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  • Nanotechnology Confronts The "Bad Hair Day, " Tests New Conditioner
    Editor's note: High-resolution microscope images of hair used in the study are available to members of the media by contacting Pam Frost Gorder. Medium-resolution images can be seen Previous stories pertaining to Professor Bhushan's research: "'Bumpy' Glass Could Lead To Self-Cleaning Windows
  • Microscopy of Biological Sections using a Low Voltage STEM Technique (S-5200 SEM 102)
    . Recently, this technique has been used also for semiconductor materials associated with specimen preparation using FIB systems. TEM technique has been playing a leading role for microscopy of biological sections. We have used the S-5200 ultra-high resolution scanning microscope with STEM attachment
  • Hernon Supertacker Used in UConn Application
    Supertacker (R) involves bonding mounting wires to diamond wafers. Project lead Igor Senderovich is a Graduate Student at UConn. The diamond radiators are part of a larger project of building a Tagger Microscope, which is a movable, high-resolution hodoscope that counts post- bremsstrahlung
  • Near Field Imaging of a Laser Diode Using Scanning Method
    resolution was approximately 1 um. The measurement setup was constructed on Newport AutoAlign8000 alignment system, which consists of two motion stage stacks and a stationary center post. Beam profiling was achieved by using a high magnification microscope objective and scanning a detector with a pinhole
  • Whole lot of shakin' goin' on
    Minimizing vibration and noise betters image quality in inspection applications. Harrison H. ChinApplied Concept Research Inc. When it comes to high-resolution inspection as in scanning for semiconductor defect review, image stability is paramount. Consider a scanning electron microscope (SEM
  • MICRO: Behind the Mask- Kasprowiez (Feb 2000)
    Bryan S. Kasprowicz and Benjamin G. Eynon, metrology, the critical dimension scanning electron microscope (CD SEM) has long been the instrument of choice for measuring submicron features because of its nanometer-scale resolution and ever-improving throughput. Because photomask features historically
  • MICRO: Defect Analysis and Metrology - Ge (Feb 2000)
    of this technique. Two high-resolution defect review techniques, scanning electron microscopy (SEM) and atomic force microscopy (AFM), can be used to characterize deep submicron defects. While SEM provides information on lateral defect size and shape, it does not provide quantitative height information
  • MICRO: Prod Tech News
    for both imaging and repair. Patented environmental SEM technology enables E-beam repair and high-resolution E-beam imaging. The system also features an optical microscope for mask navigation and global alignment. The Cal=Trak SL-500 primary standard gas-flow calibrator is a fast, mercury-free

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