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Metric Roughness Metrology Equipment
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Product Announcements
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Leica Microsystems, Inc. 
MSI-Viking Gage 
Lapmaster International 
Mahr Federal Inc.
Precitec, Inc.
Starrett |
Products/Services for Metric Roughness Metrology Equipment
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Surface Metrology Equipment - (300 companies)Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness, and defects. How to Select Surface... Search by Specification | Learn More -
Surface Profilometers - (190 companies)Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters. Surface profilometers are used to measures surface profiles, roughness, waviness and other finish... Search by Specification | Learn More -
Metric Gears - (77 companies)Metric gears are defined by module, which designates the center-to-center distance between successive teeth. This criteria of gear selection is used in countries which have adopted the metric system and is intended to standardize gear selection. How... Search by Specification | Learn More -
Metrology Fixtures and CMM Fixtures - (55 companies)...fixtures are used with shop floor gaging systems such as those used in the automotive industry. Metrology fixtures and CMM fixtures also include OQ room fixtures, products that are designed for use in clean rooms, laboratory instruments and equipment. Learn More -
Semiconductor Metrology Instruments - (179 companies)...material characteristics such as layer thickness, optical constants, surface roughness, composition, and optical anisotropy. A critical-dimension scanning electron microscope or CD-SEM is used to ensure the stability of the manufacturing process... Search by Specification | Learn More -
Metric Pitch Timing Pulleys - (153 companies)Metric pitch timing pulleys mesh with same-pitch timing belts on synchronous drives where maintenance of speed ratio is important. These pulleys have a millimeter-based pitch designation. Metric pitch timing pulleys mate with same-pitch timing belts... Search by Specification | Learn More
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Metric Pitch Timing Belts - (194 companies)Metric pitch timing belts mate with same-pitch timing pulleys in power transmission systems where maintenance-of-speed ratio is an important design consideration. Metric pitch is the distance between belt teeth based on millimeters (mm). With metric... Search by Specification | Learn More
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Dimensional Measurement and Metrology Services - (215 companies)...and metrology services use a variety of instruments and equipment to measure parts. A dimensional measurement system is a complete set of measuring instruments and equipment. Dimensional laboratory metrology may involve coordinate metrology and surface... Search by Specification | Learn More
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Lithography Equipment - (64 companies)Lithography equipment transfers circuit or device patterns onto a substrate using a patterned mask and a beam of light or electrons to selectively expose a photoresist layer. Overlay metrology systems align the pattern masks or reticules... Learn More
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Filtration Equipment - (1139 companies)Filtration equipment is used to filter, thicken or clarify a mixture of different elements. There are several different ways to classify products. Examples include by driving force (gravity, pressure, vacuum centrifuge); filtration mechanism (filter... Search by Specification | Learn More
Product News for Metric Roughness Metrology Equipment
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Starrett
SR100 Surface Roughness TesterIn addition to basic roughness parameters Ra and Rz, also measures advanced Rp, Rv and Rt parameters. • Five second cycle time. • Result saved until the next measurement is taken. • Switches between inch and metric mode without remeasuring. • Use right out of the box - little or no operator training required. • Automatic shut-off after five minutes of inactivity. • Configured with the most common industrial settings to ensure correlation between multiple operators... (read more)Browse Surface Metrology Equipment Datasheets for Starrett -
Metal Cutting Corporation
Cleanroom MetrologyOur cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more)Browse Surface Preparation Services Datasheets for Metal Cutting Corporation -
Mahr Federal Inc.
MarSurf™ WS 1 Optical Surface Metrology SystemMahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf ™ WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. Utilizing MarSurf XT 20 topographical evaluation software, the space-saving MarSurf WS 1 can be configured to work both in the lab and on the shop floor. With the new processes... (read more)Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc. -
Lapmaster International
Lapmaster FTP 130 for MetrologyLapmaster International LLC presents the FTP 130 as a new product addition to its Metrology Line. The FTP 130 is a 3 way measuring system which accurately measures the flatness, thickness and parellelism of both 1 and 2 sided parts. Up to two different functions can be used simultaneously to measure parts as thin as 0.20mm or as thick as 200mm. It also comes with a new analog-digital display that elimates the possibility of any inaccuracies. This unit provides a very cost effective, compact... (read more) -
MTI Instruments Inc.
