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  • Interface for Laser Scanning Microscope
    This customer needs to interface a scanning laser microscope to their PC so that image data can be acquired and stored. Data is received from the laser microscope via an optical sensor at 1300 line scans per image. Each scan has an 8ms duration, but 2/3 of that time is. Gage Applied ::. Data
  • Polarizing Microscopes
    Polarizing microscopes or polarized light microscopes use two polarizers (one on either side of the specimen) that are positioned perpendicular to each other so that only light which passes through the specimen reaches the eyepiece. Light is polarized in one plane as it passes through the first
  • Understanding Microscopes
    Compound microscopes differ from simple magnifiers in that there are two separate magnification steps that occur instead of one. The objective lens is nearest the subject under observation and provides a magnified real image. The eyepiece magnifies the real image provided by the objective
  • Interferometric Microscopes
    Interferometric microscopes use the interference patterns of light waves for precise determinations of distance, thickness, surface or step heights, wavelength, roughness and non-contact 3D surface profiles. As in conventional interferometers, measurements are made by analyzing the phase shift
  • Electron Microscope
    Electron microscopes utilize an electron that is scanned across a scanning electron microscope (SEM) or passed through a tranmission electron microscope (TEM) a sample to capture an image. The significantly smaller wavelength of electrons allows much higher resolutions and depths of field compared
  • Factors to Consider When Selecting a Stereo Microscope
    Stereo microscopes are often nicknamed the workhorse of the lab or the production department. Users spend many hours behind the ocular inspecting, observing, documenting or dissecting samples. Which factors need to be considered when selecting a stereo microscope?. Factors to Consider When
  • Scanning Probe Microscopes and Atomic Force Microscopes
    Scanning probe and atomic force (SPM / AFM) microscopes are used to study surface features by moving a sharp probe over the object's surface (e.g., the scanning tunneling microscope). Atomic force microscopes enable the user to image the topography of a sample, and to monitor simultaneously
  • Variable Pressure Electron Microscopes
    Variable pressure electron microscopes are equipped with environmental chambers, which allow them to maintain a pressure differential between the high vacuum levels required in the gun and column area and the relatively low pressures used in the chamber. This facility means that the microscope can

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