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Supplier: Hensley Technologies, Inc.
Description: LOGIC PROBE, 17MHZ
Supplier: Tektronix, Inc.
Description: SINGLE-ENDED HIGH-DENSITY LOGIC ANALYZER PROBE WITH D-MAX
- Probe Type: Logic
- Probe Configuration: Other
Supplier: Yokogawa Corporation of America
Description: 8-bit, non-isolated, TTL level/Contact Input (for SL1400) Note: 702911/702912 do not conform to CE Marking.
- Probe Type: Voltage, Oscilloscope, Logic
- Probe Configuration: Computer / IC
Supplier: Texas Instruments High Reliability
Description: Octal Buffers & Line Drivers With Open-Collector Outputs 20-CDIP -55 to 125
- Gate Type: Buffer / Driver
- Supply Voltage: 5 V
- Output Type: Open Collector
- Logic Family: Transistor-Transistor Logic (TTL), Standard CMOS / CMOS 4000
Supplier: ValueTronics International, Inc.
Description: Tests TTL and CMOS Displays DC to 50 MHz Detects 10ns pulse width Overload protected
- Probe Type: Logic
- Probe Configuration: Alligator Clip, Extended - Fine Tip
Supplier: B&K Precision
Description: Tests TTL, and CMOS Displays pulse presence and logic states Memory mode "freezes" pulse display Catches pulses to 30 ns or pulse trains to 20 MHz 1 Mohm input impedance
- Probe Type: Logic
- Probe Configuration: Alligator Clip
Supplier: GE Intelligent Platforms
Description: Complies with the VMEbus Specification Rev. C.1 High reliability DIN-type I/O connectors Double Eurocard form factor (6U) Open circuit provides logic zero or (jumper-selectable) logic one A24:A16:D32/D16/D08 (EO): slave: 39/3D:29/2D Front panel with fail LED On-board Built-in-Test logic
- Data Acquisition Device Type: Input Module
- Form Factor: Printed Circuit Board (PCB)
- DC Voltage Input: Yes
- User Interface: Front Panel and Display, Computer Programmable
Supplier: Cascade Microtech, Inc.
Description: DC probes can provide power or slow logic to circuit under test
- Probe Type: Voltage, Current, Differential, High Frequency
- Probe Configuration: Flat Blade
Supplier: Rochester Electronics, Inc.
Description: F/FAST SERIES, DUAL 4 LINE TO 1 LINE MULTIPLEXER, INVERTED OUTPUT, CQCC20
- Supply Voltage: 5 V
- Logic Family: Transistor-Transistor Logic (TTL)
- Output Characteristics: Other
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Featured Products for Logic Test Top
PLCCenter.com, A Div. Radwell International
Video of Allen-Bradley Test Cart
Video of Allen-Bradley Test Cart. In this video, PLCCenter.com, a division of Radwell International, is demonstrating one of its Allen-Bradley mobile test carts for programmable logic controllers. The cart allows fast and accurate testing of a variety of Allen-Bradley PLC ’s. The carts are used to test customers ’ repairs, and also to certify PLCCenter.com ’s surplus product. The cart tests the modules for greater reliability, making sure the customers ’ repairs... (read more)
Browse Programmable Logic Controllers (PLC) Datasheets for PLCCenter.com, A Div. Radwell International
Jeio Tech, Inc.
Environmental Test Chambers
support in three kinds of English, Chinese, and Korean. • Optimize CPU logic control system. - Optimum control for temperature/ humidity with economical control in power consumption. • Touch screen type monitor. - 5.7-inch color LCD with interactive input system using touch keys. - Temperature & humidity/ timer settings and operating condition. - Temperature, humidity, other operating parameters, and a record of previous operation are also displayed in graph form. - Easily... (read more)
Browse Environmental Test Chambers and Rooms Datasheets for Jeio Tech, Inc.
TES Electrical Electronic Corp.
