Products & Services
See also: Categories | Featured Products | Technical Articles | Engineering Web Results-
Supplier: Unitron Ltd.
Description: For brightfield, darkfield, interference contrast and polarization
- Grade: Benchtop, Research, Other
- Microscope Type: Compound, Inverted, Polarizing
- Eyepiece Style: Trinocular
- Digital Display: Yes
-
Supplier: GENEQ, inc.
Description: The patented R-90 ring light is the first precision adjustable, 8-point ring light for stereo microscopes. It provides uniform, interference-free illumination over a wide distance range and enables users to precision adjust light output to specific applications. The R-90's "glide" system enables
-
Supplier: Hirox-USA, Inc.
Description: Differential interference lens, allow free maneuvering of lights
- Application: Biological / Life Science, Measuring / Toolmaker, Medical / Forensic, Metallurgical, Semiconductor Inspection
- Grade: Research
- Microscope Type: Portable Field, Other
- Computer Interface: Yes
-
Supplier: Enwave Optronics, Inc.
Description: Microscope System Near Infra-Red (NIR) Excitation at 785nm for Low Fluorescence Interference High Resolution/Sensitivity TE-Cooled CCD Spectrometer for Stable Operation Detachable Raman adaptor User Friendly Software Direct Export or Link to GRAMS and Excel for Post Processing and Modeling
- Application: Biological / Life Science, Gemological, Medical / Forensic, Semiconductor Inspection, Other
- Grade: Benchtop, Research
- Microscope Type: Laser / Confocal
- Computer Interface: Yes
-
Supplier: Olympus IMS
Description: The MX61L/ MX61, 300 mm/ 200 mm semiconductor inspection microscope provides exceptional image resolution and clarity through observation methods such as brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared and deep UV.
- Application: Semiconductor Inspection
- Grade: Benchtop
- Microscope Type: Compound
- Computer Interface: Yes
-
Supplier: Hitachi High Technologies America, Inc.
Description: World's highest resolution, acoustic & EM interference resistant
- Application: Biological / Life Science, Medical / Forensic, Metallurgical, Semiconductor Inspection
- Grade: Research
- Microscope Type: Scanning Electron Microscope (SEM), Other
- Image Analysis Processing Software: Yes
-
Supplier: Leica Microsystems, Inc.
Description: The Leica DMI6000 B inverted microscope for biomedical research offers Differential Interference Contrast (DIC) for relief imaging of specimens with varying indices of refraction. The intuitive, automated Leica DMI6000 B is ideal for fluorescence, live cell, time-lapse imaging, high-speed
- Grade: Benchtop
- Microscope Type: Inverted
- Eyepiece Style: Binocular
- Digital Display: Yes
-
Supplier: Olympus America Inc.
Description: Objective lenses dedicated to brightfield Plan Apochromat objective lens series with chromatic aberration corrected at highest level Optical performance (wavefront aberration) with a Strehl ratio*1 of 95% or more*2 assured first in the world Compatibility with a DIC (Differential Interference
- Lens Type: Objective Lens
- Optical Type / Correction Factor: Apochromat, Plan
Find Suppliers by Category Top
Featured Products for Interference Microscope Top
-
Leica Microsystems, Inc.
Ideal Microscope for Routine Inspection
This new Materials Microscope with LED Illumination is designed for routine inspection tasks in metallography, earth science, forensic investigation, and materials quality control and research. It offers users a state-of-the-art universal white-light LED illumination with high-quality Leica optics. SEE THE VIDEO DEMONSTRATION. The ultra-bright, high-power LED illumination provides users a constant color temperature of 4500 K for brightfield, darkfield, interference... (read more)
Browse Digital and Video Microscopes Datasheets for Leica Microsystems, Inc. -
Olympus IMS
USPM-RU Lens SpectralReflectivityMeasurementSystem
The USPM-RU III Lens Spectral Reflectivity Measurement System is designed to measure the reflectivity on lenses, flat glass, plastics and electronics components. The instrument speeds up quality control and R &D projects, by providing highly accurate reflectivity measurements without the need for time-consuming backside coating. Simple to use and fast, the USPM-RU III provides reflectivity measurements in seconds from 380 - 780nm wavelengths. (read more)
Browse Microscopes Datasheets for Olympus IMS -
Enwave Optronics, Inc.
