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High Resolution Metrology
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Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources.
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Supplier: PI (Physik Instrumente) L.P.Description: P-5x8 series, Z/tip/tilt nanopositioners / scanners are open-frame, high-resolution, piezo-driven stages providing motion to 240 µm and 2.4 mrad with resolutions of up to 0.5 nm and 50 nrad. The 66 x 66 mm clear aperture is ideal for transmitted-light applications. XY and XYZ multi-axis
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Supplier: MSI-Viking GageDescription: The new MarSurf® UD 120 from Mahr Federal can generate both surface and contour measurements in a single pass. Designed for economy, the system provides high accuracy over a large measuring range in nanometer resolutions. The MarSurf UD 120 includes both automated motorized operation and joystick
- Technology: Non-contact - Optical / Laser
- Measurement Capability: Specialty / Custom
- Standards Compliance: ISO / EN
- Mounting / Loading: Benchtop
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Supplier: Teledyne DALSADescription: and multiple resolutions the Falcon HG cameras are well suited for applications in electronics inspection, semiconductor inspection, industrial metrology (gauging) and other machine vision applications. These cameras use DALSA CMOS technology for low power consumption enabling them to be compliant
- Monochrome / Color: Monochrome
- Imaging Technology / Camera Type: CMOS
- Output: Other, Camera Link®
- Resolution: 8 bits
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Supplier: RenishawDescription: interface in the form of a robust, convenient connector that can be located up to ten metres from the readhead. The interface can apply high-fidelity digital interpolation to 1 nm resolution, with clocked outputs for optimised speed performance at all resolutions for industry-standard controllers
- Technology: Linear Encoder
- Output: Voltage
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Supplier: Nikon Metrology, Inc.Description: reproduction, large field-of-view, and high spatial resolution, making it an ideal choice for users needing a camera that acquires high quality brightfield and fluorescence images.
- System Type: Modular / PC-Based
- Applications / Capabilities: Biotechnology or Medical, Electronics or Semiconductor Inspection, Flaw Detection, Gauging, Scanning & Dimensioning, Production & Quality Control, Tool & Die Monitoring
- Image Source: Area Scan Camera, Optical Microscope, Other Image Source
- Stage / Positioner: X-Y-Z Stage
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Supplier: Mahr Federal Inc.Description: The new MarSurf® UD 120 from Mahr Federal can generate both surface and contour measurements in a single pass. Designed for economy, the system provides high accuracy over a large measuring range in nanometer resolutions. The MarSurf UD 120 includes both automated motorized operation and joystick
- Surface Metrology: Form Measurement, Surface Profilometry
- Measurement Capability: Specialty / Custom
- Standards Compliance: ISO / EN
- Technology: Non-contact - Optical / Laser
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Supplier: Solartron Metrology, an Ametek CompanyDescription: The Solartron Digital Lever Probe is a compact high precision lever type probe offering low tip forces when required and very high resolution with fast data speed. Measurement range 0.5mm Resolution user selectable to 0.01µm Data speed user selectable to 3906 readings per second
- Type: Gage Head / Probe
- Technology: Mechanical
- Units: Metric
- Mounting / Loading Options: Benchtop / Floor
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Supplier: Edmund Optics Inc.Description: Long Working Distances Allow for Integration into Machine Vision Measurement Systems Compact Design and Long Parfocal Length Simplifies Mounting Tube Available for Use with C-Mount Cameras Mitutoyo Telecentric Objectives are ideal for high-resolution, high power machine vision measurement
- Lens Type: Objective Lens
- Optical Type / Correction Factor: Specialty / Other
