Products/Services for Interferometric Profilometer
-
Surface Profilometers - (202 companies)...resolution is the minimum profile-height resolution that a surface profilometer can attain. Lateral range is the spatial or linear range the instrument can measure across the sample or surface. For surface profilometers that measure surface roughness... Search by Specification | Learn More -
Wafer and Thin Film Instrumentation - (369 companies)Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More -
Styli and Probes - (80 companies)Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Styli and Probes Information. Styli and probes are slender rod-shaped... Learn More -
Semiconductor Metrology Instruments - (194 companies)...optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Semiconductor Metrology Instruments Information. Semiconductor metrology instruments are designed for wafer and thin film in-line inspection... Search by Specification | Learn More -
Interferometers - (116 companies)Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources. Search by Specification | Learn More -
Form Gages and Form Gaging Systems - (88 companies)Form gages and form gaging systems are used to inspect parameters such as roundness, angularity, squareness, straightness, flatness, runout, taper and concentricity. Form gages are similar to profilometers, inspection tools used to measure surface... Search by Specification | Learn More
-
Inertial Navigation Systems - (79 companies)Inertial navigation systems use a combination of accelerometers and angular rate sensors (gyroscopes) to detect altitude, location, and motion. They may also be capable of detecting attitude, position, velocity, temperature, or magnetic field. Search by Specification | Learn More
-
Imaging Workstations - (310 companies)Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More
-
Autocorrelators - (7 companies)...are used in pulsed lasers and ultrafast lasers. Types of Autocorrelators. Selecting an autocorrelator depends mainly on autocorrelator type. There are four basic product categories: intensity autocorrelators, interferometric autocorrelators, field... Learn More
-
Specialty Microscopes - (226 companies)Specialty microscopes are designed for specific applications such as metallurgy or gemology. They use specialized techniques or technologies such as acoustics to produce magnification. Search by Specification | Learn More
Product News for Interferometric Profilometer
-
Swissomation, Inc.
Profilometer Swissomation, Inc. uses a profilometer for accurate measurements of surface finishes. Our customers enjoy the satisfaction of well-planned and well-timed orders produced on some of the most advanced equipment available, including Vision Systems, CMMs, Comparators, Profilometers, Indicators, and many other instruments. Capabilities: Brown and Sharpe CMM. Touchprobe capability for measuring dimensional and wall thickness with both flat & rotary capabilities. Our newest optical vision system... (read more) -
Precitec, Inc.
CHRocodile Sensors materials. A wide range of optical probes allows topographic measurements from 10nm - 25mm and chromatic thickness measurements from 30 μm - 35mm. Interferometric mode enables measurement of transparent materials from 2 μm - 150 μm. The CHRocodile IT series and MI5 use infrared light with an advanced interferometric technique to measure the distance and thickness of semiconductor materials. With speeds up to 4kHz, it is possible to measure silicon wafers up to 1mm thick. APPLICATIONS... (read more) -
Precitec, Inc.
Measurement of Doped Wafers and TSVs Modifications have been made to several existing CHRocodile sensors to enable measurement on unique semiconductor materials, ranging from glass, sapphire and highly doped wafers, to TSVs and other structured devices. Capable of measuring wafer thickness, topography or film thickness at high speeds, CHRocodile sensors are available for nearly all materials and applications. With the semiconductor and electronic industries dependant on high quality standards, the high precision of the CHRocodile... (read more) -
Precitec, Inc.
On-Line Glass and Plastic Inspection Non-contact Thickness Measurement of Containers. Precitec is now offering several multi-point, non-contact instruments for measuring container thickness inline. The CHRocodile M4 has been proven for glass container thickness inline. There are several different sensors available for the measurement of plastic containers and films depending on your shapes, sizes and colors. High temperatures of 700 °C (1200 °F) are not a problem for the robust optical probe, which makes this... (read more) -
Bruker Nano Surfaces Division
Metrology for Process Quality Control The Contour GT-X 3D Optical Microscope family provides the highest performing, non-contact surface measurements for laboratory research and production process control. The pinnacle of ten generations of interferometric design, the ContourGT-X systems deliver the highest measurement speed, resolution, repeatability, accuracy and production throughput of any optical profiler. Every aspect of their design is optimized. for application-specific performance and ease of use, from 64-bit, multi-core... (read more) -
Precitec, Inc.
