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  • Factors to Consider When Choosing a Crossed Roller Bearing (.pdf)
    it's wafer positioning for the efficient manufacture of ICs, pick and place, vision inspection, parts transfer, a microscope stage under computer control or precise vertical movements, linear bearings have had to evolve rapidly in order to carry heavier loads, take up less space and be reliably precise.
  • MICRO: Product Extra!
    iC atomic force microscope (AFM) upgrade kit supports Veeco Dimension-series scanning probe microscopes, which accommodate large samples such as 300-mm wafers. The stage offers a scanning range of 100 X 100 um. The upgrade kit brings subnanometer accuracy and excellent scan linearity to existing
  • Near Field Imaging of a Laser Diode Using Scanning Method
    resolution was approximately 1 um. The measurement setup was constructed on Newport AutoAlign8000 alignment system, which consists of two motion stage stacks and a stationary center post. Beam profiling was achieved by using a high magnification microscope objective and scanning a detector with a pinhole
  • Improving Motion Positioning With Dual-Loop Control and Scurve
    Microscope x-y stages need fast, smooth, and accurate motion for highest performance. In addition, we want to use the most cost effective hardware that can get the job done. What control techniques are available to achieve these goals?. The diagram on page two shows an all-in-one motion card design
  • Imaging of Guided and Scattered Light From Silicon Photonic Integrated Circuits
    fibres to the PIC using only a top, visible microscope image as a positional guide. In this case the power coupled from the output fibre is used to guide the alignment of both input and output. Given the 3-axis translation stage control on both fibres and the lack of knowledge as to the loss
  • Medical Device Link .
    compatible, however, either critical-point drying or a cold stage can be used to observe the sample. Nonconducting samples can be coated with a thin layer of carbon or precious metal in a thermal vacuum evaporator or plasma sputter-coater. Another type of scanning electron microscope
  • Precision moves with pint-sized motors
    Innovative actuators and stages based on piezoelectric materials give superfine motion in a compact package. A typical use for PZT actuators is in the precision positioning of microscope objectives. The MIPOS 500 stage (top) from Piezosystem Jena Inc. is one example of a device designed

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