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Microelectronic Metrology System
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SemiProbe 
MTI Instruments Inc. 
MTI Instruments Inc. 
Rigaku Corporation
Precitec, Inc.
Rigaku Corporation |
Products/Services for Microelectronic Metrology System
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Semiconductor Metrology Instruments - (179 companies)Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers... Search by Specification | Learn More -
Semiconductor Cluster Tools - (69 companies)...components. A typical semiconductor cluster tool is comprised of several different wafer processing modules that are managed by a centralized control system. Semiconductor cluster tools combine the wafer processing chambers with a wafer handling robot... Search by Specification | Learn More -
Dimensional Measurement and Metrology Services - (215 companies)...and metrology services use a variety of instruments and equipment to measure parts. A dimensional measurement system is a complete set of measuring instruments and equipment. Dimensional laboratory metrology may involve coordinate metrology and surface... Search by Specification | Learn More -
Metrology Fixtures and CMM Fixtures - (55 companies)...fixtures are used with shop floor gaging systems such as those used in the automotive industry. Metrology fixtures and CMM fixtures also include OQ room fixtures, products that are designed for use in clean rooms, laboratory instruments and equipment. Learn More -
Surface Metrology Equipment - (300 companies)Types of Metrology Equipment. There are two main types of surface metrology equipment: form gages and surface profilometers. Form gages, form gaging systems, and contour measuring machines are used to inspect parameters such as roundness, angularity... Search by Specification | Learn More -
Network System Integrators - (1254 companies)Network system integrators install and setup computer networks, as well as add components to existing systems. Network System Integrators Information. Network system integrators install and setup computer networks as well as add components... Learn More
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Painting, Coating, and Finishing System Integrators - (215 companies)Painting, coating and finishing system integrators provide finishing lines, turnkey coating machines and large-scale systems for production finishing operations. Typically, finishing lines are designed to OEM requirements and are installed on site... Search by Specification | Learn More
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Security System Services - (307 companies)Security system services install, maintain, and monitor security equipment such as CCTV systems, security cameras, building monitors, entry alarms, metal detectors, and movement and occupancy sensors. Security system services install, maintain... Learn More
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Water and Wastewater System Integrators - (24 companies)Water and Wastewater Systems Integrators design, engineer and build wastewater systems for applications that range from small industrial systems to large scale municipal systems. How to Select Water and Wastewater System Integrators. Image Credit... Learn More
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Operating System Software - (401 companies)Certified Systems Engineers (MCSE) design and implement an infrastructure for business solutions based on the Windows platform (2000) and Microsoft Servers System (2003). Operating system software controls programs such as web services, email, and file... Learn More
Product News for Microelectronic Metrology System
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Nikon Metrology, Inc.
iSpace Metrology System for ArcheologyDrawing of contexts, sections and site plans can easily consume a huge part of the total excavation time. For particularly complicated and detailed sites this can even rise to as much as half of the total project time. To increase the productivity of these dedicated activities, Nikon Metrology presents the Archeology variant of its iSpace large-scale metrology system. Trials at Mont Beuvray, France, have shown that the Archeology iSpace solution records data 50% to 90% faster compared... (read more)Browse Coordinate Measuring Machines (CMM) Datasheets for Nikon Metrology, Inc. -
Nikon Metrology, Inc.
Multi-Sensor 3D Metrology System HN-6060turbine blades, appliance housings and much more. "The HN-6060 multi-sensor system builds upon the Nikon Metrology portfolio of vision systems and 3D solutions." says Myles Richard, Managing Director of Americas for Nikon Metrology, "It addresses the need for fast, high-accuracy 3D inspection of complex shapes by combining innovative optical technology with the highest precision measurement hardware." The newly designed laser scanning sensor extracts the surface form and waviness data in one... (read more)Browse Metallurgical Microscopes Datasheets for Nikon Metrology, Inc. -
Mahr Federal Inc.