Non-contact Sandwich Measurements using one on the top and the other on the bottom of the material, thus also giving a total thickness for the entire material. Another technique used by the CHRocodile sensors is an interferometric type of measurement, which can utilize white light or infrared, enabling the measurement on even more materials. All CHRocodile sensors have a few common traits. They operate at a high speed, ranging from 2kHz to 70kHz. The probes are manufactured with tight specifications, utilizing high quality optics... (read more) -
Bruker Nano Surfaces Division
Bench Top 3D Surface Metrology printing, and medical metrology applications. With its combination of advanced interferometric design and ease of use, the ContourGT-K0 is both a perfect entry platform for dedicated non-contact pass-fail measurements and an expert-level tool for developing and testing critical surface texture parameters. (read more) -
National Photocolor Corp.
Two of the most important attributes of pellicles . Unpolarized light. Interference effects shown. R/T ratio will vary with wavelength and change of angle. Using improved manufacturing techniques NPC now provides Ultraflat Pellicles with up to 1/10 reflection on central areas of smaller diameter pellicles. Better than 1" wave reflection flatness can be obtained on larger diameter pellicles. The central 75% to 80% central area of a circular pellicle is normally specified as the best area for reflection flatness. Computer reduced interferometric... (read more) -
National Photocolor Corp.
Specialty Pellicles wave reflection flatness can be obtained on larger diameter pellicles. The central 75% to 80% central area of a circular pellicle is normally specified as the best area for reflection flatness. Computer reduced interferometric documentation can be provided. Specially manufactured pellicles with transmitted wavefronts of better than 1/10 are available. Thickness uniformity of one fringe over large areas are also available. Computer reduced interferometric documentation can be provided. IR Pellicle... (read more) -
Swissomation, Inc.
“Everything We Machine, We Guarantee.” At Swissomation, we work with each customer on an individual basis, to meet or exceed their quality requirements. Our quality management system is ISO 9000 compliant. Our customers enjoy the satisfaction of well-planned and well-timed orders produced on some of the most advanced equipment available, including: Vision Systems. CMMs. Comparators. Profilometers. Indicators. Aand many other instruments. In addition, our services include lot tracking, material certification, and SPC when needed... (read more)
Conduct Research
...coherence. interferometer with a common path configuration. Figure 1. Fiber-based profilometers with miniature. probes (3mm in diameter) are used to inspect "blisks". (bladed disks used in aeronautics). Figure 2. Basic configuration of an interferometric detector. Probes. Small diameter probes originally...
Engineering Web Search: Interferometric Profilometer
A Dynamic 3-D Surface Profilometer With Nanoscale Measurement...
A Dynamic 3-D Surface Profilometer With Nanoscale Measurement Resolution and MHz Bandwidth for MEMS Characterization
Photonic Microcantilevers With Interferometric Bragg Grating...
Photonic Microcantilevers With Interferometric Bragg Grating Interrogation
Mr. Slawomir Tomczewski : SPIE.org Profile
Optical Manufacturing and Testing VII - Optical Engineering +...
Frequency response of the three Gaussian beam interferometric profilometer Surface reconstruction based on transmission interferometric testing
Raytheon Company: Design and Fabrication Capabilities
Laser interferometric measurement of reflector groove depth
See Raytheon Company Information
The MEMS 5-in-l Reference Materials (RM 8096 and 8097) Janet...
Thickness 4 step height test interferometric Used in the determination of thin film material (RM 8096) structures microscope parameters, such as
See Electronics and Electrical Engineering Laboratory Information
In situ 3D profilometry of rough objects with a lateral...
Ignacio ??lvarez Abstract: In this paper we describe an interferometric profilometer which provides absolute distance measurements of rough surfaces
Surface observation and measurement techniques to study the...
An interferometric profilometer allows to characterize the morphology of the slip markings with surface relief measured at the end of the test.
ESA Portal - Roundtable: New radar imaging technologies for...
a member of the U.S. Navy Research Interaction program on Wideband Interferometric and Polarimetric Surveillance and Sensing.
Argonne CNM: Nanofabrication and Devices Capabilities
Interferometric Lithography System Laser Pattern Generator: Microtech LW405 Three-Dimensional Contact Profilometer: Dektak 8