Wafer Metrology Measurement ToolThe Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are used to... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc. -
MSI-Viking Gage
Outsource All Your Metrology NeedsMSI-Viking Gage can customize and administer a Total Solution Program to manage the calibration, maintenance and inventory control of all your company's metrology equipment. Fully Customized Total Solution Programs. There is no charge to you for us to meet with you, evaluate your needs and develop a program to meet your company's very specific requirements and wishes. Your Total Solution Program can include any combination of these services tailored to your business: Regularly scheduled... (read more)Browse Dimensional Measurement and Metrology Services Datasheets for MSI-Viking Gage -
Precitec, Inc.
determination of roughness, waviness, load curvesNEMESIS Optical surface measurement with the CHR 150 N optical distance sensor. topographies measured regardless of the nature of the surface (smooth and polished, rough, matte, transparent). dimensional monitoring of ultra-small components and microstructures. thickness layer measurement of transparent objects. determination of roughness, waviness, load curves. measuring of optical components. Data sheets (Optical 3D-Measuring Systems) in PDF format for downloading and printing. Use... (read more) -
Nikon Metrology, Inc.
iSpace Metrology System for ArcheologyDrawing of contexts, sections and site plans can easily consume a huge part of the total excavation time. For particularly complicated and detailed sites this can even rise to as much as half of the total project time. To increase the productivity of these dedicated activities, Nikon Metrology presents the Archeology variant of its iSpace large-scale metrology system. Trials at Mont Beuvray, France, have shown that the Archeology iSpace solution records data 50% to 90% faster compared... (read more)Browse Coordinate Measuring Machines (CMM) Datasheets for Nikon Metrology, Inc. -
PixeLINK
Machine Vision Cameras for MetrologyMetrology. To measure objects with precision, companies frequently turn to PixeLINK® machine vision cameras. Measure Complex Shapes. Organizations looking to measure irregular, complex or precision parts require a machine vision camera solution that offers a high frame rate, excellent image quality and high resolution. For these reasons, companies looking to develop metrology systems for electronics, semiconductors, or any complex manufacturing product choose PixeLINK® industrial cameras... (read more)Browse CCD Cameras Datasheets for PixeLINK -
Rigaku Corporation
TXRF-V310 Metrology InstrumentTXRF analysis can gauge contamination in all fab processes, including cleaning, litho, etch, ashing, films, etc. The TXRF-V310 can measure elements from Na through U with a single-target, 3-beam X-ray system and a solid-state detector system. The TXRF-V310 includes Rigaku's patented XY θ sample stage system, an in-vacuum wafer robotic transfer system, and new user-friendly windows software. All of these contribute to higher throughput, higher accuracy and precision, and easy routine... (read more)Browse Semiconductor Metrology Instruments Datasheets for Rigaku Corporation
Conduct Research
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Optical Comparators in Medical Device Manufacturing
. Metric & Decimal Equivalent Cards. Decimal Wall Charts. Tools & Rules. Starrett Story. Band & Hole Saw Cards. Free Training Materials. PDF Literature. Metrology Promo 11.2. Full Line Catalog. Data Sheets. User Manuals. Material Safety Data Sheets. News. Events. About. General Information. Company...
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Product Extra!
to 60 operator-defined, vapor-phase toxic or hazardous chemicals at up to 40 sample locations. Warning and alarm levels can be set for specific chemicals so that automatic responses can be established. (Semicon West, San Francisco, Esplanade, Booth 4220) Metrology System Rudolph Technologies...
Engineering Web Search: Metric Roughness Metrology Equipment
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Metrology Equipment Metrology Products Precision Measuring Tools Metrology Equipment Vision Equipment Large Format Premier See Starrett Profile & Catalog |
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PROLITH Lithography Simulation Tool ? Computational... EUV lithography, line edge roughness " target="_blank">EUV lithography, line edge roughness EUV lithography, line edge roughness See KLA-Tencor Corporation Information |
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Berg Engineering & Sales Co., Inc. Surface Roughness/Profilometers Eddy Current Testing Metric Digital Caliper Inch Inch/Metric |
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Equipment Class Application Guideline International SEMATECH... Keywords: Test Methods, Equipment Performance, Process Capability, Metrology, Wafer Size Conversion, 300 mm Wafers Authors: David Carswell, Lorn See SEMATECH Information |
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Quality Technician Certification Body of Knowledge - ASQ Surface plate methods and equipment Surface analyzers (e.g., optical flats, roughness testers) METROLOGY AND CALIBRATION (19 Questions) See American Society for Quality Information |
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