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Product Announcements
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Probe System for Life™
SemiProbe Semiconductor Wafer Thickness Gage MTI Instruments Inc. Solar Wafer Thickness Tool from MTI MTI Instruments Inc. TXRF-V310 Metrology Instrument Rigaku Corporation The King of the Jungle in Measuring Technology Precitec, Inc. MFM65 Process XRR, XRF, and XRD metrology FAB tool Rigaku Corporation |
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Welcome to ECS: The Electrochemical Society at the Boston meeting was the debut of Redcat.? Redcat is an online tool for scientists working in the technical fields core to the ECS mission. See Electrochemical Society (The) Information |
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Graphene - Wikipedia, the free encyclopedia |
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Extreme ultraviolet lithography - Wikipedia, the free... If other problems are solved well enough to justify the investment, free electron lasers may provide the required light quality. |
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Paving the Way to Nanoelectronics 16 nm and Smaller High-quality 16-nm lines and spaces have been printed using the MET, representing the highest resolution ever achieved from a single-exposure |
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NERSC Helps Researchers Discover a Potential On-Off Switch for... NERSC Helps Researchers Discover a Potential On-Off Switch for Nanoelectronics |
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Assertion checkers - enablers of quality design 2008 1st Microsystems and Nanoelectronics Research Conference Conference Title: 2008 1st Microsystems and Nanoelectronics Research Conference Item |
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1/f noise analysis of ZnO nanowire and thin film 2008 2nd IEEE International Nanoelectronics Conference Conference Title: 2008 2nd IEEE International Nanoelectronics Conference (NEC) Item Title: 1/f |
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Scott Hauck Chandra Mulpuri, M.S., "Runtime and Quality Tradeoffs in FPGA Placement and Routing", July 2001. |
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Birck Nanotechnology Center - Discovery Park at Purdue... Detailed numerical modeling is a powerful tool for understanding the mechanisms limiting the performance of solar cells, an important step in the See Purdue University Information |
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Nano-tetherball biosensor precisely detects glucose * Purdue engineers lay groundwork for 'vertically oriented nanoelectronics' |