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Part # Distributor Manufacturer Product Category Description
TALP3001 Digi-Key Texas Instruments Sensors, Transducers IC MEMS SCANNING MIRROR 8XCEPT

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  • Comparing Tactile and Optical Technologies (.pdf)
    the results. of the analysis. Optical scanning methods do just that--they change the way profiles are. generated. This is not to say optical methods are better or worse, but they. are different. Figure 1. Regardless of the. There are a wide variety of different methods and technologies used for. method
  • Polarization Control and Measurement for Optical Fibers
    of the Stokes parameters. The power. 3. Figure 5. The min/max approach used by Newport Polarization Instruments. [Courtesy of Ref. [2]]. Controlling Polarization in. Optical Fiber (Excerpt from Ref. [iii]). Methods of Controlling Polarization. Controlling the polarization state in optical fiber is
  • M.O.S.TTM Transforms Complicated Optical Set-Ups into Compact Monolithic Structures
    Monolithic Optical Structure Technology (M.O.S.T.) is a unique optical innovation that combines all of the elements of a complex optical setup into a single monolithic unit. M.O.S.T. achieves superb optical stability, unsurpassed shock and vibration resistance and sub-arcsecond accuracy between
  • Automated Optical Positioning Helps Automate FT-IR Analysis
    , and Nicolet Instrument Corporation, Madison, Wisconsin, have maintained their leadership role in infrared spectroscopy with the development of the Nic-Plan microscope, an instrument that offers the highest level of optical automation currently available. The OMNIC FT-IR software for WindowsTM that controls
  • SmartMovesTM Spotlights: Veeco Instruments, Inc. (.pdf)
    An increasing number of modern technologies require more and more sophisticated metrology to measure ever-finer details and tighter tolerances. Veeco's new Wyko(R) Optical Profilers, directed by a series of Galil motion controllers, provide noncontact, three-dimensional measurement of surface
  • A Comparison of Spectroradiometers to Radiometers for UV Radiation Measurements
    refraction of a restricted. beam of light through a prism in the 17th century. In 1801 UV radiation was. discovered. By the 1870's scanning spectroradiometers were in use. The cutoff. of solar radiation for wavelengths shorter than about 300nm. was discovered in. 1879. The thickness of stratospheric
  • A Guide to Choosing a Particle Sizer
    and new applications of old. techniques appear at an ever increasing rate. Yet, the concepts presented here are general. enough to be of value for several years to come. The author would welcome any comments you. may have and is always available to answer any. Legend: XDC: Scanning X-ray Disc Centrifuge
  • What is Frequency Domain Analysis?
    . The NewView 200 is a scanning white-light. Camera. White light. interferometer. The instrument includes appropriate. illumination. optics for imaging an object surface and a reference. surface together onto a solid-state imaging array,. resulting in an interference intensity pattern that can be. read

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