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Find parts, products, suppliers, datasheets, and more for:
Nanometer Resolution Metrology Equipment
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Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness, and defects.
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See also: Featured Products | Technical Articles | Engineering Web Results-
Supplier: MSI-Viking GageDescription: The new MarSurf® UD 120 from Mahr Federal can generate both surface and contour measurements in a single pass. Designed for economy, the system provides high accuracy over a large measuring range in nanometer resolutions. The MarSurf UD 120 includes both automated motorized operation and joystick
- Technology: Non-contact - Optical / Laser
- Measurement Capability: Specialty / Custom
- Standards Compliance: ISO / EN
- Mounting / Loading: Benchtop
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Supplier: Aerotech, Inc.Description: a two-dimensional correction to achieve unmatched nanometer resolution, accuracy, and repeatability. This unique drive and bearing combination, packaged in an extremely low profile and small footprint, offers tangible advantages in your motion application. The ANT130-XY-ULTRA extends the performance capability
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Supplier: Polytec, Inc.Description: Polytec's TopMap Metro.Lab is an affordable, high-precision, non-contact topography measurement system designed to characterize flat and curved surfaces. Incorporating a scanning white light interferometer, the Metro.Lab can measure flatness and general topography with 20 nanometer resolution
- Measurement Capability: 3D / Areal Topography, Flatness, Parallelism, Roundness
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Aerospace / Defense, Automotive, Other
- Mounting / Loading: Benchtop
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Supplier: Bruker Nano Surfaces DivisionDescription: resolution. The system's new Vision64 Operation and Analysis Software features the industry's most functional and streamlined graphical user interface to provide intuitive access to an extensive library of pre-programmed filters and analyses for solar, precision machining, printing, and medical metrology
- Application: Semiconductor Inspection
- Grade: Benchtop
- Image Analysis Processing Software: Yes
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Supplier: MSI-Viking GageDescription: The new MarSurf® UD 120 from Mahr Federal can generate both surface and contour measurements in a single pass. Designed for economy, the system provides high accuracy over a large measuring range in nanometer resolutions. The MarSurf UD 120 includes both automated motorized operation and joystick
- Technology: Non-contact - Optical / Laser
- Measurement Capability: Specialty / Custom
- Standards Compliance: ISO / EN
- Mounting / Loading: Benchtop
-
Supplier: MSI-Viking GageDescription: The new MarSurf® UD 120 from Mahr Federal can generate both surface and contour measurements in a single pass. Designed for economy, the system provides high accuracy over a large measuring range in nanometer resolutions. The MarSurf UD 120 includes both automated motorized operation and joystick
- Technology: Non-contact - Optical / Laser
- Measurement Capability: Specialty / Custom
- Standards Compliance: ISO / EN
- Mounting / Loading: Benchtop
-
Supplier: Aerotech, Inc.Description: a two-dimensional correction to achieve unmatched nanometer resolution, accuracy, and repeatability. This unique drive and bearing combination, packaged in an extremely low profile and small footprint, offers tangible advantages in your motion application. The ANT130-XY-ULTRA extends the performance capability
-
Supplier: Aerotech, Inc.Description: a two-dimensional correction to achieve unmatched nanometer resolution, accuracy, and repeatability. This unique drive and bearing combination, packaged in an extremely low profile and small footprint, offers tangible advantages in your motion application. The ANT130-XY-ULTRA extends the performance capability
-
Supplier: Bruker Nano Surfaces DivisionDescription: resolution. The system's new Vision64 Operation and Analysis Software features the industry's most functional and streamlined graphical user interface to provide intuitive access to an extensive library of pre-programmed filters and analyses for solar, precision machining, printing, and medical metrology
- Application: Semiconductor Inspection
- Grade: Benchtop
- Image Analysis Processing Software: Yes
-
Supplier: Bruker Nano Surfaces DivisionDescription: resolution. The system's new Vision64 Operation and Analysis Software features the industry's most functional and streamlined graphical user interface to provide intuitive access to an extensive library of pre-programmed filters and analyses for solar, precision machining, printing, and medical metrology
- Application: Semiconductor Inspection
- Grade: Benchtop
- Image Analysis Processing Software: Yes
