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Hybrid Parameter Metrology Equipment
-related products, suppliers, datasheets and CAD.|
Product Announcements
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Lapmaster International 
Lapmaster International 
Grainger Industrial Supply 
SemiProbe
Fiberoptics Technology, Inc.
Medit |
Products/Services for Hybrid Parameter Metrology Equipment
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Surface Profilometers - (190 companies)...specific parameters. Choices for measurement capabilities include: roughness, spacing, waviness, and hybrid parameters; automatic defect classification (ADC); flatness, thickness, and step height; lay or pattern; and warp or bow. There are many common... Search by Specification | Learn More -
Surface Metrology Equipment - (300 companies)Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness, and defects. How to Select Surface... Search by Specification | Learn More -
Metrology Fixtures and CMM Fixtures - (55 companies)...fixtures are used with shop floor gaging systems such as those used in the automotive industry. Metrology fixtures and CMM fixtures also include OQ room fixtures, products that are designed for use in clean rooms, laboratory instruments and equipment. Learn More -
Semiconductor Metrology Instruments - (179 companies)Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers... Search by Specification | Learn More -
Dimensional Measurement and Metrology Services - (215 companies)...and metrology services use a variety of instruments and equipment to measure parts. A dimensional measurement system is a complete set of measuring instruments and equipment. Dimensional laboratory metrology may involve coordinate metrology and surface... Search by Specification | Learn More -
Lithography Equipment - (64 companies)Lithography equipment transfers circuit or device patterns onto a substrate using a patterned mask and a beam of light or electrons to selectively expose a photoresist layer. Overlay metrology systems align the pattern masks or reticules... Learn More
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Filtration Equipment - (1139 companies)Filtration equipment is used to filter, thicken or clarify a mixture of different elements. There are several different ways to classify products. Examples include by driving force (gravity, pressure, vacuum centrifuge); filtration mechanism (filter... Search by Specification | Learn More
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Motor Test Equipment - (31 companies)Motor test equipment is used to measure and evaluate various electrical characteristics and performance parameters of motors. Motor test equipment can be either offline with no power supplied to the motor, or online where power is applied... Search by Specification | Learn More
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Thin Film Equipment - (309 companies)Thin film equipment uses vacuum processing for the modification of surfaces using CVD, PVD, plasma etching, and thermal oxidation or ion implantation. Thin film equipment is vacuum process equipment for the deposition or modification of thin films... Search by Specification | Learn More
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Mechanical Testing Equipment - (391 companies)Mechanical testing equipment covers devices used for adhesion, compression, drop (shock), tensile, vibration and fatigue testing. The growing importance of quality control and assurance in production has contributed to an increasing demand... Search by Specification | Learn More
Product News for Hybrid Parameter Metrology Equipment
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MTI Instruments Inc.
Wafer Metrology Measurement Toolto generate a full 3-dimensional image of the wafer. Easy to Use.... The standard Windows® user interface makes the Proforma 300SA easy to use and set-up. Each measurement and machine parameter is selectable from a list of standard options. The control software has three levels of security, from a production environment to a full engineering analysis of wafer geometry. Customized data reports, as well as the ability to export measurement data to any spreadsheet add the ability to match the Proforma... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc. -
Parameter Generation & Control, Inc.
Parameter Stability StorageParameter provides off-site stability storage space for the storage of products that require ICH specified environmental conditions. Our GMP facility in Wilson, North Carolina contains rooms and chambers that have been mapped and validated for FDA mandated long and short-term shelf life studies under various temperature and humidity requirements. This includes intermediate testing and accelerated testing per ICH Q1A (R2). In addition, the Wilson facility is available for contingency management... (read more) -
Metal Cutting Corporation
Cleanroom MetrologyOur cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more)Browse Surface Preparation Services Datasheets for Metal Cutting Corporation -
Mettler-Toledo Process Analytics
Transmitter for Multi-parameter Process ControlThe M700 is a flexible measuring system for continuous measurements in the field of liquid analysis. The M 700X is intended for operation in locations subject to explosion hazards which require equipment of Group II, device category 2(1), gas/dust. Thanks to its modular design, the M700 can easily be adapted to your measuring task. Flexible use of plug-in modules allows combined measurements as well as later expansions or modifications. The measured variables depend on the measuring modules... (read more)Browse pH Instruments Datasheets for Mettler-Toledo Process Analytics -
Lapmaster International
Lapmaster FTP 130 for MetrologyLapmaster International LLC presents the FTP 130 as a new product addition to its Metrology Line. The FTP 130 is a 3 way measuring system which accurately measures the flatness, thickness and parellelism of both 1 and 2 sided parts. Up to two different functions can be used simultaneously to measure parts as thin as 0.20mm or as thick as 200mm. It also comes with a new analog-digital display that elimates the possibility of any inaccuracies. This unit provides a very cost effective, compact... (read more) -
BRL Test, Inc.