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Supplier: GENEQ, inc.Description: The QImaging® Retiga-2000R digital camera features enhanced visible-range quantum effi ciency resulting in high sensitivity that is ideal for brightfi eld, machine vision, metrology, and metallurgical imaging applications. A progressive-scan interline CCD sensor gives a resolution of 1.92
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Supplier: MicroSense, LLCDescription: Break the nanometer resolution barrier -- achieve picometer resolution with our highest resolution position sensor MicroSense introduces our new Model 6810 high resolution capacitive position sensor. The 6810, in combination with 6000 series probes, is a non-contact displacement measurement
- Technology: Capacitive Linear Position Sensor
- Output: Voltage
Featured Products for High Resolution Metrology Top
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Offering resolutions from VGA up to 4 mega pixels, PL-E950 cameras feature a Gigabit-Ethernet (GigE) interface that ensures fast data transfer rates. Available in both monochrome and color versions, the PL-E950 is well suited to applications that require multiple, small-footprint cameras. These include: security surveillance and monitoring. biometrics. parts inspection. metrology. …and more!. Powerful SDK. As with all PixeLINK® cameras, the PL-E950 can be combined with the acclaimed... (read more)Browse CCD Cameras Datasheets for PixeLINK -
Offering resolutions from VGA up to 4 mega pixels, PL-E950 industrial cameras from PixeLINK® feature a Gigabit-Ethernet (GigE) interface that ensures fast data transfer rates. Available in both monochrome and color versions, the PL-E950 is well suited to applications that require multiple, small-footprint cameras. These include: security surveillance and monitoring. biometrics. parts inspection. metrology. …and more!. Powerful SDK. As with all PixeLINK® cameras, the PL-E950 can... (read more)Browse CCD Cameras Datasheets for PixeLINK -
Offering resolutions from VGA up to 4 mega pixels, PL-E950 industrial cameras from PixeLINK® feature a Gigabit-Ethernet (GigE) interface that ensures fast data transfer rates. Available in both monochrome and color versions, the PL-E950 is well suited to applications that require multiple, small-footprint cameras. These include: security surveillance and monitoring. biometrics. parts inspection. metrology. …and more!. Powerful SDK. As with all PixeLINK® cameras, the PL-E950 can... (read more)Browse CCD Cameras Datasheets for PixeLINK -
Offering resolutions from VGA up to 4 mega pixels, PL-E950 cameras feature a Gigabit-Ethernet (GigE) interface that ensures fast data transfer rates. Available in both monochrome and color versions, the PL-E950 is well suited to applications that require multiple, small-footprint cameras. These include: security surveillance and monitoring. biometrics. parts inspection. metrology. …and more!. Powerful SDK. As with all PixeLINK® cameras, the PL-E950 can be combined with the acclaimed... (read more)Browse CCD Cameras Datasheets for PixeLINK -
Offering resolutions from VGA up to 4 mega pixels, PL-E950 industrial cameras from PixeLINK® feature a Gigabit-Ethernet (GigE) interface that ensures fast data transfer rates. Available in both monochrome and color versions, the PL-E950 is well suited to applications that require multiple, small-footprint cameras. These include: security surveillance and monitoring. biometrics. parts inspection. metrology. …and more!. Powerful SDK. As with all PixeLINK® cameras, the PL-E950 can... (read more)Browse CCD Cameras Datasheets for PixeLINK -
Offering resolutions from VGA up to 4 mega pixels, PL-E950 industrial cameras from PixeLINK® feature a Gigabit-Ethernet (GigE) interface that ensures fast data transfer rates. Available in both monochrome and color versions, the PL-E950 is well suited to applications that require multiple, small-footprint cameras. These include: security surveillance and monitoring. biometrics. parts inspection. metrology. …and more!. Powerful SDK. As with all PixeLINK® cameras, the PL-E950 can... (read more)Browse CCD Cameras Datasheets for PixeLINK -
Metrology. To measure objects with precision, companies frequently turn to PixeLINK® machine vision cameras. Measure Complex Shapes. Organizations looking to measure irregular, complex or precision parts require a machine vision camera solution that offers a high frame rate, excellent image quality and high resolution. For these reasons, companies looking to develop metrology systems for electronics, semiconductors, or any complex manufacturing product choose PixeLINK® industrial cameras... (read more)Browse CCD Cameras Datasheets for PixeLINK -
