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Logic Analyzers - Logic Analysis Module, 68 channel , 4 GHz timing, 250 MH.. -- GSA Schedule Agilent Technologies 16911ASupplier: TestMart
Description: Logic Analysis Module, 68 channel , 4 GHz timing, 250 MHz state, 256 K depth Available NEW for official U.S. Government & Authorized Contractor purchase only This is available to Authorized User Groups and Agencies for delivery to CONUS, Alaska, Hawaii and Puerto Rico. Commercial and non-US
Supplier: Ironwood Electronics, Inc.
Description: Ironwood offers a number of adapters that support high speed probing using Agilent 16xxx or Tektronix TLA 7xx logic analyzers. These adapters incorporate vendor-specific interfaces and clean, controlled impedance signals. Ironwood received both Agilent and Tektronix certification for qualified
Supplier: Electro Rent Corporation
Description: Agilent 16702B Logic analysis system mainframe. See also AT-16702A. 5 slot logic analysis mainframe with 9GB hard drive, 40X CD-ROM drive, 3 button mouse, keyboard, Ethernet port, SVGA video output, parallel port, single-ended SCSI-2, built in 12.1" color touch-screen display and 1 emulation module
Supplier: Hensley Technologies, Inc.
Description: The 16800 Series portable logic analyzers deliver an exclusive combination of logic analysis, pattern generation, application software and innovative probing...all at a price that will fit your budget. Logic Analyzer Configuration 15-inch (38.1 cm) color display with touch screen available
Description: Abstract This mathematically oriented introduction to the theory of logic programming presents a systematic exposition of the resolution method for propositional, first-order, and Horn- clause logics, together with an analysis of the semantic aspects of the method. It is through the inference rule
Supplier: Tektronix, Inc.
Description: on your design. The P6400 Series logic analyzer probes when used with the TLA5000B Series logic analyzers make sophisticated logic analysis available at an affordable price. Select from a variety of attachment mechanisms, including the high-density D-Max® Probing Technology that eliminates the need
- Probe Type: Logic
- Probe Configuration: Pin and Socket
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Parts by Number for Logic Analysis Top
|Part #||Distributor||Manufacturer||Product Category||Description|
|16500B||PLC Radwell||Hewlett Packard||Test Equipment, Calibrator/Simulator||MAINFRAME LOGIC ANALYSIS SYSTEM|
|16500B||PLC Radwell||Agilent||Test Equipment, Calibrator/Simulator||MAINFRAME LOGIC ANALYSIS SYSTEM|
|SILICON-EXPLORER II||Digi-Key||Microsemi SoC||Programmers, Development Systems||SOFTWARE ANALYSIS EXPLORER LOGIC|
|JNATC||PLC Radwell||Dearborn||PLCs/Machine Control, VDC Logic I/O Brain/Interface||NETWORK ANALYSIS TOOL|
Conduct Research Top
SMD Resistor Thermal Analysis
. Pres_max :=. res. Pres_max = 107.1. Author: Date: 07/27/07. Ron Schmidt. Title: Document No.: Revision: SMD Resistor Thermal Analysis. BAN-THR-2.1. A. Using similar logic the maximum power that can be conducted through the PC board can. be calculated. Continuing the example of "Figure 2;" assuming
MICRO: Defect/Yield Analysis
to monitor production lots in-line, enabling the company to react more effectively to process changes and defect excursions. This article demonstrates that EBI has been key to optimal yield improvement and monitoring on Altis's copper logic production line. By using the technology, the fab's yield
Analysis of Visible Light Images
a 4 in. with 132 MByte/ s burst rate. Triggers are either high speed. port window. However, by positioning the camera end on, a. Transistor-Transistor Logic through a BNC connection or op-. full axial view of the plasma can be obtained (Fig. 4). The. tical through fibers. Likewise, gating can
Practical PICmicro(R) Oscillator Analysis and Design
of C1 and C2, as. shown in Figure 8. It can be thought of as an inverting. shown in Equation 2. amplifier, not a logic gate, with a gain(2) Gd of -20 or. 26 dB. It also has a low-pass filter in the output path that. EQUATION 2: causes the output gain to drop with frequency. The. output pole also
Using Static and Runtime Analysis to Improve Developer Productivity and Product Quality
entering the main code stream and ensures that any new code is up to standard. Using techniques such as abstract syntax tree (AST) validation and code path analysis, static analysis tools can uncover security vulnerabilities, logic errors, implementation defects, and other problems, both
MICRO: Defect/Yield Analysis and Metrology - Poag(July 2000)
Frank Poag and Douglas Paradis, ; and Mahesh Reddy and Jon Button, Data consistency and rapid response to yield-limiting defect excursions are among the benefits realized from the installation of automated When a wafer fab processes a large number of different logic devices at several technology
Venuka K. Jayatilaka and Phillip B. Espinasse, PolarFab Power management applications are relying increasingly on highly integrated bipolar-CMOS-DMOS (BCD) processes, combining bipolar and logic components with large metal-oxide-semiconductor (MOS) drivers on the same chip. As processes become more
MICRO: Yield Analysis
approximations are no longer sufficient, and previously insignificant errors are now unacceptable. For sub-100-nm processes, especially advanced logic devices, transistor performance controls the final value of the IC. Transistor speed is a direct function of the gate length, which is controlled
Engineering Web Search: Logic Analysis Top
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