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Optical Topography Instrument
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Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness, and defects.
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Supplier: Precitec, Inc.Description: Optical Sensor for Non-contact distance thickness measurement. The new sensor CHRocodile S, with its modern design, represents the latest generation of optical distance and thickness measuring devices. It is applicable for highly accurate distance and topography measurements as well for measuring
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Corning Specialty MaterialsDescription: First optical instrument to provide extensive quantification of o.d. & i.d.
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Bruker Nano Surfaces DivisionDescription: applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry
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Supplier: Bruker Nano Surfaces DivisionDescription: For unparalleled accuracy and precision – the kind needed for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features -- the InSight™ 3D Atomic Force Microscope (AFM) is the clear choice. InSight 3DAFM provides the accuracy needed to improve
- Application: Semiconductor Inspection
- Grade: Research
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
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Supplier: Corning Specialty MaterialsDescription: First optical instrument to provide extensive quantification of o.d. & i.d.
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)
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Featured Products for Optical Topography Instrument Top
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PLX provides unique optical instruments, technologies and solutions to problems of achieving and maintaining state-of-the-art optical accuracy and stability under severe environmental conditions. Our M.O.S.T. ™ technology integrates complex optical elements into compact monolithic structures to achieve these objectives. PLX products and systems are available in a wide variety of materials, mirror coatings, special metals, sizes and configurations. PLX is a registered ISO 9001 company... (read more) -
Sartomer manufactures a complete line of monomers and oligomers for the optical market. These low-VOC products are widely used in ultraviolet (UV) light, electron beam (EB), and peroxide high-performance systems. Application examples include: Fiber optics. Coated Optics. Cast Lenses. Low-Fogging Optics (read more)
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Description: Lightwave Link Inc. 2x4 optical switch is designed for use in optical fiber communication networks and measurement instruments. The switch consists of two ports that selectively transmits, redirects, or blocks optical power in a fiber optic transmission line. The optical switch must be actuated to select or change between two states. Furthermore, for the Latching type, it only takes an electrical pulse width with duration ≧20msec to change the state. As a result, it consumes... (read more)
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Description. Lightwave Link Inc. 1x2 optical switch is designed for use in optical fiber communication networks and measurement instruments. The switch consists of two ports that selectively transmits, redirects, or blocks optical power in a fiber optic transmission line. The optical switch must be actuated to select or change between two states. Furthermore, for the Latching type, it only takes an electrical pulse width with duration ≧20msec to change the state. As a result, it consumes... (read more)
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Lightwave Link Inc. 1x1 optical switch is designed for use in optical fiber communication networks and measurement instruments. The switch consists of two ports that selectively transmits, redirects, or blocks optical power in a fiber optic transmission line. The optical switch must be actuated to select or change between two states. Furthermore, for the Latching type, it only takes an electrical pulse width with duration ≧20msec to change the state. As a result, it consumes low electric... (read more)
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Description. Lightwave Link Inc. 1x2 optical switch is designed for use in optical fiber communication networks and measurement instruments. The switch consists of two ports that selectively transmits, redirects, or blocks optical power in a fiber optic transmission line. The optical switch must be actuated to select or change between two states. Furthermore, for the Latching type, it only takes an electrical pulse width with duration ≧20msec to change the state. As a result, it consumes... (read more)
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Knight Optical offer a complete range of optical mirrors for all applications. Precision grade for laser applications, telescope and periscope systems, and general purpose grade for projector and solar systems: Mirrors reflect light and are used in many forms. Knight Optical offer: · Plane mirrors. · Concave mirrors. · Elliptical mirrors. · Lamp Reflectors. Our range of plane mirrors includes Precision, λ/10 flatness mirrors, λ/4 mirrors, 1 wave over 25mm and general purpose mirrors... (read more)
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Kahn offers two chilled mirror optical hygrometer products, Optidew and Series 4000, to meet the requirements of a broad range of dewpoint measurement applications. Each product is available in a variety of models to suit the user's specific needs. Kahn's 20 years of experience in chilled mirror technology has produced extremely sensitive (parts per billion), accurate and drift-free instrumentation for measurement of gas depwoint. All Kahn hygrometers offer measurement traceability to national... (read more)
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Optical Lenses from Gurley are available in standard and custom designs. We provide spherical and aspherical lenses. We also coat all parts in our Troy, NY facility and provide customers with all specrtal traces for your review. Select from our standard line of lenses which include plan-convex, plano-concave, aspherical. Because we stock these lenses, you will benefit from our quick delivery and low prices. Or, send us a drawing and we can fabricate and coat a lens to your specific needs. (read more)
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DACO has been manufacturing spring return solenoids for over 50 years. Our advanced optical spring shutter devices are designed, engineered and precision-built specifically to meet the exacting demands of military/defense industry. These are extremely rugged, highly reliable and available in a wide selection of models, sizes and mounting features. Contact us for more information. How it Works. DACO advanced optical spring shutter devices are designed to move to the energized position when... (read more)
Conduct Research Top
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Comparing Tactile and Optical Technologies (.pdf)
tending to diverge rather. standards, others specific to. than compete as technology develops. It may very well be that 3D. various industries or even. optical systems evolve into a separate category of instrument. individual companies. altogether. This can be seen in how these systems collect...
