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Laser Topography Instrument
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Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness, and defects.
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Corning Specialty MaterialsDescription: First optical instrument to provide extensive quantification of o.d. & i.d.
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Bruker Nano Surfaces DivisionDescription: For unparalleled accuracy and precision – the kind needed for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features -- the InSight™ 3D Atomic Force Microscope (AFM) is the clear choice. InSight 3DAFM provides the accuracy needed to improve
- Application: Semiconductor Inspection
- Grade: Research
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Bruker Nano Surfaces DivisionDescription: The instrument provides high resolution topography measurements at the molecular level with the capability to perform chemical analysis by Raman spectroscopy. NEOS SENTERRA facilitates to study the region of interest of any sample by AFM and Raman subsequently, without a dislocation of the sample
- Spectrometer Type: Raman Spectrometer
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Supplier: Bruker Nano Surfaces DivisionDescription: The instrument provides high resolution topography measurements at the molecular level with the capability to perform chemical analysis by Raman spectroscopy. NEOS SENTERRA facilitates to study the region of interest of any sample by AFM and Raman subsequently, without a dislocation of the sample
- Spectrometer Type: Raman Spectrometer
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Supplier: Bruker Nano Surfaces DivisionDescription: The instrument provides high resolution topography measurements at the molecular level with the capability to perform chemical analysis by Raman spectroscopy. NEOS SENTERRA facilitates to study the region of interest of any sample by AFM and Raman subsequently, without a dislocation of the sample
Featured Products for Laser Topography Instrument Top
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PLX BMRs are used as targets for laser trackers. These instruments measure distances and coordinates to a very high degree of precision. As a single surface invariant reflector, the BMRs provide great accuracy, together with a constant optical path difference. This is especially important because it allows accurate distance measurement without the need to account for refraction, a common problem when using solid, prism type retroreflectors. PLX produces BMRs for all major laser tracking... (read more)Browse Laser Optics, Heads, and Beam Delivery Components Datasheets for PLX Inc. -
FiberCube® Laser Marking Systems integrate the FiberStar laser marking source and provide controllable pulse rates that can be adjusted from continuous wave to single pulse for deep laser marking, cutting, or fast throughput thermal mark applications at up to 200 characters per second. FiberCube® Laser Marking Systems are ideal for a wide range of applications including flat surfaces, advanced integrated XYZ motion for step-and-repeat laser marking, or coordinated rotary motion for seamlessly... (read more)
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is fully compliant with ISO requirements, designs and manufactures products that meet Military Specs and has received over 20 patents for its innovative optical products. You'll find PLX instruments in such diverse applications as spectroscopy, boresighting, beam alignment and delivery, ultra-fast phenomena research, laser delay lines, military fire control, environmental monitoring, satellite ranging and laser resonators. (read more)
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D450 includes everything you need to perform the alignment measurements. The Dual laser system emmulates reverse-dial methods. (2) Laser/position sensors and a Display Unit provide live moves on the graphical screen. Programs include: horizontal machine alignment, softfoot, and a printer port and memory for 1000 alignments. Maximum distance is 10 meters. Our specifications rival the best available alignment tools. The system is a tool designed out of billet aluminum, not plastic... (read more)
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Improve the cradle-to-the-grave traceability and tracking of your components, tools, and instruments by permanently laser marking each with a serial number, part number, barcode, data matrix, QR Code, or UID Codes. RMI Laser has developed custom software packages, not excluding the UID Wizard (only one in the world) for manufacturers providing them with Database Recognition, Serial Number Duplicate Checking, and the peace of mind to know your markings are indelible and will last the life... (read more)Browse Laser Engraving and Laser Marking Machines Datasheets for RMI Laser, LLC
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Laser Welding from Joining Technologies. Joining Technologies performs ultra-high precision welding for demanding applications using the most modern laser equipment available today. Our experienced laser welding engineers have the knowledge and skills to create the most critical surgical instruments, sensor assemblies and other precision devices. Employing the latest in motion control and high-speed beam scanning, we're able to produce precision welds at incredible speeds that simply aren't... (read more)Browse Laser Welding Services Datasheets for Joining Technologies / Laser Joining Technology
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Pocket Laser Tach 200 is a digital, battery-powered portable optical tachometer, which operates up to 25 feet from a reflective target using a laser light source. The ergonomic design allows safe, direct line-of-sight viewing of both the target and the display at the same time, while providing a no-slip rubber surface for single hand operation. Multi-Function PLT200 is a 32 function Tachometer/Ratemeter, Totalizer/Counter and Timer (stopwatch), which is programmable in both English and Metric... (read more)Browse Tachometers Datasheets for Monarch Instrument
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For high-end OEM applications requiring superior optical quality and ultra-stable temperatures, wavelengths, and output powers, Power Technology, Inc.'s Instrument Quality (IQ) series laser modules are the perfect solution. IQ modules feature a precision current source and a PID temperature controller. They incorporate quality glass lenses and can host laser diodes with wavelengths from 370 to 1600nm. IQ modules can operate in either constant current or automatic power control mode. In addition... (read more)Browse Diode Lasers Datasheets for Power Technology, Inc.
