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Supplier: Inspec Inc.
Description: Key featuresd High resolution & accuracy laser stripe scannerd Cutting edge compact & lightweight designd Fully compatible with Renishaw PH10d Automated qualification of the PH10 orientationsd Compatibility with ACR-3 auto-exchange rack for easy tool exchanged Easy macro based path
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 3D / Areal Topography
- Mounting / Loading: Machine Mounted
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Supplier: Mahr Federal Inc.
Description: The new MarSurf® UD 120 from Mahr Federal can generate both surface and contour measurements in a single pass. Designed for economy, the system provides high accuracy over a large measuring range in nanometer resolutions. The MarSurf UD 120 includes both automated motorized operation and joystick
- Technology: Non-contact - Optical / Laser
- Standards Compliance: ISO / EN
- Mounting / Loading: Benchtop
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
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Supplier: MTI Instruments Inc.
Description: environments and under varying temperature conditions. Features: Latest CCD Technology Visible Laser spot for easy setup Interchangeable laser heads without the need to recalibrate Direct Ethernet Connection and Control Cost Effective No External Controller Needed High Accuracy
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Measurement Capability: Spacing Parameters (PC, Sm), Waviness Parameters (Wa,Wt ), Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
- Common Specific Parameters: Maximum Peak Height (RP), Maximum Valley Depth (RV), Profile Depth (Pt)
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Supplier: Starrett
Description: For visually checking the flatness of seals, gages and mating surfaces. Through means of interpreting light interference patterns or bands, the optical flat provides a simple, accurate precision method for measuring surface flatness. Flats are crafted from high quality fused quartz and provide
- Technology: Contact / Stylus Based
- Form Parameters: Flatness
- Industrial Applications: Mechanical Parts (Bearings, Shafting)
- Mounting / Loading: Handheld / Portable
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Supplier: Bruker Nano Surfaces Division
Description: The ContourGT-X8 provides the highest speed, accuracy, and range for 3D, non-contact surface measurement of ophthalmic lenses, medical devices and tools, high-brightness LEDs, semiconductor devices, through-silicon vias and trenches, solar cells, and precision machined parts. The gauge-capable
- Surface Metrology: Surface Profilometry
- Measurement Capability: 3D / Areal Topography, Step Height
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Medical, Optics / Photonics, Precision Machining / Grinding, Semiconductor Manufacturing, Other
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Supplier: Bruker Nano Surfaces Division
Description: Production-based 3D reference metrology for 45 nm and below For unparalleled accuracy and precision – the kind needed for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features -- the InSight™ 3D Atomic Force Microscope (AFM) is the clear
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry, Roughness / Waviness
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Supplier: KLA-Tencor Corporation
Description: The SpectraCD-XTR optical CD/profile metrology system delivers improved precision accuracy, and tool-to-tool matching at the highest throughput and lowest cost-of-ownership (CoO) available. Evolved from the industry-leading, fourth-generation SpectraCD-XT system, the SpectraCD-XTR optical CD
- Form Factor: Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry, Roughness / Waviness
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Supplier: Park Systems, Inc.
Description: accuracy of less than 0.1 degrees • Fully automatic Critical Angle Measurement acquisition and analysis software High Throughput Inline Automation • Allowable sample size: 200/300mm wafers • Automatic data acquisition and analysis of critical angles, roughness and trench measurements
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
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Featured Products for High Accuracy Profilometer Top
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Precitec, Inc.
Measurement of Doped Wafers and TSVs
Modifications have been made to several existing CHRocodile sensors to enable measurement on unique semiconductor materials, ranging from glass, sapphire and highly doped wafers, to TSVs and other structured devices. Capable of measuring wafer thickness, topography or film thickness at high speeds, CHRocodile sensors are available for nearly all materials and applications. With the semiconductor and electronic industries dependant on high quality standards, the high precision of the CHRocodile... (read more)
Browse Wafer and Thin Film Instrumentation Datasheets for Precitec, Inc. -
Marshall Manufacturing Company
Process Management Delivers Quality
with customers to incorporate profile tolerancing into drawings of parts. Geometric profile tolerances can reduce inspection time and improve accuracy by incorporating design intent. By defining boundaries around physical features and creating profile gages to measure parts, Marshall reduces measurement error in inspection and verification/validation. Marshall Manufacturing meets high customer standards by complying with all regulatory requirements, utilizing and maintaining an effective... (read more)
Browse CNC Machining Services Datasheets for Marshall Manufacturing Company
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Inspecting Hard-to-Reach Surfaces (.pdf)
Surfaces. with a Fiber-based Profilometer. Keywords: low coherence interferometry, white light. Fiber-based Profilometers vs. interferometry, fiber-based profilometry, hard-to-reach. Microscope-type Profilometers. surfaces, high-aspect ratio imaging, 3D industrial. inspection, mapping internal surface
Engineering Web Search: High Accuracy Profilometer Top
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[Ultrahigh Accurate 3-D profilometer Ultrahigh Accurate 3-D...
Business > Panasonic Factory Solutions > Ultra Accuracy 3-D Profilometer The super-high accuracy of max. 0.01 ?m
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Principle | UA3P | Ultrahigh Accurate 3-D Profilometer |...
Business > Panasonic Factory Solutions > Ultra Accuracy 3-D Profilometer > Principle
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Profilometer for non-contact surface measurement, confocal...
Using white light scanning technology our high-end confocal microscope offers high resolution and accuracy while being free of any optical artifacts.
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In Situ Measurement of Marine Sediment Acoustical Properties...
measurements with a prototype profilometer, which required electrical cables to the surface, established the accuracy and usefulness of the
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MPR: Innovative 3D free-form optics profilometer G. Sironi1,2,...
MPR: Innovative 3D free-form optics profilometer G. Sironi1,2, O. Citterio1,2, G. Pareschi1, B.Negri4 A. Ritucci2, R. Subranni2, A. Orlandi2, G.
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High-precision mechanical profilometer for grazing incidence...
High-precision mechanical profilometer for grazing incidence optics
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Development of a rapid profilometer with an application to...
Title: Development of a rapid profilometer with an application to roundness gauging Authors: Marcin B. Bauza, Shane C. Woody, Stuart T. Smith, Robert
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NANOFABRICATION FACILITY Charles Black, Facility Leader Our...
Core laboratory capabilities include high- capable of simultaneous focused ion beam milling resolution patterning by electron-beam and and SEM
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Klystron Metrology
Critical parts for high power RF devices are inspected 100%. The group also performs special precision measurement and alignment tasks in support of
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SAWS Design and Fabrication Capabilities Matrix Description...
Substrate sizes: 9" x 9" max. Usable with multiple targets Load lock, high- throughput system E-Beam Evaporation Metal and oxide deposition Substrate