resolution and measuring accuracy.". The white light optical sensor in the MarSurf WS 1 enables the rapid, high-precision recording of surface topography on a wide range of materials. Using white light and a CCD camera, the system is able to collect height information through the field of view of the camera. Both the test surface area and a high-precision reference surface built into the objective lens are imaged simultaneously by the camera. During measurement, the Mirau objective is moved... (read more)Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc. -
Benefits of Using the Model 10 VSM. Noise below 0.5 μemu with vector signal detection and temperature option in place. Highest Accuracy vector measurements. Field noise as low as 5mOe with optional low noise probe. Built in temperature control and vector - Temperature range 77K to 773K. Slide mounted sensor arrangement for quick sample changes. Safe and reliable air-cooled magnet power supply. Superior Performance by Design. The Model 10 Mark II VSM is a computer-controlled measurement... (read more)Browse Magnetometers Datasheets for MicroSense, LLC -
three axes. • Adjustable ergonomic workstation including a compact control panel and standard keyboard maximizes operator performance. • Massive granite base, bridge and bearing ways for superior machine stability. • 22" Flat panel LCD video display. • Metronics QC-5000 metrology software standard. System Specifications. Accuracy: ( • X-Y) E2=1.5+5L/1000 (Z) E1=1.5+5L/1000. • Encoder Resolution: 0.1 μm (4 μin). • Video Camera: Color 1/2" CCD... (read more)
Parts by Number for High Resolution Metrology Top
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| 00124027 | Amazon | Hexagon Metrology, Inc. | Industrial & Scientific | Standard Gage 00124027 Outside Digital Micrometer, 3-4" Range, 0.0001" Graduation, +/-0.0002" Accuracy |
| 07734004 | Amazon | Hexagon Metrology, Inc. | Industrial & Scientific | Standard Gage 07734004 LCD Electronic Height Gauge, 24" Measuring Range, 0.0005" Resolution, +/-0.0020" Accuracy |
| 00124025 | Amazon | Hexagon Metrology, Inc. | Industrial & Scientific | Standard Gage 00124025 Outside Digital Micrometer, 1-2" Range, 0.0001" Graduation, +/-0.00016" Accuracy |
| 00124024 | Amazon | Hexagon Metrology, Inc. | Industrial & Scientific | Standard Gage 00124024 Outside Digital Micrometer, 0-1" Range, 0.0001" Graduation, +/-0.00016" Accuracy |
| 00124026 | Amazon | Hexagon Metrology, Inc. | Industrial & Scientific | Standard Gage 00124026 Outside Digital Micrometer, 2-3" Range, 0.0001" Graduation, +/-0.0002" Accuracy |
Conduct Research Top
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Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM
Abstract - Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by. SLCM and FESEM. Z.H. Sung, P.J. Lee and D.C, Larbalestier. Applied Superconductivity Center, National High Magnetic Field Laboratory,. Florida State University, FL, 32310. Microsoft Word - abstract_v1.2.doc...
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MICRO: Defect/Yield Analysis & Metrology
measurements of film-step heights were taken using a high-resolution profilometer, and, where required, field oxide thickness on polished wafers was checked using reflectometry. CMP Uniformity. Figure 1 presents an example of how optoacoustic instruments can be used to optimize the CMP process by analyzing...
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Optical Metrology for Large Telescope Optics
quality. assurance throughout the process. Laser interferometry is the most widely used technique for verifying surface. quality of large optics. A laser interferometer measures the phase difference between beams reflecting from a. high quality reference optic and from a test optic. In a traditional...
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MICRO: Defect Analysis and Metrology - Ge (Feb 2000)
of this technique. Two high-resolution defect review techniques, scanning electron microscopy (SEM) and atomic force microscopy (AFM), can be used to characterize deep submicron defects. While SEM provides information on lateral defect size and shape, it does not provide quantitative height information...
