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Parts by Number Top

Part # Distributor Manufacturer Product Category Description
575 Digi-Key B&K Precision Test and Measurement IC TESTER/IDENTIFIER DIGITAL
APGDT002 Digi-Key Microchip Technology Test and Measurement IC MICROCONTROLLER
570 Digi-Key B&K Precision Test and Measurement IC TESTER
ICL8212CPA Radwell Intersil Test Equipment, Calibrator/Simulator IC CHIP COMPARATOR SINGLE BIPOLAR DIP 8PIN
550 Radwell Bk Precision Test Equipment, Signal/Function/Puls Generator TESTER FOR TRANSISTOR TTL IC
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  • An Introduction to Mixed-Signal IC Test and Measurement
    An Introduction to Mixed-Signal IC Test and Measurement. This text encompasses the testing of both analog and mixed-signal circuits, value-added benefits of testing to a manufacturer s product, as well as the role of the test engineer.
  • IC Test Sockets Perform Beyond 10GHz
    Semiconductor design engineers have been under constant competitive pressure to provide more features and functions, all with lighter weights, smaller sizes, and lower costs.
  • How Triz solved a sticky little IC problem
    tester lifts an IC into delicate finger contacts to test the chip. Innovation Workbench led the engineering team to replace the fragile finger contacts with conductive elastomers that would perform the same function. The larger blob in the center is an elastic material that pushes the IC away from
  • Semiconductor and IC Package Testing
    Semiconductor, microelectronic, and IC package testing includes testing at the wafer, die, or packaged IC level. Semiconductor and IC package testing services may provide wafer sort and packaging services in addition to component evaluation. In the packaging process, fabricated wafers are cut
  • Network IC Testing (.pdf)
    An Integrated Circuit chip manufacturer needs to verify performance of large shipments of IC chips before delivering them to their customer, a company that builds network systems. They need to test the Signal-to-Noise Ratio (SNR), the bit error rate, and other key IC chip performance parameters
  • Testing of a MEMS-based IC Probe with NANO INDENTER G200 and NanoSuite EXPLORER (.pdf)
    This application note describes the development of a novel method for testing an element in a micro-electromechanical system (MEMS) device. The MEMS device that is the subject of this testing is itself used to test integrated circuits (IC).
  • Application: Testing IC's Using Reed Relays
    Because there are so many gates to be tested, test speed is essential. RF reed relays are specially. designed to switch and pass fast digital pulses in a 50 ohm impedance. environment while offering excellent isolation.
  • Low-Cost Solutions for Chip and Board Level Tests
    Depending on the complexity of analog and digital technology-based IC chips and electronic boards, there are different test solutions available for R&D and production line testing. While complex and expensive chips and boards are tested with large, sophisticated testers, more cost-effective test

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