MarSurf™ WS 1 Optical Surface Metrology Systemand materials available these days, traditional stylus measurement is often not adequate to characterize the functional behavior of surfaces," said Pat Nugent, Vice President of Metrology Systems for Mahr Federal. "The MarSurf WS 1 can provide the three-dimensional recording and evaluation needed, as well as the non-contact measurement required by soft and sensitive materials. In addition, new processes are achieving ever higher levels of surface quality, greatly increasing the need for greater... (read more)Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc. -
Metal Cutting Corporation
Cleanroom MetrologyOur cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more)Browse Surface Preparation Services Datasheets for Metal Cutting Corporation -
Lapmaster International
Lapmaster FTP 130 for MetrologyLapmaster International LLC presents the FTP 130 as a new product addition to its Metrology Line. The FTP 130 is a 3 way measuring system which accurately measures the flatness, thickness and parellelism of both 1 and 2 sided parts. Up to two different functions can be used simultaneously to measure parts as thin as 0.20mm or as thick as 200mm. It also comes with a new analog-digital display that elimates the possibility of any inaccuracies. This unit provides a very cost effective, compact... (read more) -
PixeLINK
Machine Vision Cameras for MetrologyMetrology. To measure objects with precision, companies frequently turn to PixeLINK® machine vision cameras. Measure Complex Shapes. Organizations looking to measure irregular, complex or precision parts require a machine vision camera solution that offers a high frame rate, excellent image quality and high resolution. For these reasons, companies looking to develop metrology systems for electronics, semiconductors, or any complex manufacturing product choose PixeLINK® industrial cameras... (read more)Browse CCD Cameras Datasheets for PixeLINK -
Rigaku Corporation
TXRF-V310 Metrology InstrumentTXRF analysis can gauge contamination in all fab processes, including cleaning, litho, etch, ashing, films, etc. The TXRF-V310 can measure elements from Na through U with a single-target, 3-beam X-ray system and a solid-state detector system. The TXRF-V310 includes Rigaku's patented XY θ sample stage system, an in-vacuum wafer robotic transfer system, and new user-friendly windows software. All of these contribute to higher throughput, higher accuracy and precision, and easy routine... (read more)Browse Semiconductor Metrology Instruments Datasheets for Rigaku Corporation -
MTI Instruments Inc.
Wafer Metrology Measurement ToolThe Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are used... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc. -
Nikon Metrology, Inc.
Automating Large-Scale Metrology ApplicationsThis revolutionary instrument often replaces large-scale metrology systems that struggle with parts that are too complex, too hard to reach, too delicate or too labor-intensive. Working with the new Laser Radar system yields impressive productivity gains in applications across numerous markets. Aviation metrology applications include the inspection of fuselage, wing, wing/body connections, landing gear, jet engine inlet cowl and many more. In the energy sector, Laser Radar systems are used... (read more)Browse Coordinate Measuring Machines (CMM) Datasheets for Nikon Metrology, Inc. -
Visualization Sciences Group, Inc. (VSG)
Zeiss's metrology software powered by OpenInventorCarl Zeiss Industrial Metrology GmbH (IMT) is a leader in the field of industrial metrology. IMT offers a wide range of products for measuring operations under different operating conditions (from the metrology lab to production measurement in rough production environments without air-conditioning) to the automotive, machinery and aviation industries. IMT also provides comprehensive services, ranging from professional service programming of industrial computer tomography to worldwide on-site... (read more)Browse Integrated Development Environment (IDE) Datasheets for Visualization Sciences Group, Inc. (VSG)
Conduct Research
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MICRO:Industry News:Expansions & Acquisitions (Sept. '98, p.26)
Client demand was the main reason that Olin Microelectronic Materials and Matheson Semi-Gas Systems signed their recent deal to combine their respective chemical and gas management services in one package. "Customers [told us] they were looking for one company to offer both gases and chemicals...
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Vantage Point: Mechatronics in semiconductor fab automation
Historically, the semiconductor industry has been driven by physics and chemistry. These are the disciplines that have led to perfecting manufacturing processes that, in turn, have brought remarkable advances in microelectronic technology. In semiconductor manufacturing, the focus has mainly been...
