |
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HITACHI REVIEW -- February 1996 Vol.45-No.1 3-MV Ultra-High Voltage Electron Microscope Hitachi has recently completed the development of a 3-MV ultra-high voltage electron microscope. |
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HITACHI : News Releases : July 13, 2000 |
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Available Technologies: Direct Electron Detector for Low... Direct Electron Detector for Low Voltage Electron Microscopy |
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oampage The One-Ångstrom Microscope (OÅM) produces electron microscope images with sub-Ångstrom resolution from a mid-voltage high-resolution transmission |
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NCMIR |
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NCMIR with high performance instruments at the NCMIR and with the world's largest microscope (3.0 MeV) at the Center for Ultra-High Voltage Electron |