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Product Announcements
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KDP Composite Plates
Lapmaster International Interferometer Flatness Measuring Lapmaster International Micrometer Driven Positioning Stages Del-Tron Precision, Inc. EXTECH Digital Mini-Microscope Grainger Industrial Supply Probe System for Life™ SemiProbe Articulated Videoscope with Joystick Medit |
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Nanounity, Solutions for nano imaging & analysis High resolution AFM and STM imaging to atomic resolution Fast scanning AFM up to 40Hz scan speed over 100 X 100 micron area See Nanounity Information |
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CNF - Lab and Equipment Information 7300 rapidly measures heights from less than 1 micron up to 20 millimeters, with vertical resolution to 0.1 nm. It is ideally suited for inspecting |
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CNF - Lab and Equipment Information - WYKO HD-3300 Optical... 7300 rapidly measures heights from less than 1 micron up to 20 millimeters, with vertical resolution to 0.1 nm. It is ideally suited for inspecting |
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Michigan Engineering | Welcome to MIBL Dektak Profilometer Hardness Indenter Residual Stress |
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Profilometer for non-contact surface measurement, confocal... Affordable Profilometer Our profilometer systems feature fast and See Solarius Development Inc. Information |
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Nanolab Resolution in thin film resists down to .9 micron can be achieved. |
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Raytheon Company: Design and Fabrication Capabilities 1.0 micron resolution Karl Suss MJB-3 Mask Aligners Sub-Micron Photolithography Evaporative and Sputter Metal Deposition See Raytheon Company Information |
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Klystron Metrology Surface finish parameters can also be measured using a Taylor Hobson profilometer with a resolution of 16nm. |
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CFN News: Clean Room ion beams, direct beam-induced deposition of platinum wiring and high-resolution imaging and spectroscopy. |
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High-resolution actinic imaging and phase metrology of 193-nm... high-numerical-aperture (0.75 NA) optics to provide 200X magnification, 150-nm Rayleigh resolution and 35-nm pixel size over a 30-micron image field. |