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MICRO:Archive:Back Issue TOC
first; FOUP sales set record; Genus sells first ALD tool Seiko Epson inks SOI pact; Partners offer software; Ibis ups wafer capacity; Brooks buys SEMY; Lambda opens service center; Semtech exiting foundry biz; Chem vendors expands to Asia SCP Global Technology, SPIE's Symposium on Microelectronic...
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What drives defect detection technology?
, engineers focus on solving fundamental process problems, relying primarily on in-line metrology and electrical data from microelectronic test structures. Defect inspection becomes increasingly important once VLSI circuits are introduced into the process development effort, when inspection tools detect...
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MICRO: Rebuilding Copperopolis - Biolsi (July 2000)
use increases. Organic contamination is the least-studied source of defects, while scratches and dielectric film stress are common process-related problems. As geometries shrink, microelectronic fabrication processes become more complex, forcing semiconductor engineers to develop strategies...
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MICRO:Movin On (Nov/Dec '98)
Interox. Paul Koenig has been promoted to director of logistics. Tegal has promoted Philip Wilton to European gm. He is the former director of service operations. . . . The new manager of Olin Microelectronic Materials' process chemicals plant in Mesa, AZ, is Charles Newton IV. Lindsey Hall...
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MICRO: Expansions and Acquisitions
, producer of high-purity analytical reagents and microelectronic chemicals, has purchased Machwolk of Petaling Jaya, Malaysia, an independent distributor of J.T. Baker and Mallinckrodt products in Malaysia. Within the next two years, Mallinckrodt Baker plans to manufacture a range of products...
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MICRO:Movin' On (Oct. '98, p.162)
. Tegal has promoted Philip Wilton to European gm. He is the former director of service operations. . . . The new manager of Olin Microelectronic Materials' process chemicals plant in Mesa, AZ, is Charles Newton IV. Lindsey Hall was appointed director of technology for chemicals and services...
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MICRO: Editor's Page
of keeping ramp-ups on track is the implementation of advanced process control (APC), an area getting increased traction at both the microlithography conference and its sister symposium on advanced microelectronic manufacturing. "At 300 mm, APC will become a must-have capability analogous to what...
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INDUSTRY NEWS
ramp vertical furnace systems. Eaton formed the unit after it purchased High Temperature Engineering in May 1996. The thermal business has more than tripled since its inception, Eaton says. Allied moves HQ AlliedSignal Advanced Microelectronic Materials (AMM) has moved its headquarters...
Engineering Web Search: Microelectronic Metrology System
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Interferometry - Wikipedia, the free encyclopedia In a typical system, illumination is provided by a diffuse source set at the focal plane of a collimating lens. |
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Comparison of optical and electrical measurement techniques... Comparison of optical and electrical measurement techniques for CD metrology on alternating aperture phase-shifting masks |
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Optical system for fast inspection of hermetic seals in... Optical system for fast inspection of hermetic seals in electronic packages |
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Quality Insider | Quality Digest Metrology Six Sigma Standards Videos Metrology Six Sigma Standards Inside Quality Insider See Quality Digest Information |
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Product News: Nikon Metrology to Deliver Microfocus CT System... Nikon Metrology Inc. | 09/13/2010 Bio Product News: Nikon Metrology to Deliver Microfocus CT System to Chesapeake Testing See Quality Digest Information |
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Ion projection lithography: status of tool and mask... The ion optics system (PDT-IOS) includes in situ metrology systems. |
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Metrology Tools measure thin transparent films., Rudolph... Overlay Metrology System suits memory and logic devices. Metrology System measures surface and contour in single pass. |
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I SYSTEMS, Inc. - Microelectronic Inspection Systems (SMD,... Semiconductor Inspection and Marking SMT & Hybrid Inspection 3D Metrology/Inspection (Solder Paste, Epoxy, BGA) AVM Series Automated Dimensional See I Systems, Inc. Information |
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DNA Microarrays (Genome Chips) (by Leming Shi, PhD) Microarrays require specialized robotics and imaging equipment that generally are not commercially available as a complete system. |
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Rudolph : Rudolph Announces New MetaPULSE-G Copper Film... Home | News and Events | Rudolph Announces New MetaPULSE-G Copper Film Metrology System See Rudolph Technologies, Inc. Information |
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