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Setting the stage for clearer images
it. In response, control-loop integral gain builds to lower position error. When the stage finally does move it tends to overshoot the intended target. Stages with better structural stiffness and less torsional wind-up allow high acceleration rates and short settling time without excessive preload
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Precision Cleaning in the Metalworking Industry
the hardening process, but leave the byproducts of their reaction in. the process embedded in the workpiece surface. This type of contamination is extremely. difficult to remove in the final precision cleaning stage without resorting to high strength. detergents that can potentially damage the workpiece
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Precision moves with pint-sized motors
Innovative actuators and stages based on piezoelectric materials give superfine motion in a compact package. A typical use for PZT actuators is in the precision positioning of microscope objectives. The MIPOS 500 stage (top) from Piezosystem Jena Inc. is one example of a device designed
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Case Study: High Resolution Inspection for Dental Imaging System
stage. Because of the improvements in the structure of the deposited CsI, imperfections are getting smaller and smaller, making them difficult to detect. AST has developed a high quality proofing system based on an optical inspection microscope and a camera system for X-ray inspection that is used
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Improving Motion Positioning With Dual-Loop Control and Scurve
. Microsoft Word - Microscope X-Y Stage 7-30-08. Microscope XY Stage Positioning Application. Improving motion positioning with dualloop control and Scurve motion. Application Challenge: Maximize accuracy, smoothness, and speed. Microscope xy stages need fast, smooth, and accurate motion for highest
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Automated Optical Positioning Helps Automate FT-IR Analysis
window. As a result of these improvements, the Nic-Plan microscope is considered by many to provide the most advanced technology in high performance infrared microspectroscopy. It is the only instrument currently on the market that provides fully automated software control over mode switching
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MICRO: Product Extra!
iC atomic force microscope (AFM) upgrade kit supports Veeco Dimension-series scanning probe microscopes, which accommodate large samples such as 300-mm wafers. The stage offers a scanning range of 100 X 100 um. The upgrade kit brings subnanometer accuracy and excellent scan linearity to existing
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Factors to Consider When Choosing a Crossed Roller Bearing (.pdf)
it's wafer positioning for the efficient manufacture of ICs, pick and place, vision inspection, parts transfer, a microscope stage under computer control or precise vertical movements, linear bearings have had to evolve rapidly in order to carry heavier loads, take up less space and be reliably precise