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  • Short-wave IR imaging invades machine vision
    and technically, in literally hundreds of industrial applications. And they offer benefits thermal and visible-spectrum cameras do not, creating a performance/life-cycle cost advantage for SWIR, even in applications where both thermal and SWIR can technically do the job. Like visible CCD and CMOS detectors, SWIR
  • Cameras at work
    used in the camera is not as critical as it once was. The old vidicon tubes have given way to solid-state imaging by chargecoupled devices (CCD) and complementary metallic-oxide semiconductor (CMOS) technology. While CCDs held sway over CMOS in the past, neither sensor today is superior to the other
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Technology Pte Ltd., a Singapore-based manufacturer of compound semiconductor epitaxial wafers for a total consideration of S$23 million (about $15 million). Filtronic partners for work on diamond semiconductors Element Six Ltd., formerly DeBeers Industrial Diamonds Ltd., has created a subsidiary company

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  • Multi-image position detection.
    We present simulated as well as experimental results showing an improvement by a factor of 3.6 to a positioning accuracy of better than three thousandths of a pixel for a standard industrial CCD sensor .
  • http://miun.diva-portal.org/smash/get/diva2:675731/FULLTEXT01.pdf
    The 3 CCD programmable industrial sensors provide an image of the scattered reflected line-of-light in synchronization with the laser sources at the pulse duration of 1 s.
  • Limitation of a Line-of-Light Online Paper Surface Measurement System
    The prototype projects a narrow line-of-light onto the moving paper-web and is captured by the industrial CCD imaging sensors , obliquely, at a low specular angle with a spatial resolution of 44 ?m along the line-of-light.
  • Subject index
    Bloomenthal, M., + , RA-M Sep 01 25-32 CAD/CAM; cf. Rapid prototyping ( industrial ) CCD image sensors .
  • Author index
    Bloomenthal, M., + , RA-M Sep 01 25-32 CAD/CAM; cf. Rapid prototyping ( industrial ) CCD image sensors .
  • Features :: NASA Tech Briefs
    The device features Class-1 CCD sensors ; industrial -grade construction and testing; thermal management and low noise performance; and precise alignment of a large sensor, with less than .1-millimeter variance.
  • Features :: NASA Tech Briefs
    The device features Class-1 CCD sensors ; industrial -grade construction and testing; thermal management and low noise performance; and precise alignment of a large sensor, with less than .1-millimeter variance.
  • Features :: NASA Tech Briefs
    The device features Class-1 CCD sensors ; industrial -grade construction and testing; thermal management and low noise performance; and precise alignment of a large sensor, with less than .1-millimeter variance.
  • Features :: NASA Tech Briefs
    The device features Class-1 CCD sensors ; industrial -grade construction and testing; thermal management and low noise performance; and precise alignment of a large sensor, with less than .1-millimeter variance.
  • Features :: NASA Tech Briefs
    The device features Class-1 CCD sensors ; industrial -grade construction and testing; thermal management and low noise performance; and precise alignment of a large sensor, with less than .1-millimeter variance.
  • Features :: NASA Tech Briefs
    The device features Class-1 CCD sensors ; industrial -grade construction and testing; thermal management and low noise performance; and precise alignment of a large sensor, with less than .1-millimeter variance.
  • Features :: NASA Tech Briefs
    The device features Class-1 CCD sensors ; industrial -grade construction and testing; thermal management and low noise performance; and precise alignment of a large sensor, with less than .1-millimeter variance.
  • Features :: NASA Tech Briefs
    The device features Class-1 CCD sensors ; industrial -grade construction and testing; thermal management and low noise performance; and precise alignment of a large sensor, with less than .1-millimeter variance.