Products & Services

See also: Categories | Featured Products | Technical Articles
Page: 1 2 Next

Conduct Research Top

  • Utilizing Laser Technology in Dimensional Metrology Applications
    more accurate than other methods. Labmaster instruments use laser interferometers for the following reasons:. Utilizing Laser Technology in Dimensional Metrology Applications. UTILIZING LASER TECHNOLOGY. IN. DIMENSIONAL METROLOGY APPLICATIONS.                                                . Daniel J
  • Laser Line Scanning (.pdf)
    metrology provides. The laser line probe can digitize the shape and position of an. object that is placed in its field of view. A laser line is generated by. “fanning” out a laser light beam into a sheet-of-light. When that. sheet-of-light intersects an object, a bright stripe of light can be. seen
  • Laser Trackers: Defining Accuracy (.pdf)
    accuracy. This white paper is intended to inform the reader of the meaning of accuracy in the context of metrology in general and in particular for the use of a laser tracker instrument. ./84c7c838-eb57-4350-a231-3e0a8ce742fd Technology White Paper. Defining Accuracy. Background. Measurement
  • Optical Metrology for Large Telescope Optics
    In recent years the demand for meter-scale optical elements has increased significantly, driven by growth in terrestrial and satellite-based astronomy, and defense and security applications. Laser interferometry is used throughout the manufacturing of large optics to ensure conformance to demanding
  • How a helium neon gas laser works
    in the red at 632.8nm, although many users find it beneficial in the. green at 543.5nm, yellow at 594.1nm, orange at 611.9nm, and in the infrared at 1523 or 3921nm. HeNe lasers have been used extensively for such applications as holography, spectroscopy, metrology,. reprographics, laser light
  • Advances in Interferometric Metrology
    . interferometer for testing spherical mirrors is shown in Figure 1. A magnified image of the scatterplate is shown in the. upper left corner of the figure. A small circular aperture is illuminated with a laser or broadband source producing a. source of limited extent for the interferometer. A focusing lens
  • MICRO: Defect/Yield Analysis & Metrology
    are especially valuable for CMP process development and control. The optoacoustic technique generates and detects ultrasonic waves using laser light, and, in contrast to profilometry, which measures surface topography, it measures metal thickness directly. For CMP applications, commercially available
  • Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM
    . a. scanning (blue) laser confocal microscope, SLCM (Olympus LEXT OLS3100), that provides spatial. resolution in the z-direction by eliminating out-of-focus information in object planes of the optical. system, and 2. a commercial software package [4] that extracts height information from sets of 2 or 3