Interferometric Metrology System

Featured Products for Interferometric Metrology System Top

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  Nikon Metrology, Inc.
  iSpace Metrology System for Archeology

  Drawing of contexts, sections and site plans can easily consume a huge part of the total excavation time. For particularly complicated and detailed sites this can even rise to as much as half of the total project time. To increase the productivity of these dedicated activities, Nikon Metrology presents the Archeology variant of its iSpace large-scale metrology system. Trials at Mont Beuvray, France, have shown that the Archeology iSpace solution records data 50% to 90% faster compared... (read more)

  Browse Coordinate Measuring Machines (CMM) Datasheets for Nikon Metrology, Inc.
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  Nikon Metrology, Inc.
  Multi-Sensor 3D Metrology System HN-6060

  turbine blades, appliance housings and much more. "The HN-6060 multi-sensor system builds upon the Nikon Metrology portfolio of vision systems and 3D solutions." says Myles Richard, Managing Director of Americas for Nikon Metrology, "It addresses the need for fast, high-accuracy 3D inspection of complex shapes by combining innovative optical technology with the highest precision measurement hardware." The newly designed laser scanning sensor extracts the surface form and waviness data in one... (read more)

  Browse Metallurgical Microscopes Datasheets for Nikon Metrology, Inc.
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  Mahr Federal Inc.
  MarSurf™ WS 1 Optical Surface Metrology System

  and materials available these days, traditional stylus measurement is often not adequate to characterize the functional behavior of surfaces," said Pat Nugent, Vice President of Metrology Systems for Mahr Federal. "The MarSurf WS 1 can provide the three-dimensional recording and evaluation needed, as well as the non-contact measurement required by soft and sensitive materials. In addition, new processes are achieving ever higher levels of surface quality, greatly increasing the need for greater... (read more)

  Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc.
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  Metal Cutting Corporation
  Cleanroom Metrology

  Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more)

  Browse Surface Preparation Services Datasheets for Metal Cutting Corporation
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  Lapmaster International
  Lapmaster FTP 130 for Metrology

  Lapmaster International LLC presents the FTP 130 as a new product addition to its Metrology Line. The FTP 130 is a 3 way measuring system which accurately measures the flatness, thickness and parellelism of both 1 and 2 sided parts. Up to two different functions can be used simultaneously to measure parts as thin as 0.20mm or as thick as 200mm. It also comes with a new analog-digital display that elimates the possibility of any inaccuracies. This unit provides a very cost effective, compact... (read more)
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  PixeLINK
  Machine Vision Cameras for Metrology

  Metrology. To measure objects with precision, companies frequently turn to PixeLINK® machine vision cameras. Measure Complex Shapes. Organizations looking to measure irregular, complex or precision parts require a machine vision camera solution that offers a high frame rate, excellent image quality and high resolution. For these reasons, companies looking to develop metrology systems for electronics, semiconductors, or any complex manufacturing product choose PixeLINK® industrial cameras... (read more)

  Browse CCD Cameras Datasheets for PixeLINK
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  Rigaku Corporation
  TXRF-V310 Metrology Instrument

  TXRF analysis can gauge contamination in all fab processes, including cleaning, litho, etch, ashing, films, etc. The TXRF-V310 can measure elements from Na through U with a single-target, 3-beam X-ray system and a solid-state detector system. The TXRF-V310 includes Rigaku's patented XY θ sample stage system, an in-vacuum wafer robotic transfer system, and new user-friendly windows software. All of these contribute to higher throughput, higher accuracy and precision, and easy routine... (read more)

  Browse Semiconductor Metrology Instruments Datasheets for Rigaku Corporation
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  MTI Instruments Inc.
  Wafer Metrology Measurement Tool

  The Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are used... (read more)

  Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
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  Nikon Metrology, Inc.
  Automating Large-Scale Metrology Applications

  This revolutionary instrument often replaces large-scale metrology systems that struggle with parts that are too complex, too hard to reach, too delicate or too labor-intensive. Working with the new Laser Radar system yields impressive productivity gains in applications across numerous markets. Aviation metrology applications include the inspection of fuselage, wing, wing/body connections, landing gear, jet engine inlet cowl and many more. In the energy sector, Laser Radar systems are used... (read more)

  Browse Coordinate Measuring Machines (CMM) Datasheets for Nikon Metrology, Inc.
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  Visualization Sciences Group, Inc. (VSG)
  Zeiss's metrology software powered by OpenInventor

  Carl Zeiss Industrial Metrology GmbH (IMT) is a leader in the field of industrial metrology. IMT offers a wide range of products for measuring operations under different operating conditions (from the metrology lab to production measurement in rough production environments without air-conditioning) to the automotive, machinery and aviation industries. IMT also provides comprehensive services, ranging from professional service programming of industrial computer tomography to worldwide on-site... (read more)

  Browse Integrated Development Environment (IDE) Datasheets for Visualization Sciences Group, Inc. (VSG)