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Digital laser scanner LC15Dx from Nikon Metrology brings. scanning to the range of tactile measurement accuracy. BRIGHTON, MI - March 1, 2012 - For over a decade, Nikon Metrology pioneered laser scanning and gradually sharpened the capabilities of this non-contact measuring technology. Nikon's superior optics combined with innovative 3D laser scanning technology resulted in this new, groundbreaking Nikon scanner. The LC15Dx digital laser scanner is a new milestone, as it brings laser scanning... (read more)Browse Dimensional and Profile Scanners Datasheets for Nikon Metrology, Inc.
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Throw away the straight edge and string! L80 Laser Pulley Alignment Tool provides a precision line laser and (3) machined targets. Operation is simple: mount the aluminum laser source, with it's intergated magnets to the movable pulley/sheave. Mount the adjustable magnetic Targets to the stationary pulley/sheave. The visual laser becomes your line and when all three targets agree, the system is properly aligned. The L80 Laser is fast, safe and simple to operate. No Training, no computers... (read more)Browse Stroboscope Instruments Datasheets for Monarch Instrument
Conduct Research Top
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LVDT Use in a Scanning Laser Tomography Instrument
lvdt08 LVDT Use In A Scanning Laser Tomography Instrument. At one time, everyone feared a glaucoma test when visiting The final data is presented to the optometrist for analysis on a. the optometrist - squirming in your chair while waiting for familiar Microsoft Windows platform...
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MICRO: Defect/Yield Analysis & Metrology
technique generates and detects ultrasonic waves using laser light, and, in contrast to profilometry, which measures surface topography, it measures metal thickness directly.3 For CMP applications, commercially available optoacoustic metrology instruments can be used to characterize all process stages...
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Using Space-Age Technology to Open A New Window into the World of Horticulture
to that used to photograph the surface of Mars, agricultural scientists are peering into the surface topography of nursery crop leaves to see what pesticides and biological control organisms work best, says plant pathologist Charles R. Krause. He's with the ' Application Technology Research Unit...
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Spatial Coherence in Interferometry
in designing commercial interferometers is to reduce the intrinsic measurement noise in the complete band of spatial frequencies which the instrument is able to measure. Here the large coherence of the laser turns out to be a problem, 'collecting” artifacts associated with the optical surfaces used...
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MICRO:Product Technology News (Sept '99)
The SEMVision cX scanning electron microscope automatically reviews and classifies wafer defects in advanced semiconductor production lines. The system can examine up to 500 defects per hour and offers color multiple-perspective SEM imaging for enhanced topography and material information about...
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MICRO: Defect Analysis and Metrology - Ge (Feb 2000)
flagged by scanning laser scattering inspection tools. This system can also identify and classify defect types based on topography. Actual defect sizes measured by AFM-DF often differ from estimated defect sizes captured by scanning laser scattering inspection tools. Such errors, caused...
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MICRO: Defect Analysis
that the laser-based bright-field tool could detect voids as small as 30 nm. Since STI voids are typically associated with surface topography, their signal-to-noise level was improved dramatically by employing the 3-D channel. A proprietary spatial filtering method, optimized for the repetitive...
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MICRO:Product Technology News (March '99)
low-force, low-noise scanning for the nondestructive measurement of processed wafers. Additional features include a vibration isolation platform and noise dampening. Surface-imaging software displays wafer topography in three dimensions for surface area analysis. Available in diameters from 100 to 300...
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MICRO: Spotlight
contains chemical activator, inhibitor, planarizer (cAiP), which allows slurry to preferentially remove the protruding topography or active area in an STI pattern without dishing the recessed, or trench, area. The formulation also features AutoStop, which automatically stops removing the fill oxide...
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MICRO: Products
The WM-5000 unpatterned-wafer inspection system for 0.07-um design rules uses a 400-nm-wavelength laser light source (a violet laser diode). Distributed by Macrotron Process Technologies in Europe, the tool achieves very high detection sensitivity down to 0.041 um. The system can inspect 100 300-mm...
Engineering Web Search: Laser Topography Instrument Top
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The Geoscience Laser Altimeter System (GLAS) Homepage GLAS (the Geoscience Laser Altimeter System) is the first laser-ranging (lidar) instrument for continuous global observations of Earth. |
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NASA: ICESat GLAS (the Geoscience Laser Altimeter System) is the first laser-ranging (lidar) instrument for continuous global observations of Earth, which will |
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LIDAR - Wikipedia, the free encyclopedia A FASOR used at the Starfire Optical Range for LIDAR and laser guide star experiments is tuned to the sodium D2a line and used to excite sodium atoms |
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Laser rangefinder - Wikipedia, the free encyclopedia The precision of the instrument is determined by the rise or fall time of the laser pulse and the speed of the receiver. |
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CSR Remote Sensing of the Environment The LIDAR system combines a pulsed, solid-state laser, an inertial motion unit (IMU), and a geodetic GPS receiver in a compact and modular |
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altm Rotating optics in the instrument's sensor head scans the laser across the ground, illuminating a swath under the aircraft. |
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MPS: BELA on BepiColombo The Laser Altimeter topography data will be used to correct the gravity measurements for the effects of surface topography and thereby allow an |
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Building and Fire Publications Characterization of Coating Microstructure Using Laser Scanning Confocal Microscopy. |
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Measurement Devices For Industry & Science :: Vendor... BeamTrack, the industry's first integrated laser power/position/size sensors, ** NanoModeScan M2 laser beam propagation analyzer for propagation |
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JAXA | KAGUYA (SELENE) Observations with Laser Altimeter... Laser Altimeter (LALT) The Laser Altimeter (LALT) is a ranging instrument that emits a laser beam to the lunar |
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