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  • Measurement of Radar Cross Section Using the VNA Master Handheld VNA Application Note
    by the target. This application note describes how a. modern battery-powered / portable Microwave Vector Network Analyzer with Time Domain Gating can make it. easy to do RCS tests on the flight line or in the field.
  • Time Domain for Vector Network Analyzers Application Note
    Vector Network Analyzers (VNAs) are very powerful and flexible measuring instruments. Their basic capability is to measure the S-parameters of an RF or microwave device and display the result in the frequency domain. This provides valuable data for the design engineer to develop a design
  • Time Domain for Vector Network Analyzers (.pdf)
    Vector Network Analyzers (VNAs) are very flexible measuring instruments-the microwave engineer's most powerful tool. Their basic capability is to measure the S-parameters of an RF or microwave device and display the result in the frequency domain. This provides valuable data for the design engineer
  • Anechoic Chamber Measurement Improvement-Microwave Journal
    The well known and widely used "Termination-VSWR" method, used to measure the reflectivity of an absorber wall in an anechoic chamber, has been considerably modernized with the help of new vector network analyzers (VNA) and personal computers (PC), taking advantage of fast sweepers or synthesizers
  • Amplifier Testing With The 37300C VNA
    Vector Network Analyzers (VNA) are designed to measure S-parameters of RF and Microwave devices and circuits. S-parameters are by definition ratios and as such the actual test power utilized is not critical. When amplifier S-parameters are measured it becomes important to know approximate input
  • RF Measurement Techniques
    The RF and microwave characteristics commonly used to define the performance of components are typically measured using a vector network analyzer. Since the packages of devices manufactured by Barry Industries, Inc. typically do not have coaxial connectors, the issue of the most appropriate
  • Intermodulation Distortion (IMD) Measurements Using the 37300 Series VNA
    low distortion products. As a device's intermodulation distortion is improved, greater demands are made on measurement equipment. This Application Note discusses the concept of measuring third order products using the Anritsu 373XX series of Vector Network Analyzers, in conjunction with Anritsu 68XXX
  • S-parameter Measurements with Multiport Balanced Test Sets
    With the increasing proliferation of multiport devices at both RF and microwave frequencies, it is sometimes practical to use a multiport test set connected to a 2 or 4 port Vector Network Analyzer (VNA) to perform S-parameter measurements. This approach is often less expensive than a custom N-port

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