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Part # Distributor Manufacturer Product Category Description
dsPIC33FJ128MC804 Microchip Technology, Inc. Microchip Technology, Inc. Not Provided A, Phase B, and index pulse input. - 16-bit up/down position counter. - Count direction status. - Position Measurement (x2 and x4) mode. - Programmable digital noise filters on inputs. - Alternate 16-bit Timer/Counter mode. - Interrupt on position counter rollover/underflow. Communication Modules...
dsPIC33FJ128MC802 Microchip Technology, Inc. Microchip Technology, Inc. Not Provided resolution (@ 40 MIPS) = 39.1 kHz for Edge-Aligned mode, 19.55 kHz for Center-Aligned mode. . 2-Quadrature Encoder Interface module: - Phase A, Phase B, and index pulse input. - 16-bit up/down position counter. - Count direction status. - Position Measurement (x2 and x4) mode. - Programmable digital...
dsPIC33FJ64MC802 Microchip Technology, Inc. Microchip Technology, Inc. Not Provided resolution (@ 40 MIPS) = 39.1 kHz for Edge-Aligned mode, 19.55 kHz for Center-Aligned mode. . 2-Quadrature Encoder Interface module: - Phase A, Phase B, and index pulse input. - 16-bit up/down position counter. - Count direction status. - Position Measurement (x2 and x4) mode. - Programmable...

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  • Using a 3-Wire RTD to Prevent Temperature Measurement Errors
    Workers in food storage, medical monitoring and many other industries rely on RTD temperature measurements to protect their valuable inventory. CAS DataLoggers Applications Specialists offer this quick datalogging tutorial recommending 3-wire RTDs to customers to improve the accuracy of their
  • Polarization Measurement Analyzer Alignment and Contrast
    Measuring performance of a polarizer requires care and. attention to detail if precision is desired, particularly when. measuring high-contrast polarizers. This paper discusses. the impact of polarizer-analyzer alignment and contrast of. the analyzer on measurement error when measuring. polarizer
  • Improving Measurement Accuracy for High Frequency RF Connectors
    Improving the accuracy of your microwave test and measurement equipment becomes increasingly important when high frequency devices are used in the transmission paths of radio, cellular, satellite and digital communications. This discussion helps to solve problems with measurement errors during
  • The Importance of Spatial Resolution in IR Thermography Temperature Measurement - Three Brief Case Studies
    of a distant target that just isn't quite large enough. Whether the measurement errors resulting from inadequate spatial resolution really matter depend on the magnitude of the error and the criticality of the target. In our study we found a critical problem on a substation transformer at 40% load
  • Improving Measurement Accuracy for High Frequency RF Connectors (.pdf)
    Improving the accuracy of your microwave test and measurement equipment becomes increasingly important when high frequency devices are used in the transmission paths of radio, cellular, satellite and digital communications. This discussion helps to solve problems with measurement errors during
  • Measuring Surface Slope Error on Precision Aspheres (.pdf)
    and should specify the spatial intervals of interest when tolerancing aspheric elements. Peak slope error measurement is prone to erroneous measurement errors due to surface contamination, environmental errors, and pupil focus. Finally, filtering has a strong influence on surface slope calculations
  • Straightness Measurement
    . Straightness can be measured using the minimum zone or least-squares methods. With a least-squares method, a reference or centerline is fitted to the surface or feature. The areas above and below the reference line are equal and kept to a minimum separation. The highest peak-to-valley measurement normal
  • Managing Measurement Uncertainty (.pdf)
    In metrology, measurement uncertainty and the resulting potential for error are always present. Regardless of the technology employed, there can be an accumulation of tolerance errors in each element of the measurement process that puts the reliability of the inspected dimension in doubt. According

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