Products & Services

See also: Categories | Featured Products | Technical Articles | More Information
Page: 1 2 3 Next

Conduct Research Top

  • Electron Microscope
    to optical microscopes. Several types of electron microscopes exist such as scanning electron microscopes (SEM), transmission electron microscopes (TEM) or scanning transmission electron microscopes (STEM).
  • Interferometric Microscopes
    microscopes are useful in wafer or semiconductor manufacturing, MEMS production, optical component fabrication, precision machined surfaces (ground, lapped, honed and superfinished parts), plating and thin film coatings and layers, wear surfaces, surface research, biomaterials and implants, and high
  • Interface for Laser Scanning Microscope
    This customer needs to interface a scanning laser microscope to their PC so that image data can be acquired and stored. Data is received from the laser microscope via an optical sensor at 1300 line scans per image. Each scan has an 8ms duration, but 2/3 of that time is
  • Utilizing Aspheres in Optical Design
    Improving image quality, reducing the number of elements needed and lowering costs are all now achievable through the use of aspheres in optical design. From digital cameras and CD players to high-end microscope objectives and fluorescence microscopy, aspheres are proliferating into every facet
  • Optical Touch Pointer for Fluorescence Guided
    . The objective of this. study was to develop and evaluate a hand-held optical. touch pointer using a fluorescence spectroscopy system to. quantitatively distinguish healthy from malignant brain. tissue intraoperatively.
  • Forensic Applications of Phenom Desktop SEM
    Optical microscopes are widely used for routine imaging tasks, are affordable and easy to operate. Unfortunately, they can only resolve to the micron level and have ...
  • Automated Optical Positioning Helps Automate FT-IR Analysis
    cases, to be run without any operator intervention at all. Key to the development of these features is the use of compact ball slides from Del-Tron Precision, Inc., Bethel, Connecticut, that provide highly accurate optical positioning, low torque requirements and take up minimal space. This automated
  • Ultra-High Precision AFM with 6-Axis Laser and Piezo Scanner for Traceable Measurements on Semiconductors and Step Standards
    Atomic force microscopy (AFM) is used for surface measurements with resolution down to atomic levels - dimensions that are far beyond even the highest resolution optical microscopes. AFM is a noncontact procedure, with forces between a very fine measuring tip and the object surface revealing

More Information Top

Lock Indicates content that may require registration and/or purchase. Powered by IHS Goldfire