Products & Services

See also: Categories | Featured Products | Technical Articles | More Information

Conduct Research Top

  • Nanotopics: High Resolution Reflected Light Microscopy to Determine Filler Micro-Dispersion
    resolution measurements are. due to the electromagnetic diffraction limit, which confines resolution of white light to. approximately 1 micron. In this work a new reflected light method is discussed which provides. resolution of less than 1 micron, but also avoids the diffraction limit of visible light
  • Analysis of Visible Light Images
    is positioned with a lateral view into the chamber (Fig. 1) to collect high resolution 12-bit images of unfiltered plasma emission. Digitally stored images are used to establish shot-to-shot repeatability and resolve pinch velocities during reconnection. Images are processed with peak intensity fitting
  • Hidden Structures Made Visible: Non-invasive Art Inspection in the SWIR to Terahertz Realm (EN)
    Among the investigative techniques applied to art inspection and restoration, infrared imaging plays an important - and rapidly growing - role. By deploying appropriate sensors and cameras with high resolution art restorers and conservators can effectively engage in the examination of valuable art
  • Top-notch Space Technology Serving the Industry
    Xenics, Europe's leading developer and manufacturer of advanced infrared detectors, cameras and customized imaging solutions from the LWIR to the visible realm, comes to SPIE DCS 2016 with a host of new developments, among them the first performance results of a family of high-resolution SWIR
  • Hubble Captures Deep Impact's Collision with Comet
    by the Advanced Camera for Surveys' High Resolution Camera. The observations by the Deep Impact camera and the Hubble telescope complement each other. The camera aboard the Deep Impact spacecraft will provide a close-up view of the comet, from more than 300 miles away. The Hubble telescope, from its distance
  • Microscopy of Biological Sections using a Low Voltage STEM Technique (S-5200 SEM 102)
    A low voltage STEM technique using a scanning electron microscope (SEM) allows high contrast images owing to high electron scattering and making visible subtle changes of densities and compositions in specimen structures. This technique has long been used for microscopy of unstained polymers
  • Smart Computing Article - Video Components
    Flat-panel LCDs cost more than the traditional CRT monitors, but they offer plenty of visible benefits --literally --especially for users who must look at the monitor for several hours per day. Visit your local computer store and compare both types of monitors to determine whether the sharper
  • Spectroscopic Diagnostics of an Atmospheric Microwave Plasma
    carried out to better understand this particular. atmospheric pressure plasma torch. An experimental device has been modified with. extra visible access for radial and axial profile measurements. Diffraction limited fiber. optic plasma views and high-resolution grating spectrometer instrumentation

More Information Top

Lock Indicates content that may require registration and/or purchase. Powered by IHS Goldfire