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Optical Metrology Measurement
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Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources.
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Supplier: Bruker Nano Surfaces DivisionDescription: The technology that powers the Wyko NT series optical profilers is now available in a flexible, stand-alone module. The Optical Metrology Module or OMM gives you non-contact, gauge-capable metrology for the critical measurement requirements of a wide range of applications. The Optical Metrology
- Form Factor: Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Polytec, Inc.Description: The TopMap µ.Lab is a complete white-light interferometric measurement microscope workstation for micro-topography measurement on almost any surface. The system is well suited to product development and off-line quality control measurements.
- Measurement Capability: 3D / Areal Topography, Flatness, Parallelism, Roundness
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Aerospace / Defense, Automotive, Other
- Mounting / Loading: Benchtop
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Supplier: KEYENCEDescription: Product Overview Drastically Reduced Measurement Time Eliminating Individual Differeences Easy Setup for Wider Applications East Data Management Instant measurement is provided by a totally new dimension analysis system which defies traditional metrology techniques. Data is obtained
- Application: Measuring / Toolmaker
- Grade: Benchtop, Research, Other
- Microscope Type: Portable Field, Other
- Digital Display: Yes
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Supplier: Bruker Nano Surfaces DivisionDescription: System and employing intrinsic benefits of non-contact white light interferometry, NPFLEX-LA delivers reliable lead angle measurements along with the high performance 3D surface analysis capabilities of Bruker's optical profiler product line. The NPFLEX-LA detects global lead angle and surface
- Measurement Capability: 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Semiconductor Manufacturing
- Mounting / Loading: Floor / Free Standing
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Supplier: StellarNet, Inc.Description: Reliably measure a variety of samples with thicknesses from a few mm to a few inches. Characterize tint/color (with CIELab values), transmission profiles, and more for research, QA/QC applications, and industrial process monitoring. StellarNet’s Optical Metrology measurement system consists
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Supplier: Precitec, Inc.Description: The measurement range of the chromatic optical probes reaches frome a few hundreds of microns up to millimeters allowing you the perfect tune to your applications High numerical aperture and small spot diameter are ideal for the most uses in metrology. The interferometric optical probes show
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Supplier: Corning Specialty MaterialsDescription: Offers rapid, non-contact measurement of large LCD masks
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Flatness, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Standards Compliance: ISO / EN
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Mechanical Parts (Bearings, Shafting), Optics / Photonics, Precision Machining / Grinding
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Supplier: Mahr Federal Inc.Description: The new MarSurf® UD 120 from Mahr Federal can generate both surface and contour measurements in a single pass. Designed for economy, the system provides high accuracy over a large measuring range in nanometer resolutions. The MarSurf UD 120 includes both automated motorized operation and joystick
- Surface Metrology: Form Measurement, Surface Profilometry
- Measurement Capability: Specialty / Custom
- Standards Compliance: ISO / EN
- Technology: Non-contact - Optical / Laser
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Supplier: Rigaku CorporationDescription: The Rigaku MFM65 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Composition, Particle Contamination, Roughness / Waviness, Thickness - Film / Layer
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Supplier: Precitec, Inc.Description: Optical Probes for thickness and distance measurements. The measurement range of the chromatic optical probes reaches frome a few hundreds of microns up to millimeters allowing you the perfect tune to your applications High numerical aperture and small spot diameter are ideal for the most uses
Featured Products for Optical Metrology Measurement Top
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Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf ™ WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. Utilizing MarSurf XT 20 topographical evaluation software, the space-saving MarSurf WS 1 can be configured to work both in the lab and on the shop floor. With the new processes... (read more)Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc. -
The Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are used... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
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Knight Optical offer precision optical testing of their new prisms for advanced medical imaging and endoscopic systems. Each prism is scanned and tested in our enhanced metrology lab, boasting spectrophotometers, FISBA flatness spectrometer and Trioptics PrismMaster, ensuring high specifications of geometric distances and parallelism as well as measurement of prism vertices with an accuracy of ± 3 arc seconds or 1/3600th of a degree. Parallelism of surfaces can be measured to within 0.010mm... (read more)Browse Optical Manufacturing Services Datasheets for Knight Optical Ltd.
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ASML Optics manufactures extreme precision optical components and systems for a broad range of commercial applications. Our expertise includes optical and mechanical design, precision optical fabrication, coating, cleanroom assembly, and precision metrology. Our Asphere Advantage ™ technology can open new design opportunities for improving performance and reducing costs. Our PerfectWave ™ metrology sets a new standard for precision optical measurement. And with our Design-to-Image... (read more)Browse Optical Lenses Datasheets for ASML Optics
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The Rigaku MFM65 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks. Designed for high-volume manufacturing. The MFM65 is designed with high-volume 200mm and 300mm manufacturing in mind: high-throughput thickness measurement by XRR and XRF, low-contamination wafer... (read more)Browse Semiconductor Metrology Instruments Datasheets for Rigaku Corporation
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ASML Optics manufactures extreme precision optical components and systems for a broad range of medical applications. Our expertise includes optical and mechanical design, precision optical fabrication, coating, cleanroom assembly, and precision metrology. Our Asphere Advantage ™ technology can open new design opportunities for improving performance and reducing costs. Our PerfectWave ™ metrology sets a new standard for precision optical measurement. And with our Design-to-Image... (read more)Browse Optical and Optoelectronic Assembly Services Datasheets for ASML Optics
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NEMESIS Optical surface measurement with the CHR 150 N optical distance sensor. topographies measured regardless of the nature of the surface (smooth and polished, rough, matte, transparent). dimensional monitoring of ultra-small components and microstructures. thickness layer measurement of transparent objects. determination of roughness, waviness, load curves. measuring of optical components. Data sheets (Optical 3D-Measuring Systems) in PDF format for downloading and printing. Use... (read more)Browse Surface Metrology Equipment Datasheets for Precitec, Inc.