Advantest R3770 Network Analyzer S-Parameter 20GHzThe R3770 Network Analyzer is a high-performance multi-port analyzer designed with a greater emphasis on measuring passive components. 300KHz - 20GHzAll models have the software fixture function that perform real-time simulation of virtual matching circuits and standardized impedance conversion in addition to S-parameter analysis.At the world's fastest high-speed sweep of 5 µs/point, simulations of even complex analysis are accomplished instantly. More-over, multi-port models can perform... (read more)Browse Network Test Equipment Datasheets for BRL Test, Inc. -
MSI-Viking Gage
Outsource All Your Metrology NeedsMSI-Viking Gage can customize and administer a Total Solution Program to manage the calibration, maintenance and inventory control of all your company's metrology equipment. Fully Customized Total Solution Programs. There is no charge to you for us to meet with you, evaluate your needs and develop a program to meet your company's very specific requirements and wishes. Your Total Solution Program can include any combination of these services tailored to your business: Regularly scheduled... (read more)Browse Dimensional Measurement and Metrology Services Datasheets for MSI-Viking Gage -
Esterline Interface Technologies
Hybrid KeyboardsHYBRID KEYBOARDS COMBINE TWO OR MORE SWITCH TECHNOLGIES. Whether you require an intricate device incorporating multimedia options, cursor control, and touch screen or perhaps just a single-station keypad, Advanced Input Systems is dedicated to providing end-to-end solutions. Rapidly and cost effectively. Hybrid keyboards use a combination of two or more switch technologies. Hybrids are particularly useful when a high-speed typing array is combined with a large number of special function keys... (read more) -
General Oceanics, Inc.
Multi-Parameter ProbeThe Idronaut Ocean Seven 316 Multi-Parameter Probe is ideal for scientific, research and monitoring applications. It is equally suitable for inshore operation or from small outboards or large ocean vessels. The instrument is microprocessor-controlled and can measure, store and transmit sensor data. Internal or external submersible battery packages permit continuous probe operation, for 20 or 100 hours respectively. Rechargeable or lithium batteries can be used alternatively. The probe can... (read more)Browse Water Quality Testing Instruments Datasheets for General Oceanics, Inc. -
Mettler-Toledo Process Analytics
Multi-parameter transmitter M400Advanced ISM for low cost of ownership and higher reliability. Keep your process under control with real-time status information from the sensor for true predictive maintenance. The Dynamic Lifetime Indicator (DLI) tells you when the sensor needs to be replaced. Only calibrate when necessary: The Adaptive Calibration Timer (ACT) monitors the time to next calibration. Versatility thanks to mixed-mode input. The M400 can input either any analog or innovative ISM sensor. You decide which sensor... (read more)Browse Universal Process Controllers Datasheets for Mettler-Toledo Process Analytics
Conduct Research
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MICRO: Integrated metrology beginning to measure up to expectations
and defect density the most critical yield parameter. The definition of defects has been enlarged to include "anything that adversely affects device performance." The new definition places even more demands on inspection and review tools, the analyst pointed out. In the thin-film metrology arena, new...
Engineering Web Search: Hybrid Parameter Metrology Equipment
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Cea Leti - CEA-Leti has developed a way to reduce measurement... CEA-Leti?s hybrid metrology project targets better R&D cycle times and yields at sub-28nm nodes |
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An Integrated System of Optical Metrology for Deep Sub-Micron... An Integrated System of Optical Metrology for Deep Sub-Micron Lithography by Xinhui Niu B.S. (University of Science and Technology of China, Hefei, |
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The Economic Impact of Metrology Methods in Semiconductor... 3 2. Analytical Models of Metrology Methods ................................................. 7 2.1. Overall Equipment Efficiency (OEE) 2.2. A |
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Nanometrology - Wikipedia, the free encyclopedia Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. |
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ANTD Projects, Activites and Areas of Interest WDM Network Metrology - The objective of this project is to accelerate the development of multi-vendor interoperable metropolitan/local access |
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1 The metrology system data from each test are shifted with respect to the robot motion by the amount of time the metrology system and the robot |
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Webcasts - Automotive Engineering International Online Beyond hybrid and electric vehicles, alternative fuels, such as natural gas, hydrogen, and advanced biofuels including cellulosic ethanol, are making See SAE International Information |
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Manufacturing - SAE Vehicle Engineering Online The other key parameter in deciding whether ?lay flat and form? is appropriate for any given component concerns the characteristics of the material See SAE International Information |
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IEEE - Fellow Class of 1994 H. Thomas Banks for contributions to estimation and control of distributed parameter systems |
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IEEE - Fellow Class of 2001 John Allen Burns for contributions to the identification, control and optimization of distributed parameter systems |
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