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  • Interface for Laser Scanning Microscope
    This customer needs to interface a scanning laser microscope to their PC so that image data can be acquired and stored. Data is received from the laser microscope via an optical sensor at 1300 line scans per image. Each scan has an 8ms duration, but 2/3 of that time is
  • Utilizing Aspheres in Optical Design
    Improving image quality, reducing the number of elements needed and lowering costs are all now achievable through the use of aspheres in optical design. From digital cameras and CD players to high-end microscope objectives and fluorescence microscopy, aspheres are proliferating into every facet
  • Optical Touch Pointer for Fluorescence Guided
    Total tumor resection in. patients with glioblastoma multiforme (GBM) is difficult to. achieve due to the tumor's infiltrative way of growing and. morphological similarity to the surrounding functioning. brain tissue. The diagnosis is usually subjectively performed. using a surgical microscope
  • Automated Optical Positioning Helps Automate FT-IR Analysis
    cases, to be run without any operator intervention at all. Key to the development of these features is the use of compact ball slides from Del-Tron Precision, Inc., Bethel, Connecticut, that provide highly accurate optical positioning, low torque requirements and take up minimal space. This automated
  • Laser Welding Carbon Nanocomposites
    in the initial experimentation to quantify weld strength. The experimentation included a complete analysis of the transmission characteristics of the base polymer at 810 nm and 1,064 nm wavelengths, an optical microscope view of the weld cross-section, and transmission welding experimentation
  • Microstructural Analysis of Optical Materials (.pdf)
    ) in the scanning electron microscope (SEM).
  • MICRO: Prod Tech News
    for both imaging and repair. Patented environmental SEM technology enables E-beam repair and high-resolution E-beam imaging. The system also features an optical microscope for mask navigation and global alignment. The Cal=Trak SL-500 primary standard gas-flow calibrator is a fast, mercury-free
  • MICRO: Defect Analysis and Metrology - Ge (Feb 2000)
    than the maximum AFM scan size required to find ~0.1- um defects easily. This limitation makes AFM-only defect review difficult and time-consuming. To surmount this limitation, an integrated defect review tool combining a dark-field (DF) optical microscope with an automated TappingMode AFM has been

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