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  • Description: No Description Provided

    • Type / Form Factor: Test Platform / System
    • Options / Module Types: Measure Unit / Monitor, Test Software / Program Generator
    • Components / Products Tested: Boards - Loaded PCB, System-On-Chip (SOC), Specialty / Other
    • Tester / Test Capability: Manufacturing Defect Analyzer (MDA), Other

  • Description: Our Vertex Series-A is a versatile, all purpose X-Ray system with a new modular design based on solid SRT engineering and offering a 20" x 24" Inspection area with 100% coverage.

    • Type / Form Factor: Test Platform / System
    • Options / Module Types: Measure Unit / Monitor
    • Components / Products Tested: Boards - Loaded PCB, Boards - Bare PCB, Specialty / Other
    • Tester / Test Capability: Manufacturing Defect Analyzer (MDA), Vision / X-ray

  • Description: Ideal for Unit Under Test Loading or Simulation 5 Watt High-density Programmable Load Module Wide Resistance Range from 0.5 ohm to 1.5 Mohm 0.1 ohm Step Size Over-voltage, Over-current, and Over-temperature Sensing External Voltage and Current Sense Outputs Fail-safe Interrupt Input on Front

    • Type / Form Factor: Test Module / Sub-system
    • Options / Module Types: Source Module / Unit, Load Bank / Electronic Load
    • Components / Products Tested: Specialty / Other
    • Tester / Test Capability: Functional Test (Performance), Manufacturing Defect Analyzer (MDA), Simulation / Emulation

  • Description: The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode.

    • Type / Form Factor: Test Module / Sub-system
    • Options / Module Types: Measure Unit / Monitor, Interface / Fixture System
    • Components / Products Tested: Active Components / Semiconductors, Logic ICs, Memory, Passive Components, RF & Microwave, System-On-Chip (SOC)
    • Tester / Test Capability: Functional Test (Performance), Manufacturing Defect Analyzer (MDA)

  • Description: of lithography cell tools. Provides accurate, repeatable focus position from the actual wafer surface. Automatically transfers overlay test data to the ASML PAS 5500™ series stepper to significantly reduce non-productive stepper time, resulting in increased tool productivity. Archer Analyzer

    • Form Factor: Monitor / Instrument
    • Mounting / Loading: Floor Mounted / Stand-alone
    • Applications: Photolithography / Patterning
    • Measurement Capability: Defects / ADC

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  • MICRO: Defect Analysis
    , ICP-MS has unit mass resolution, which makes the analyzer subject to several isotopic and polyatomic interferences at such mass levels. As the complexity of the matrix being analyzed increases, this phenomenon becomes an even greater concern. Combining the vapor phase decomposition (VPD) or drop scan
  • Vibes scope machine health
    level on a concrete base. An engineer taking a single measurement from each machine may conclude that there is a defect with the machine on the second

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