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Featured Products for Nanometer Resolution Metrology Equipment Top
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Nanometer Resolution Sensor for Precision Mechanisms and Positioners - Ranges up to 500 µm. High accuracy, fast response - 0.02% full scale linearity is typical, with no cyclical error or hysteresis. Works with any conductive target, material or finish has no effect on accuracy. Directly measures the target with super-small sensor heads, eliminating Abbé offset errors. Easy installation - sensor head mounts in a simple precision hole. Serial communications port for "in machine" calibration... (read more) -
The new inductive sensor IPRM 12 measures with a resolution of up to 50 nm, which is to date unmatched in its class. All of the electronics are integrated in its 90 mm short M12 housing. At the same time, it is one of the fastest sensors in its class with a measuring speed of 1 mm/s. With these performance characteristics the compact sensor is a valid alternative to complex measuring systems. In contrast to these systems, the IPRM 12 does not need any external amplifier or expensive coaxial... (read more)Browse Inductive Proximity Sensors Datasheets for Baumer Ltd.
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Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more)Browse Surface Preparation Services Datasheets for Metal Cutting Corporation
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Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf ™ WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. Utilizing MarSurf XT 20 topographical evaluation software, the space-saving MarSurf WS 1 can be configured to work both in the lab and on the shop floor. With the new processes... (read more)Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc.
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Metrology. To measure objects with precision, companies frequently turn to PixeLINK® machine vision cameras. Measure Complex Shapes. Organizations looking to measure irregular, complex or precision parts require a machine vision camera solution that offers a high frame rate, excellent image quality and high resolution. For these reasons, companies looking to develop metrology systems for electronics, semiconductors, or any complex manufacturing product choose PixeLINK® industrial cameras... (read more)Browse CCD Cameras Datasheets for PixeLINK
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Lapmaster International LLC presents the FTP 130 as a new product addition to its Metrology Line. The FTP 130 is a 3 way measuring system which accurately measures the flatness, thickness and parellelism of both 1 and 2 sided parts. Up to two different functions can be used simultaneously to measure parts as thin as 0.20mm or as thick as 200mm. It also comes with a new analog-digital display that elimates the possibility of any inaccuracies. This unit provides a very cost effective, compact... (read more)
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The Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are used to... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
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The high demands of today's surface technology - very hard, very thin or visco-elastic - require correspondingly powerful measurement methods and systems. In the nano-meter range, the Fischer micro-hardness measuring instruments are capable of making quick, precise and effective measurements where classic measurement methods reach their limits. PICODENTOR® HM500 Measuring system for determining the Martens hardness (HM), characteristic elastic quantities and additional material parameters, even... (read more)Browse Hardness Testers Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
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MSI-Viking Gage can customize and administer a Total Solution Program to manage the calibration, maintenance and inventory control of all your company's metrology equipment. Fully Customized Total Solution Programs. There is no charge to you for us to meet with you, evaluate your needs and develop a program to meet your company's very specific requirements and wishes. Your Total Solution Program can include any combination of these services tailored to your business: Regularly scheduled... (read more)Browse Dimensional Measurement and Metrology Services Datasheets for MSI-Viking Gage
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For highly precise positioning applications, Baumer Ltd. has introduced two new high resolution optical encoders that offer exceptional repeat accuracy. These programmable encoders offer resolutions in excess of 1.2 million pulses per revolution and repeat accuracy of 0.012 degrees at a 1.3 MHz maximum switching frequency. The desired resolution of these new optical encoders can be easily programmed in the field using computer software over a BiSS interface, a feature that reduces encoder... (read more)Browse Incremental Rotary Encoders Datasheets for Baumer Ltd.
