and measure a target with just a click of the mouse. With
high-resolution color imaging and nanometer-
level profile measurement functions, the VK-X Series Laser Scanning
Microscopes have been designed to overcome the inadequacies of conventional imaging and profiling technologies. A short-wavelength laser scans across a target to provide non-contact profile, roughness and thickness measurements, even on targets with highly-angular surfaces. By combining the laser with an industry-leading, 16-bit...
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