Products/Services for Hybrid Parameter Metrology Equipment
Surface Metrology Equipment - (317 companies)
Surface Profilometers - (201 companies)
Form Gages and Form Gaging Systems - (87 companies)
Dimensional Measurement and Metrology Services - (227 companies)
Metrology Fixtures and CMM Fixtures - (58 companies)Metrology fixtures and CMM fixtures are used to hold and position parts, probes, or workpieces during dimensional gaging and other measurement operations. Metrology, the science of measurement, entails both practical and theoretical considerations... Learn More
Semiconductor Metrology Instruments - (193 companies)
Wafer and Thin Film Instrumentation - (369 companies)
Ceramic Bearings - (93 companies)
Transformer Test Equipment - (57 companies)
Motor Test Equipment - (41 companies)
Product News for Hybrid Parameter Metrology Equipment
PhotopsTM, Photodiode-Amplifier Hybrids The Photop ™ Series, combines a photodiode with an operational amplifier in the same package. Photop general-purpose detectors have a spectral range from either 350 nm to 1100 nm or 200 nm to 1100 nm. They have an integrated package ensuring low noise output under a variety of operating conditions. These op-amps are specifically selected by OSI Optoelectronics engineers for compatibility to our photodiodes. Among many of these specific parameters are low noise. Low drift and capability... (read more)Browse Photodiodes Datasheets for OSI Optoelectronics
MTI Instruments Inc.
Wafer Metrology Measurement Tool are used to generate a full 3-dimensional image of the wafer. Easy to Use.... The standard Windows ® user interface makes the Proforma 300SA easy to use and set-up. Each measurement and machine parameter is selectable from a list of standard options. The control software has three levels of security, from a production environment to a full engineering analysis of wafer geometry. Customized data reports, as well as the ability to export measurement data to any spreadsheet add the ability to match... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
Metrology Software for Inspection Machines HEIDENHAIN ’s latest version of the PC-based QUADRA-CHEK metrology software provides advanced functionality for quality control inspection measurement machines. Named the QUADRA-CHEK IK 5000, this release of version 3.0.0 software has made a number of improvements which makes it possible to conveniently perform 2-D and 3-D measuring tasks in the field of metrology bringing both newer technology and retrofit ability to users. This powerful IK 5000 inspection package builds upon... (read more)
Multi-Gas Monitor - Set Your Own Parameters The glove-tested Prot ég é is easy to handle in any situation with an intuitive user interface and a simple two-button operation that makes calibration and basic operation virtually thought-free. Designed to monitor potentially hazardous levels of combustible gases, oxygen enrichment or depletion, carbon monoxide, and hydrogen sulfide, the portable Prot ég é, like our complete line of personal safety equipment, is simple to use and incredibly durable,... (read more)Browse Gas Sensors Datasheets for Scott Safety
Bruker Nano Surfaces Division
Bench Top 3D Surface Metrology printing, and medical metrology applications. With its combination of advanced interferometric design and ease of use, the ContourGT-K0 is both a perfect entry platform for dedicated non-contact pass-fail measurements and an expert-level tool for developing and testing critical surface texture parameters. (read more)Browse Specialty Microscopes Datasheets for Bruker Nano Surfaces Division
Parameter Generation & Control, Inc.
Parameter Stability Storage Parameter provides off-site stability storage space for the storage of products that require ICH specified environmental conditions. Our GMP facility in Wilson, North Carolina contains rooms and chambers that have been mapped and validated for FDA mandated long and short-term shelf life studies under various temperature and humidity requirements. This includes intermediate testing and accelerated testing per ICH Q1A (R2). In addition, the Wilson facility is available for contingency management... (read more)
MicroGrid® and PolyGrid® Parameter Advantages of Dexmet ® Filter Media Support: Dexmet offers a wide range of expanded metal foils and can produce rolls up to 1,200mm (48 ”) in width. Dexmet ’s precision expansion process ensures high reproducibility leading to a more consistent final product and lower cost of quality. Dexmet ’s expansion process produces more finished product per pound of raw material than perforation. Scrap is also minimized because there is virtually no waste. The expansion process is the... (read more)
LaCroix Optical Co.
Metrology Capabilites Four Zygo ® GPI XP phase shift interferometers. More than 30 shop floor interferometers. Trioptics Opticentric ®/Optispheric ® devices. Mitutoyo Coordinate Measuring. Perkin Elmer Lambda 35, 900 and 950 spectrophotometers. Multitudes of Spherometers and Micrometers. Throughout the manufacturing process, dimensional and optical specifications are verified. According to our ISO 9001:2008 certification requirements, all of our metrology devices are regularly checked and calibrated... (read more)Browse Optical Coating Services Datasheets for LaCroix Optical Co.
Metal Cutting Corporation
Cleanroom Metrology Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more)Browse Surface Preparation Services Datasheets for Metal Cutting Corporation
High Speed Silicon Photodiode Preamp Hybrids Electro-Optical Characteristics. FCI-H125G-10 A low noise, high bandwidth photodetector plus transimpedance amplifier designed for short wavelength (850nm) high speed fiber optic data communications. The hybrid incorporates a 250µm diameter large sensign area, high sensitivity silicon photodetector. It also includes a high gain transimpedance amplifier producing a differential output voltage for latching to post amplifiers used in electro-optical receivers and transceivers for gigabit ethernet... (read more)Browse Photodiodes Datasheets for OSI Optoelectronics
06.12.2004. Microsurface Metrology. Seite 2 von 5. single-point tool, grinder wheel, or lapping material. It could also mean performing tool rotation or a grinder-. wheel dressing. Parameters on prints are calculated from the roughness component of the surface. To do this, it is necessary. to separate...
. 20%--while hybrid and spatial parameters are. more problematic. there are minor differences in peak height,. valley depth, and slope representation which. may have important effects on the. mathematics of parameter calculation. Parameter Evolution. As noted above, surface finish parameters began...
Engineering Web Search: Hybrid Parameter Metrology Equipment
Cea Leti - CEA-Leti has developed a way to reduce measurement...
CEA-Letiâ??s hybrid metrology project targets better R&D cycle times and yields at sub-28nm nodes
Statistical Methods for Enhanced Metrology in...
This drives the need for extensive control on processing equipment and on the efficiency of the associated metrology.
An Integrated System of Optical Metrology for Deep Sub-Micron...
An Integrated System of Optical Metrology for Deep Sub-Micron Lithography by Xinhui Niu B.S. (University of Science and Technology of China, Hefei,
Gaia in 2003 Michael Perryman Gaia Project Scientist...
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2009 IEEE Taxonomy Version 1.01 ?2009 IEEE. Created by The...
cross section ............Artificial satellites ........Radar equipment ............Earth Observing System ........Radar theory ............Low earth
IEEE SA - Instrumentation and Measurement Standards
Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XMLThis document specifies a framework for the
University-based Detector R&D for a Linear Collider...
Sufficient equipment and supply funds are included in order to purchase the interferometer, a vacuum system in which to run it, and piezo movers for
NanoScope IVa Controller Manual Software Version 6.13 Part...
118 - 100 (cleanroom) Copyright ? 2004,2005 Digital Instruments Veeco Metrology Group All rights reserved.
SSP 30312 Revision G Electrical, Electronic, and...
Controls for Ground Support Equipment (GSE) will be at the discretion of the Tier 1 contractors, except as stated in paragraph 3.2.4. Controls for