Conduct Research Top
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MICRO: Behind the Mask- Kasprowiez (Feb 2000)
Bryan S. Kasprowicz and Benjamin G. Eynon, metrology, the critical dimension scanning electron microscope (CD SEM) has long been the instrument of choice for measuring submicron features because of its nanometer-scale resolution and ever-improving throughput. Because photomask features historically...
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MICRO: Prod Tech news
of days, reducing the cost of ultra-high-resolution analysis. (Semicon Europa, Booth B1.370). Workstation/Equipment Monitor. Novx. San Jose, CA. In addition to monitoring electrostatic chucks and electrostatic discharge, the Series 7000 workstation/process equipment monitor can communicate...
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MICRO: Archive: Back Issue TOC
deposition controller, aqueous develop/etch tool, excimer laser micromachining, sample-preparation platform, stainless-steel gas springs, wireless autoleveling sensor, wireless maskmaking sensor, linear CD source, FPD measurement tools, mask metrology system Vendor offers RF atom source/RF ion source...
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MICRO:Product Technology News (Oct '99)
Matrix S200 metrology systems for CMP and etch provide application-specific sets of metrology techniques. The S200 CMP system has a 5 ' 10-mm-spot, 633-nm HeNe laser ellipsometer for measuring on-product substrate n and k and a 2.5-mm-spot, 470 905-nm reflectometer for measuring film thickness...
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MICRO: The Hot Button
Challenges Abound on Road to 45 nm and Beyond Welcome to the first installment of "The Hot Button." In each issue, this feature will present discussions by industry experts about the critical challenges facing one of four key focus areas within advanced chip manufacturing: lithography, metrology...
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Piezoelectrics in Positiong
, controlling. each manufacturing step from PZT raw. materials to finished systems thus. ensuring the best quality. Variety of "cofired" and "classical" piezo stacks and rings. Response of an open-loop piezo actuator to triangule-wave drive signal. shows sub-nanometer resolution. Sputtering (vacuum...
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MICRO:Product Technology News (Sept. '98 p.60)
by more than 50%. Developed for use with the IVS-120 metrology tool, Adaptive RG software offers the capability to measure targets with either unclear images or suboptimal edge resolution. Uneven polishing in the STI processes required for higher device densities can result in inconsistent target...
Engineering Web Search: Nanometer Resolution Metrology Equipment Top
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NanoStructures Laboratory Generally, commercial processing equipment, designed for the semiconductor industry, cannot achieve the resolution needed for nanofabrication, is |
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Interferometry - Wikipedia, the free encyclopedia |
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Graphene - Wikipedia, the free encyclopedia |
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attocube - pioneers of precision Highest precision motion on the nanometer scale at ambient conditions, low temperature, UHV and high magnetic fields [learn more. See attocube systems AG Information |
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Fabtech - Online information source for semiconductor... After a two-year term at solar equipment supplier Spire, Dr. Avishai Kepten has returned to the semiconductor equipment sector as Vice President and See Semiconductor Media Limited Information |
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Machine Dynamics Research Laboratory Spindle and Roundness Metrology 6 nm This work establishes techniques that advance the 0 -6 standard practice in spindle metrology and enable five See Machine Dynamics Research Lab Information |
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Spindle Instrumentation for Grinding Ceramics Nanometer Level Spindle Metrology Fixed sensitive radial error motion in the x-direction 6 18 L = 200 mm 0 0 6 -6 -18 The synchronous fixed sensitive See Machine Dynamics Research Lab Information |
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Physikalisch-Technische Bundesanstalt (PTB): 5.2 Dimensional... The Nanometer Comparator Measurement Equipment 5.22 Mask Metrology 5.23 Angle Metrology See Physikalisch-Technische Bundesanstalt (PTB) Information |
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Olympus - Non Destructive Ultrasonic Test Equipment, Innov-X,... Optical Metrology Videoscopes, Borescopes See Olympus IMS Profile & Catalog |
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Netscape | Company Boardroom VECO), a leading supplier of advanced three-dimensional AFM metrology equipment to the semiconductor industry, announced today that its InSight? 3D |
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