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continue to increase as the automotive, aerospace and appliances industries also implement higher precision.". The metrology system's laser scanner and SFF (shape from focus) sensor use active texture projection to perform high-precision measurement of shapes even with glossy surfaces or no surface texture. Touch probes and optical heads with built-in TTL laser AF complete the multi-sensor system. This allows it to perform shape measurements of parts such as complex automotive and machined... (read more)Browse Metallurgical Microscopes Datasheets for Nikon Metrology, Inc.
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ASML's expertise includes optical and mechanical design, precision optical fabrication, coating, cleanroom assembly, and precision metrology. Our Asphere Advantage ™ technology can open new design opportunities for improving performance and reducing costs. Our PerfectWave ™ metrology sets a new standard for precision optical measurement. And with our Design-to-Image ™ solutions we can engineer and manufacture all or part of your optical system no matter how complex... (read more)Browse Optical Prisms Datasheets for ASML Optics
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Laser Sensor Displacement & Position Measurements from MTI Instruments. High Speed Laser System utilizing the Latest CMOS / CCD Technology. The Microtrak II features state-of-the-art CMOS laser triangulation sensing technology for precise measurements of displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II is ideal for solving tough production measurement applications throughout a variety of industries. Click here to visit... (read more)Browse Optical Triangulation Position Sensors Datasheets for MTI Instruments Inc.
Conduct Research Top
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Optical Metrology for Large Telescope Optics
metrology applications. "Meter-class" describes a category of telescopes with optical elements larger than one meter in diameter, typically operating within the infrared through visible spectra. The primary and secondary optics may be monolithic glass structures or may consist of multiple segments that can
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Improved Interferometric Optical Testing
Interferometry is used for testing optical components and optical systems as well as the metrology of many other components, such as the flatness and roughness of hard disk drive platters and the shape of magnetic recording heads and machined parts. This article describes three recent advances
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Optical Shop Testing
Equipment. Find Tektronix® Optical Test Equipment. View Info, Specs & More. www.tek.com. 4D Laser Interferometers. Vibration insensitive measurement of optical and precision surfaces. www.4dtechnology.com. Advertise on Amazon See a problem with these advertisements? Let us know. Frequently Bought
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Comparing Tactile and Optical Technologies (.pdf)
" representation of the surface being measured than the simple tracings of a probe. Microsoft Word - QualityWeb.doc. Comparing Tactile and Optical Technologies for Surface Texture Measurement. By Patrick Nugent. Vice President Metrology Systems. Mahr Federal Inc. A look at both of these technologies shows
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MICRO: Defect/Yield Metrology - Schramm (October 2000)
of the metal layers compensates for the low topography, so that enough optical signal is supplied to the metrology tool for adequate measurement. In front-end CMP processes such as STI, however, the registration marks are much more difficult to observe. Robust broadband optics with spatial filtering
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MICRO: Defect Analysis and Metrology - Ge (Feb 2000)
Metrology Group (Santa Barbara, CA) for point-defect characterization on silicon wafers. This system's dark-field optical microscope can locate defect events precisely down to 0.1 um and below (within 2 um), and the AFM tip can subsequently be positioned on individual defects and image the defects
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MICRO: Integrated metrology beginning to measure up to expectations
windows create the need for more CD measurements. In particular, for 248-nm lithography at the 130-nm process node, chipmakers "are pushing it right down to the hairy edge" in terms of measurement capabilities. Optical CD is emerging as an alternative to CD SEM, with a mix-and-match strategy likely
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Optical Fiber Array With Precise Hole Sizing
A method of making and an etchable wafer substrate for use in making optical fiber array plates includes forming a progressively increasing series of metrology holes when the plate holes are formed. The variation between designed plate hole diameter and actual plate hole diameter is determined
Engineering Web Search: Optical Metrology Measurement Top
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National Physical Laboratory
Chemical Metrology NPL provides world-class research, consultancy, calibrations and specialised measurement services in chemical metrology.
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Test and Measurement Equipment | Tektronix
Jitter Measurement Memory Optical Serial Communications Optical Probes Passive Probes Protocol Analyzer Probes
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Optical Metrology Module - Optical Interferometric Profilers:...
Stylus and Optical Metrology Optical Profilers
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Newport Corporation
Optical Measurement Optical Measurement Optical Posts & Post Holders Optical Pedestals
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Optical Metrology Centre Home Page
Metrology products such as camera calibration software, optical triangulation profilers and tools for six degrees of freedom measurement.
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Optical coherence tomography - Wikipedia, the free...
Optical coherence tomography (OCT) is an optical signal acquisition and processing method.
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Interferometry - Wikipedia, the free encyclopedia
Interferometers are widely used in science and industry for the measurement of small displacements, refractive index changes, surface irregularities
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