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SmartMovesTM Spotlights: Veeco Instruments, Inc. (.pdf)
new Wyko® Optical Profilers, directed by. a series of Galil motion controllers, provide non-. contact, three-dimensional measurement of sur-. face roughness and topography, with sub-. nanometer resolution. The measurements are. accurate, repeatable and high speed. Veeco chose Galil's Ethernet-based...
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Measuring Surface Slope Error on Precision Aspheres (.pdf)
of optical specifications and drawings where the slope error of the optical surface has been specified. 2.1. Laser Dimensional Gauging Instrument. A laser dimensional gauging instrument1 uses a laser beam stripe between confocal parabolic mirrors to measure the. physical diameters, lengths...
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Spatial Coherence in Interferometry
in designing commercial interferometers is to reduce the intrinsic measurement noise in the complete band of spatial frequencies which the instrument is able to measure. Here the large coherence of the laser turns out to be a problem, 'collecting” artifacts associated with the optical surfaces used...
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MICRO: Defect Analysis and Metrology - Ge (Feb 2000)
to find ~0.1-um defects easily. This limitation makes AFM-only defect review difficult and time-consuming. To surmount this limitation, an integrated defect review tool combining a dark-field (DF) optical microscope with an automated TappingMode AFM has been developed by Digital Instruments, Veeco...
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Advanced Digital Technology Breaking Ground in Light Microscopy (.pdf)
With relatively few progressions in conventional optical microscopy during the past decade, pushing through the physical limitations of these systems has proven to be challenging. Engineers have developed solutions to some of the limitations in modern micro-analysis that had appeared to reach...
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MICRO: Defect Analysis
processing issues rapidly. This article focuses on inspection strategies for three DRAM layers. In addition, the article compares current optical inspection tools and correlates tool data results with end-of-line probe results. Automated bright-field wafer inspection tools, which were introduced more than...
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Surface Profiling by Frequency Domain Analysis of White Light Interferograms
. features unambiguously with white light. Now let's take a look at some hardware. Figure 1 shows the optical configuration of a. scanning white-light interferometric microscope. Interferograms for a each of the image points in. the field of view of the instrument are generated simultaneously...
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MICRO: Products
wafers/hr at 0.079-um sensitivity. The instrument's multibeam and polarize optical system offers excellent detection for such new materials as high- and low-k dielectrics, silicon on insulator, and silicon germanium. A strictly mechanical edge-grip handling system supports the wafer to improve...
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MICRO: Spotlight
). Automatic particle sizer. The AccuSizer 780/ APS automatic particle sizer from Particle Sizing Systems uses single-particle optical sensing to quickly count and size a large number of particles, one at a time, thereby constructing a true particle-size distribution. The fully automatic instrument...
Engineering Web Search: Optical Topography Instrument Top
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Optical coherence tomography - Wikipedia, the free... Optical coherence tomography (OCT) is an optical signal acquisition and processing method. |
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LIDAR - Wikipedia, the free encyclopedia A FASOR used at the Starfire Optical Range for LIDAR and laser guide star experiments is tuned to the sodium D2a line and used to excite sodium atoms |
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Hitachi Optical Topography website —... You are here: Home ? Research ? NIR Brain Imaging ? Relevant websites ? Hitachi Optical Topography website |
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CCMR - Shared Experimental Facilities and industrial scientists make use of the wide variety of electron and optical microscopes to characterize and image their specimens. |
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ESA - ESA Spacecraft Operations - GMES/Sentinels Sentinel-2: Providing high-resolution optical observation for GMES land and emergency services |
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ESA Science & Technology: Instruments The Descent Imager/Spectral Radiometer (DISR) is the optical instrument that makes measurements at solar wavelengths aboard the Huygens Probe of the |
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Optical topography system for laser ablation plume... Optical topography system for laser ablation plume measurements |
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Low temperature near-field scanning optical microscopy of IR... Low temperature near-field scanning optical microscopy of IR and THz surface-plasmon quantum cascade lasers |
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Dr. Erwin Tafeit : SPIE.org Profile |
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Optical Fabrication, Testing, and Metrology II - Optical... Optical Fabrication, Testing, and Metrology II (Proceedings Volume) |
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