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MICRO: Defect Metrology
defects. Following the automated inspections, further defect review was performed using a scanning electron microscope (SEM). This high-resolution analysis aided in verifying and refining the automated grouping classifications. Two hundred random defects were reviewed, and the BF tool results and those...
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MICRO: Defect/Yield Analysis and Metrology
, and capacitors, which cannot be detected using traditional lamp-based optical inspection tools. E-beam inspection uses voltage contrast to detect defects that exhibit abnormal electrical behavior and are therefore called electrical defects. While its high resolution and large focal depth make E-beam inspection...
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MICRO: Defect/Yield Analysis and Metrology
/throughput trade-off. In general, throughput can be expected to decrease with the square of resolution. In practice, engineers often optimize this trade-off by inspecting the entire wafer at a somewhat lower resolution and then directing selected defects to a high-resolution review station...
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Utilizing Laser Technology in Dimensional Metrology Applications
The wavelength of light provides a very high resolution, linear, and stable reference for dimensional measurement. Labmaster(R) instruments effectively couple the wavelength of light to the part to be measured. They do this by using a fringe counting laser interferometer1 to detect linear motion...
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Resolution, Accuracy and Repeatability
are based on practical resolution. Low Accuracy. Low Repeatability. Low Accuracy. High Repeatability. High Accuracy. High Repeatability. Fine Resolution. Coarse Resolution. Downloads. PDF File. Site Index | Contact | Careers | Locate Sales Office | RSS Feed | Aerotech Ltd | Aerotech GmbH...
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3D Atomic Force Microscopy as an Alternative to X-SEM and TEM for Advanced Process Metrology (AN91) (.pdf)
important for process benefit is its attractive cost savings. performance at a fraction of the cost. control. At 110nm and above, Unlike X-SEM and TEM, AFM The X3D reduces cost per wafer pass traditional top-down CD-SEMS (critical measurements are nondestructive by a factor as high as 10 and provides...
Engineering Web Search: High Resolution Metrology Top
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Carl Zeiss SMT, Germany 2010-09-15: Carl Zeiss AURIGA 60 CrossBeam Workstation ? High Resolution Slicing and 3D-Imaging with Unrivaled Variety of Analytical Options See Carl Zeiss SMT Information |
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Bruker - Analytical Instruments for IR, NIR, Raman, NMR, EPR,... Bruker to Deliver an Ultra-High Mass Resolution 15 Tesla FTMS System for Petroleomics to ECOPETROL... See Bruker Corporation Information |
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ESA - Space Science - Darwin overview The constellation was proposed to carry out high-resolution imaging using aperture synthesis in order to provide pictures of celestial objects in |
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Interferometry - Wikipedia, the free encyclopedia |
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Scanning electron microscope - Wikipedia, the free... mode, secondary electron imaging or SEI, the SEM can produce very high-resolution images of a sample surface, revealing details less than 1 nm in |
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High-Throughput Nanometrology with Scatterfield Microscopy Optical microscopy (OM) is a high-throughput metrology methodology that provides a unique advantage since it is a high-bandwidth measurement method See NIST (National Institute of Standards & Technology) Information |
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Jordan Valley Semiconductors | Jordan Valley Semiconductors,... Strain Metrology High-K & Metal Gate Silicides See Jordan Valley Semiconductors, Inc. Information |
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Physikalisch-Technische Bundesanstalt (PTB): High resolution... Structure > Div. 5 Precision Engineering > 5.2 Dimensional Nanometrology > 5.25 Scanning Probe Metrology > High resolution probing systems See Physikalisch-Technische Bundesanstalt (PTB) Information |
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Machine Vision | Computer | System | Measurement Premier - Metrology + Surface Inspection High-speed data acquisition. High-speed, high-resolution video recordings for long duration. See Boulder Imaging, Inc. Information |
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Instrumentation Division, Brookhaven National Laboratory Lasers and Optical Metrology R&D of efficient, high quality photoelectron sources, optical version of particle detectors with high spatial and |
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