NEW ~~ Prova 1011 Solar System Analyzer
Features: I-V curve test for solar system. Max. solar system power (Pmax) search by Auto-scan: 1000V, 12A (12000W capability). The analyzer and the Remote Solar Detector is connected by Bluetooth wireless. communication (Bluetooth 2.1 + EDR Class 1). The Remote Solar Detector is moisture-proof. Intelligent test logic with no personnel attendance required in the field. Solar system analyzer waits and tests the system until appropriate sunlight irradiance is detected. Max. voltage (Vpm) at Pmax... (read more)
Browse Solar Radiation Instruments Datasheets for TES Electrical Electronic Corp.
Five Piece Test Kit Assembly
Five Piece Test Kit Assembly Machine Data. Sort and Feed Five Components. Fragile Glass Ampoule Feeding. Inline - Intermittent Motion. Walking Beam Style Carrier. Accommodates Varying Assemblies. Inspect - Reject Device. Speed Range: Up to 80 Cycles/Min. Standard Features. Stainless Steel Construction. Anodized Aluminum Components. Complete Interlocked Guard Package. Fast Tooless Change-Over. PLC Controlled Sequence Logic. Operator Interface Terminal. Color Coded Light Column. Project Brief... (read more)
Browse Sorting Equipment Datasheets for Farason Corporation
Conduct Research Top
Logic Powered Serial EEPROMs
the voltage and current for all memory functions, READ, ERASE, and WRITE. Obviously, not all memory or peripheral devices could be powered thusly, but Microchip?s SEE devices will function in this environment. Logic Powered Serial EEPROMs. AN535. Logic Powered Serial EEPROMs. Authore: Richard J. Fisher
Reducing Parametric Test Costs with Faster, Smarter Parallel Test Techniques
converters, as well as. its own embedded real-time logic processors and communications channels. • The test execution environment must be multi-threaded. A G r e a t e r M e a s u r e o f C o n f i d e n c e. Test structure design is another important consideration when attempting to get the. maximum
Socket-Adapter Systems: A Practical Test Alternative (.pdf)
for field-programmable gate arrays (FPGAs) and programmable logic devices (PLDs) as the trend toward convergence in cell phones and other portable devices con¬tinues. 60620-195.indd S O C K E T S. Socket-adapter. Systems: A Practical. Test Alternative. AN INNOVATIVE, SPACE-SAVING APPROACH
Automated Test Platform
Automated test platforms are designed to check chips make sure they work, and if so, how well (usually how fast) they perform. Automated test platforms are usually specialized as either memory chip testers, digital logic chip testers, or analog chip testers, though some of the more sophisticated
Capacitance Set Point Stability During Random Vibration Test
the bellows pulls the capacitor towards maximum capacitance, it makes sense that any drive screw drift (motion) caused by vibration would tend to increase the capacitance of the unit. Since the test with the low friction thrust bearing produced a result that defies this logic, the probability
Agilent: Automotive Electronic Functional Test Using Agilent System Components
/performance. In some. cases, when it is undesirable to have a PC on a production. line for security reasons, equipment can be controlled. by Programmable Logic Controllers (PLCs), which use. ladder logic to achieve control, but this can be difficult. to do since test instruments normally need to have
Medical Device Link . New Test Equipment Offers Less Bulk, More Versatility
that's more compact than the combination of switching relays and logic circuitry found in larger benchtop testers. Millican sees a trend toward test systems that are easy to handle. "We've found that most customers like to have lighter-weight, more-portable test equipment," he says. But buyers beware
Using Digital I/O: Adding Common I/O Features to Your Tests
of the digital I/O capability follow these three steps. Step 1. Purchase the Upgraded easy-wire software which includes the Virtual I/O Package. (Part # SIO-EW). Step 2. Purchase (Direct Logic DL05 Micro PLC) hardware from Direct Logic (Click Here for link to Direct Logic web page). Step 3. Visit
Engineering Web Search: Logic Test Top
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Test and Measurement Equipment | Tektronix
Logic Analyzers TLA7000 Series TLA6400 Series Logic Analyzer Probes Low Capacitance Probes
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Power-on self-test - Wikipedia, the free encyclopedia
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Logic Integrity Test - What does LIT stand for? Acronyms and...
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