MicroSense-N Low Cost Raman Microscope
for low fluorescence interference; 532nm DPSS laser also available. Adjustable laser power: 0 to ~300 mW (785nm)with frequency stabilization; 0 to ~50mW (532 nm). High Resolution/Sensitivity TEC-Cooled CCD Spectrometer for stable operation. Spectral Resolution: ~7 cm-1. Spectral Coverage: 100 - 3,300 cm-1. Detachable Raman adaptor for dual use as Raman microscope or portable Raman analyzer. User-friendly software. Direct export or link to GRAMS and Excel for post processing and modeling. Robust &... (read more)
Browse Raman Spectrometers Datasheets for Enwave Optronics, Inc. -
Enwave Optronics, Inc.
MicroSense-I/L High Sensitivity Raman Microscope
The Enwave µSense-I/L series Raman Microscopes are ideal for various academic, research, and industrial laboratory applications. These Raman microscopes are designed as a high performance and cost-effective solution for routine Raman microscopy. They are easy to use and reliable for your routine Raman microscopy applications. Product Highlights: Integrated Raman Microscope System with small footprint. Near infra-red (NIR) excitation at 785 nm for low fluorescence interference; 532nm also... (read more)
Browse Raman Spectrometers Datasheets for Enwave Optronics, Inc.
Conduct Research Top
-
Interferometric Microscopes
Interferometric microscopes use the interference patterns of light waves for precise determinations of distance, thickness, surface or step heights, wavelength, roughness and non-contact 3D surface profiles. As in conventional interferometers, measurements are made by analyzing the phase shift
-
Cases For Electronics of a Laser Scanning Microscope
tolerances. This plays an important part in view of the subject EMC (electromagnetic compatibility), which is also essential for hema. To protect the electronics of the microscope built into the case from high frequency electromagnetic radiation interference and to avoid emissions, a closed shield
-
Surface Profiling by Frequency Domain Analysis of White Light Interferograms
interferogram. Most optical profilers based on white light. process the interference data in order to determine the position of the coherence peak.4 These. profilers differ mostly in the way they detect and process the fringe-contrast envelope. Balasubramanian oscillates a reference mirror with a PZT
-
Residual Analysis of Oils and Fuels
changing these parameters. causes interference to subsequent production steps or. 2. The analySIS Filter Inspector provides fully automatic standards-compli-. SGS uses a special multi-filter holder insert which can have up to 9. ant and reproducible optical analysis, classification and documentation
-
What is Frequency Domain Analysis?
shifting interferometry (PSI), which allows us to transform the interference pattern electronically into a matrix of phase values. These phase values can then be directly related to relative height values, provided that the wavelength or optical frequency of the source light is known
-
Adaptive wavefront correction in two-photon microscopy using coherence-gated wavefront sensing
from individual scatterers. Interference effects between those waves cancel, except for extremely high or inhomogeneous densities of scatterers (M.R. and W.D., unpublished data). Because each scatterer acts as an independent source of a spherical wave, CGWS should thus not depend on the incoming
-
MICRO: Product Technology News (October 2000)
in an automated system. They can accommodate 8-in. wafers and 6-in.-diam masks. A single objective can be used with bright-field, dark-field, and differential interference contrast observation techniques. A digital fiber-optic amplifier comes in a remote control version that includes special
-
Basics in Microscopy
. Educational microscopes that pass through many hands are potential breeding grounds for germs. To solve this problem... Basics in Microscopy Mar 01, 2012 Article Read article. Differential Interference Contrast. The examination of live unstained biological specimens often suffers from poor
Engineering Web Search: Interference Microscope Top
-
ASTM B588 - 88(2010) Standard Test Method for Measurement of...
of Thickness of Transparent or Opaque Coatings by Double-Beam Interference Microscope Technique
-
ASTM B651 - 83(2010) Standard Test Method for Measurement of...
of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
-
Diffraction - Wikipedia, the free encyclopedia
Generation of an interference pattern from two-slit diffraction. Computational model of an interference pattern from two-slit diffraction.
-
Optics - Wikipedia, the free encyclopedia
model of light, which includes wave effects such as diffraction and interference that cannot be accounted for in geometric optics.
-
interference fringes - definition of interference fringes in...
interference microscope interference screw
-
ultrasound interference lines - definition of ultrasound...
interference (redirected from ultrasound interference lines)
-
Botany online: Microscopy - Polarizing and Interference...
physicist G. NOMARSKI developed the interference contrast microscope (also called differential interference contrast, DIC) in Paris during the middle
- Molecular Expressions Microscopy Primer: Specialized...